Search Results - "Wernhardt, R."
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Long-life bismuth liquid metal ion source for focussed ion beam micromachining application
Published in Applied surface science (15-09-2008)“…Liquid metal ion sources (LMISs) with Ga as ion species are widely used in focused ion beam (FIB) technology for micromachining and surface treatment on the…”
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In situ transmission electron microscopy-investigations on the strain-induced B19′-phase in NiTi shape memory alloys structured by focused ion beam
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (25-11-2006)“…In the present study, we investigate the deformation of a pseudo elastic NiTi shape memory alloy, micro structured with the focused ion beam technique, by in…”
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Development of an Au–Dy–Si liquid alloy ion source for focussed ion beam implantation
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01-10-2002)“…A liquid metal ion source (LMIS) based on the Au 78.2Dy 8Si 13.8 alloy was developed for focussed ion beam implantation of Dy ions. The mass spectrum of the…”
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4
Dy–Ni alloy metal ion source for focused ion beam implantation
Published in Vacuum (13-09-2002)“…A liquid metal ion source (LMIS) was fabricated on the basis of a eutectic Dy 69Ni 31 alloy for use in focused ion beam implantation. The main component of the…”
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Thermal characterization of micro-structured NiTi samples by 3ω scanning thermal microscopy
Published in The European physical journal. ST, Special topics (2008)“… The lateral modification of the thermal conductivity of a NiTi sample have been measured by scanning thermal microscope using the 3ω-technique. Squares of…”
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Thermal characterization of micro-structured NiTi samples by 3w scanning thermal microscopy
Published in The European physical journal. ST, Special topics (01-01-2008)“…The lateral modification of the thermal conductivity of a NiTi sample have been measured by scanning thermal microscope using the 3w-technique. Squares of…”
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A specific heat and magnetization study of high Tc ceramic superconductors
Published in Zeitschrift für Physik. B, Condensed matter (01-06-1987)Get full text
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8
In situ transmission electron microscopy-investigations on the strain-induced B19'-phase in NiTi shape memory alloys structured by focused ion beam
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (2006)Get full text
Conference Proceeding -
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Creation of nanoelectronic devices by focussed ion beam implantation
Published in IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029) (1999)“…In contrast to the fabrication of integrated circuits by current photolithography, a direct exposure of ions is proposed. This can be done by the very flexible…”
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Conference Proceeding -
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A specific heat and magnetization study of highT c ceramic superconductors
Published in Zeitschrift f r Physik B Condensed Matter (01-06-1987)Get full text
Journal Article