Search Results - "Wernersson, E"

Refine Results
  1. 1

    Vertical Gate-All-Around Nanowire GaSb-InAs Core-Shell n-Type Tunnel FETs by Vasen, T., Ramvall, P., Afzalian, A., Doornbos, G., Holland, M., Thelander, C., Dick, K. A., Wernersson, L. - E., Passlack, M.

    Published in Scientific reports (17-01-2019)
    “…Tunneling Field-Effect Transistors (TFET) are one of the most promising candidates for future low-power CMOS applications including mobile and Internet of…”
    Get full text
    Journal Article
  2. 2

    Impact of Band-Tails on the Subthreshold Swing of III-V Tunnel Field-Effect Transistor by Memisevic, E., Lind, E., Hellenbrand, M., Svensson, J., Wernersson, L.-E

    Published in IEEE electron device letters (01-12-2017)
    “…We present a simple model to evaluate the sharpness of the band edges for tunnel field-effect transistors (TFETs) by comparing the subthreshold swing and the…”
    Get full text
    Journal Article
  3. 3

    Vertical high-mobility wrap-gated InAs nanowire transistor by Bryllert, T., Wernersson, L.-E., Froberg, L.E., Samuelson, L.

    Published in IEEE electron device letters (01-05-2006)
    “…In this letter, the authors demonstrate a vertical wrap-gated field-effect transistor based on InAs nanowires [Proc. DRC, 2005, p. 157]. The nanowires have a…”
    Get full text
    Journal Article
  4. 4

    A transmission line method for evaluation of vertical InAs nanowire contacts by Berg, M., Svensson, J., Lind, E., Wernersson, L.-E.

    Published in Applied physics letters (07-12-2015)
    “…In this paper, we present a method for metal contact characterization to vertical semiconductor nanowires using the transmission line method (TLM) on a…”
    Get full text
    Journal Article
  5. 5

    Defect evaluation in InGaAs field effect transistors with HfO2 or Al2O3 dielectric by Roll, G., Mo, J., Lind, E., Johansson, S., Wernersson, L.-E.

    Published in Applied physics letters (18-05-2015)
    “…The performance of InGaAs metal oxide semiconductor field effect transistors with Al2O3 or HfO2 as gate oxide is evaluated and compared. The Al2O3 transistors…”
    Get full text
    Journal Article
  6. 6

    Magnetic resonance imaging of the knee for chronological age estimation—a systematic review by Ording Muller, Lil-Sofie, Adolfsson, Jan, Forsberg, Lisa, Bring, Johan, Dahlgren, Jovanna, Domeij, Helena, Gornitzki, Carl, Wernersson, Emma, Odeberg, Jenny

    Published in European radiology (2023)
    “…Introduction Radiographs of the hand and teeth are frequently used for medical age assessment, as skeletal and dental maturation correlates with chronological…”
    Get full text
    Journal Article
  7. 7

    Surface and core contribution to 1/ f -noise in InAs nanowire metal-oxide-semiconductor field-effect transistors by Persson, K.-M., Malm, B. G., Wernersson, L.-E.

    Published in Applied physics letters (15-07-2013)
    “…By measuring 1/f-noise in wrap-gated InAs nanowire metal-oxide-semiconductor field-effect transistors with transport dominating, controllably, in either an…”
    Get full text
    Journal Article
  8. 8

    Correlation-induced conductance suppression at level degeneracy in a quantum dot by Nilsson, H A, Karlström, O, Larsson, M, Caroff, P, Pedersen, J N, Samuelson, L, Wacker, A, Wernersson, L-E, Xu, H Q

    Published in Physical review letters (07-05-2010)
    “…The large, level-dependent g factors in an InSb nanowire quantum dot allow for the occurrence of a variety of level crossings in the dot. While we observe the…”
    Get full text
    Journal Article
  9. 9

    Treatments for hyperemesis gravidarum: A systematic review by Vinnars, Marie‐Therese, Forslund, Maria, Claesson, Ing‐Marie, Hedman, Annicka, Peira, Nathalie, Olofsson, Hanna, Wernersson, Emma, Ulfsdottir, Hanna

    “…Introduction Hyperemesis gravidarum affects 0.3%–3% of pregnant women each year and is the leading cause of hospitalization in early pregnancy. Previous…”
    Get full text
    Journal Article
  10. 10
  11. 11

    Vertical Enhancement-Mode InAs Nanowire Field-Effect Transistor With 50-nm Wrap Gate by Thelander, C., FrobergFroberg, L.E., Rehnstedt, C., Samuelson, L., Wernersson, L.-E.

