Search Results - "Wilcox, Edward"

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    Highly accurate long reads are crucial for realizing the potential of biodiversity genomics by Hotaling, Scott, Wilcox, Edward R, Heckenhauer, Jacqueline, Stewart, Russell J, Frandsen, Paul B

    Published in BMC genomics (16-03-2023)
    “…Generating the most contiguous, accurate genome assemblies given available sequencing technologies is a long-standing challenge in genome science. With the…”
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    Journal Article
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    Modifier variant of METTL13 suppresses human GAB1-associated profound deafness by Yousaf, Rizwan, Ahmed, Zubair M, Giese, Arnaud Pj, Morell, Robert J, Lagziel, Ayala, Dabdoub, Alain, Wilcox, Edward R, Riazuddin, Sheikh, Friedman, Thomas B, Riazuddin, Saima

    Published in The Journal of clinical investigation (01-04-2018)
    “…A modifier variant can abrogate the risk of a monogenic disorder. DFNM1 is a locus on chromosome 1 encoding a dominant suppressor of human DFNB26 recessive,…”
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    Journal Article
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    Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory by Chen, Dakai, Wilcox, Edward, Ladbury, Raymond L., Seidleck, Christina, Kim, Hak, Phan, Anthony, LaBel, Kenneth A.

    Published in IEEE transactions on nuclear science (01-01-2018)
    “…We evaluated the effects of heavy ion and proton irradiation for a 3-D NAND flash. The 3-D NAND showed similar single-event upset (SEU) sensitivity to a planar…”
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    Journal Article
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    Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory by Wilcox, Edward P., Breeding, Matthew L., Casey, Megan C., Pellish, Jonathan A., Reed, Robert A., Alles, Michael L., Schrimpf, Ronald D.

    Published in IEEE transactions on nuclear science (01-05-2021)
    “…Single-event upsets are observed in a 72-layer 3-D NAND flash memory operated in a single-level cell mode after low-energy proton (500 keV-1.2 MeV) and…”
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    Journal Article
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    Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories by Wilcox, Edward P., Joplin, Matthew B., Berg, Melanie D.

    “…Single-event effects testing (heavy-ion and proton) is presented for 96- and 176-layer commercially-available 3D NAND flash memory, with emphasis on SEFI…”
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    Conference Proceeding
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    A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash by Wilcox, Edward P., Campola, Michael J.

    Published in 2019 IEEE Radiation Effects Data Workshop (01-07-2019)
    “…Single-event effects and total ionizing dose testing are described for a 32-layer NAND flash memory, in both SLC and MLC configurations, with special…”
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    Conference Proceeding
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    Targeted amplicon sequencing (TAS): a scalable next-gen approach to multilocus, multitaxa phylogenetics by Bybee, Seth M, Bracken-Grissom, Heather, Haynes, Benjamin D, Hermansen, Russell A, Byers, Robert L, Clement, Mark J, Udall, Joshua A, Wilcox, Edward R, Crandall, Keith A

    Published in Genome biology and evolution (01-01-2011)
    “…Next-gen sequencing technologies have revolutionized data collection in genetic studies and advanced genome biology to novel frontiers. However, to date,…”
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    Journal Article
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    Single-Event Transient Case Study for System-Level Radiation Effects Analysis by Campola, Michael J., Austin, Rebekah A., Wilcox, Edward P., Kim, Hak S., Ladbury, Raymond L., Label, Kenneth A., Pellish, Jonathan A.

    Published in IEEE transactions on nuclear science (01-05-2021)
    “…Analog single-event transient (SET) results are analyzed for two different applications within one system architecture. Application-specific analyses are…”
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    Journal Article
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    Schottky Diode Derating for Survivability in a Heavy Ion Environment by Casey, Megan C., Lauenstein, Jean-Marie, Ladbury, Raymond L., Wilcox, Edward P., Topper, Alyson D., LaBel, Kenneth A.

    Published in IEEE transactions on nuclear science (01-12-2015)
    “…In this paper, we irradiate a number of silicon power Schottky diodes from a variety of manufacturers. The tested diodes represent a wide assortment of reverse…”
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    Journal Article
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    Mutations of the Protocadherin Gene PCDH15 Cause Usher Syndrome Type 1F by Ahmed, Zubair M., Riazuddin, Saima, Bernstein, Steve L., Ahmed, Zahoor, Khan, Shaheen, Griffith, Andrew J., Morell, Robert J., Friedman, Thomas B., Riazuddin, Sheikh, Wilcox, Edward R.

    Published in American journal of human genetics (01-07-2001)
    “…Human chromosome 10q21-22 harbors USH1F in a region of conserved synteny to mouse chromosome 10. This region of mouse chromosome 10 contains Pcdh15, encoding a…”
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    Journal Article
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    Failure Analysis of Heavy Ion-Irradiated Schottky Diodes by Casey, Megan C., Lauenstein, Jean-Marie, Weachock, Ronald J., Wilcox, Edward P., Hua, Lang M., Campola, Michael J., Topper, Alyson D., Ladbury, Raymond L., LaBel, Kenneth A.

    Published in IEEE transactions on nuclear science (01-01-2018)
    “…In this paper, we use high- and low-magnification optical microscope images, thermal infrared camera images, and scanning electron microscope images to…”
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    Journal Article
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    Mutations in the Gene Encoding Tight Junction Claudin-14 Cause Autosomal Recessive Deafness DFNB29 by Wilcox, Edward R, Burton, Quianna L, Naz, Sadaf, Riazuddin, Saima, Smith, Tenesha N, Ploplis, Barbara, Belyantseva, Inna, Ben-Yosef, Tamar, Liburd, Nikki A, Morell, Robert J, Kachar, Bechara, Wu, Doris K, Griffith, Andrew J, Riazuddin, Sheikh, Friedman, Thomas B

    Published in Cell (12-01-2001)
    “…Tight junctions in the cochlear duct are thought to compartmentalize endolymph and provide structural support for the auditory neuroepithelium. The claudin…”
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    Journal Article
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