Search Results - "Wernhardt, R."

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  1. 1

    Long-life bismuth liquid metal ion source for focussed ion beam micromachining application by Mazarov, P., Melnikov, A., Wernhardt, R., Wieck, A.D.

    Published in Applied surface science (15-09-2008)
    “…Liquid metal ion sources (LMISs) with Ga as ion species are widely used in focused ion beam (FIB) technology for micromachining and surface treatment on the…”
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    Journal Article
  2. 2

    In situ transmission electron microscopy-investigations on the strain-induced B19′-phase in NiTi shape memory alloys structured by focused ion beam by Kröger, A., Wernhardt, R., Somsen, Ch, Eggeler, G., Wieck, A.

    “…In the present study, we investigate the deformation of a pseudo elastic NiTi shape memory alloy, micro structured with the focused ion beam technique, by in…”
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    Journal Article
  3. 3

    Development of an Au–Dy–Si liquid alloy ion source for focussed ion beam implantation by Melnikov, A., Gerya, T., Hillmann, M., Kamphausen, I., Oswald, W., Stauche, P., Wernhardt, R., Wieck, A.D.

    “…A liquid metal ion source (LMIS) based on the Au 78.2Dy 8Si 13.8 alloy was developed for focussed ion beam implantation of Dy ions. The mass spectrum of the…”
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    Journal Article
  4. 4

    Dy–Ni alloy metal ion source for focused ion beam implantation by Melnikov, A, Hillmann, M, Kamphausen, I, Oswald, W, Stauche, P, Wernhardt, R, Wieck, A.D

    Published in Vacuum (13-09-2002)
    “…A liquid metal ion source (LMIS) was fabricated on the basis of a eutectic Dy 69Ni 31 alloy for use in focused ion beam implantation. The main component of the…”
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    Journal Article
  5. 5

    Thermal characterization of micro-structured NiTi samples by 3ω scanning thermal microscopy by Gibkes, J., Chirtoc, M., Antoniow, J. S., Wernhardt, R., Pelzl, J.

    “… The lateral modification of the thermal conductivity of a NiTi sample have been measured by scanning thermal microscope using the 3ω-technique. Squares of…”
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    Journal Article
  6. 6

    Thermal characterization of micro-structured NiTi samples by 3w scanning thermal microscopy by Gibkes, J, Chirtoc, M, Antoniow, J S, Wernhardt, R, Pelz, J

    “…The lateral modification of the thermal conductivity of a NiTi sample have been measured by scanning thermal microscope using the 3w-technique. Squares of…”
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    Journal Article
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    Creation of nanoelectronic devices by focussed ion beam implantation by Koch, J., Grun, K., Ruff, M., Wernhardt, R., Wieck, A.D.

    “…In contrast to the fabrication of integrated circuits by current photolithography, a direct exposure of ions is proposed. This can be done by the very flexible…”
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    Conference Proceeding
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