    Published in IEEE electron device letters (01-03-2008)
    “…We present results on fabrication and dc characterization of vertical InAs nanowire wrap-gate field-effect transistor arrays with a gate length of 50 nm. The…”
    Get full text
    Journal Article
  12. 12

    Al2O3/InAs metal-oxide-semiconductor capacitors on (100) and (111)B substrates by Wu, Jun, Lind, E., Timm, R., Hjort, Martin, Mikkelsen, A., Wernersson, L.-E.

    Published in Applied physics letters (26-03-2012)
    “…The influence of InAs orientations and high-k oxide deposition conditions on the electrical and structural quality of Au/W/Al2O3/InAs metal-oxide-semiconductor…”
    Get full text
    Journal Article
  13. 13

    Time-Resolved X‑ray Diffraction Investigation of the Modified Phonon Dispersion in InSb Nanowires by Jurgilaitis, A, Enquist, H, Andreasson, B. P, Persson, A. I. H, Borg, B. M, Caroff, P, Dick, K. A, Harb, M, Linke, H, Nüske, R, Wernersson, L.-E, Larsson, J

    Published in Nano letters (12-02-2014)
    “…The modified phonon dispersion is of importance for understanding the origin of the reduced heat conductivity in nanowires. We have measured the phonon…”
    Get full text
    Journal Article
  14. 14

    InSb Nanowire Field-Effect Transistors and Quantum-Dot Devices by Nilsson, H. A., Deng, M. T., Caroff, P., Thelander, C., Samuelson, L., Wernersson, L.-E, Xu, H. Q.

    “…The authors present fabrication and electrical measurements of InSb nanowire field-effect transistors (FETs) and quantum dots. The devices are made on a SiO 2…”
    Get full text
    Journal Article
  15. 15

    Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging by Favre-Nicolin, V, Mastropietro, F, Eymery, J, Camacho, D, Niquet, Y M, Borg, B M, Messing, M E, Wernersson, L-E, Algra, R E, Bakkers, E P A M, Metzger, T H, Harder, R, Robinson, I K

    Published in New journal of physics (31-03-2010)
    “…Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in…”
    Get full text
    Journal Article
  16. 16

    Development of a Vertical Wrap-Gated InAs FET by Thelander, C., Rehnstedt, C., Froberg, L.E., Lind, E., Martensson, T., Caroff, P., Lowgren, T., Ohlsson, B.J., Samuelson, L., Wernersson, L.-E.

    Published in IEEE transactions on electron devices (01-11-2008)
    “…In this paper, we report on the development of a vertical wrap-gated field-effect transistor based on epitaxially grown InAs nanowires. We discuss some of the…”
    Get full text
    Journal Article
  17. 17

    Deposition of HfO2 on InAs by atomic-layer deposition by WHEELER, D, WERNERSSON, L.-E, FROBERG, L, THELANDER, C, MIKKELSEN, A, WESTSTRATE, K.-J, SONNET, A, VOGEL, E. M, SEABAUGH, A

    “…Metal-oxide-semiconductor (MOS) capacitors are formed on bulk InAs substrates by atomic-layer deposition (ALD) of HfO2. Prior to film growth, InAs substrates…”
    Get full text
    Conference Proceeding Journal Article
  18. 18

    The impact of hetero-junction and oxide-interface traps on the performance of InAs/Si and InAs/GaAsSb nanowire tunnel FETs by Schenk, A., Sant, S., Memisevic, E., Wernersson, L-E, Moselund, K., Riel, H.

    “…Fabricated InAs/Si and InAs/GaAsSb vertical nanowire tunnel FETs are analyzed by physics-based TCAD with emphasis on the impact of hetero-junction and…”
    Get full text
    Conference Proceeding
  19. 19

    Partially depleted SOI MOSFETs under uniaxial tensile strain by Wei Zhao, Jianli He, Belford, R.E., Wernersson, L.-E., Seabaugh, A.

    Published in IEEE transactions on electron devices (01-03-2004)
    “…The effects of tensile uniaxial strain on the DC performance of partially-depleted silicon-on-insulator n and p-channel MOSFETs as a function of orientation…”
    Get full text
    Journal Article
  20. 20

    Core-Shell TFET Developments and TFET Limitations by Passlack, M., Ramvall, P., Vasen, T., Afzalian, A., Thelander, C., Dick, K.A., Wernersson, L.-E., Doornbos, G., Holland, M.

    “…Tunneling field-effect transistors (TFET) based on a vertical gate-all-around (VGAA) nanowire (NW) architecture with a core-shell (CS) structure have been…”
    Get full text
    Conference Proceeding