Search Results - "Willemsen, O. H."

Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion by Willemsen, O.H, Snel, M.M.E, van Noort, S.J.T, van der Werf, K.O, Grooth, B.G.de, Figdor, C.G, Greve, J

“…The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In…”
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Biomolecular Interactions Measured by Atomic Force Microscopy by Willemsen, Oscar H., Snel, Margot M.E., Cambi, Alessandra, Greve, Jan, De Grooth, Bart G., Figdor, Carl G.

“…Atomic force microscopy (AFM) is nowadays frequently applied to determine interaction forces between biological molecules. Starting with the detection of the…”
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Simultaneous Height and Adhesion Imaging of Antibody-Antigen Interactions by Atomic Force Microscopy by Willemsen, Oscar H., Snel, Margot M.E., van der Werf, Kees O., de Grooth, Bart G., Greve, Jan, Hinterdorfer, Peter, Gruber, Hermann J., Schindler, Hansgeorg, van Kooyk, Yvette, Figdor, Carl G.

“…Specific molecular recognition events, detected by atomic force microscopy (AFM), so far lack the detailed topographical information that is usually observed…”
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Tracking system of the Fast-Intelligent-Tracking (F!T) tube by van den Brink, H. B., Willemsen, O. H.

“…— In this paper, we describe the principles of the tracking system of the Fast Intelligent Tracking (F!T) tube. We will show how the tracking system is divided…”
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A Physical Approach to Reduce Nonspecific Adhesion in Molecular Recognition Atomic Force Microscopy by Willemsen, Oscar H., Snel, Margot M.E., Kuipers, Laurens, Figdor, Carl G., Greve, Jan, De Grooth, Bart G.

“…Atomic force microscopy is one of the few techniques that allow analysis of biological recognition processes at the single-molecule level. A major limitation…”
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Electron-optics of the Fast Intelligent Tracking (F!T) tube: A CRT without a shadow mask by Krijn, M. P. C. M., IJzerman, W. L., van den Brink, H. B., Willemsen, O. H., Vissenberg, M. C. J. M.

“…— In this paper, we describe the electron‐optics involved in realizing a maskless CRT based on tracking the electron beams along horizontally aligned phosphor…”
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The Fast Intelligent Tracking (F!T) tube: A CRT without a shadow mask by Bergman, A. H., van den Brink, H. B., Budzelaar, F. P. M., Engelaar, P. J., Holtslag, A. H. M., IJzerman, W. L., Krijn, M. P. C. M., Van Lieshout, P. J. G., Notari, A., Willemsen, O. H.

“…— The F!T tube is a new type of CRT without a shadow mask. The primary function of the mask, color selection, is taken over by an electronic control system…”
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2-D/3-D switchable displays by Willemsen, O. H., De Zwart, S. T., Hiddink, M. G. H., Willemsen, Oscar

“…— In this paper, the design of a lenticular‐based 2‐D/3‐D display for mobile applications is described. This display combines look‐around capability with good…”
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20.1: Locally Switchable 3D Displays by Hiddink, M. G. H., de Zwart, S. T., Willemsen, O. H., Dekker, T.

“…3D displays will drastically enhance the viewing experience of future displays for many applications. Unfortunately, 3D displays generally have a lower…”
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58.4: A Handheld Mini-Projector Using LED Light Sources by Willemsen, O. H., Krijn, M. P. C. M., Salters, B. A.

“…We have built a mini‐projector with LED light sources that is sufficiently small for portable applications. The projector has a three panel architecture with…”
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44.1: The Fast Intelligent Tracking (F!T) Tube: A CRT without a Shadow Mask by Bergman, A. H., van den Brink, H. B., Budzelaar, F. P. M., Engelaar, P. J., Holtslag, A. H. M., IJzerman, W. L., Krijn, M. P. C. M., van Lieshout, P. J. G., Notari, A., Willemsen, O. H., Bechtel, H., Busselt, W.

“…The F!T tube is a new type of CRT without a shadow mask. The primary function of the mask, color selection, is taken over by an electronic control system that…”
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Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid by van Noort, S. John T, Willemsen, Oscar H, van der Werf, Kees O, de Grooth, Bart G, Greve, Jan

“…A simple model of a damped, harmonic oscillator is used to describe the motion of an atomic force microscope cantilever tapping in fluid. By use of…”
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Reconstruction of the Tip−Surface Interaction Potential by Analysis of the Brownian Motion of an Atomic Force Microscope Tip by Willemsen, Oscar H, Kuipers, Laurens, van der Werf, Kees O, de Grooth, Bart G, Greve, Jan

“…The thermal movement of an atomic force microscope (AFM) tip is used to reconstruct the tip−surface interaction potential. If a tip is brought into the…”
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