Search Results - "Wah Kit Loh"

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  1. 1
    A universal structure for SRAM cell characterization

    A universal structure for SRAM cell characterization by Xiaowei Deng, Houston, Theodore W, Anhkim Duong, Wah Kit Loh

    “…A universal test structure (UTS) for SRAM cell characterization is proposed and implemented in 65nm - 28nm technologies. The structure allows, for the first…”
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    Conference Proceeding
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  2. 2
    Characterization of bit transistors in a functional SRAM

    Characterization of bit transistors in a functional SRAM by Xiaowei Deng, Wah Kit Loh, Pious, B., Houston, T.W., Liu, L., Bashar Khan, Corum, D.

    Published in 2008 IEEE Symposium on VLSI Circuits (01-06-2008)
    “…A direct bit transistor access (DBTA) scheme is proposed and implemented in 8 Mb SRAMpsilas at 65 nm and 45 nm nodes. It allows, for the first time,…”
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  3. 3
    A 1-Mbit CMOS dynamic RAM with design-for test functions

    A 1-Mbit CMOS dynamic RAM with design-for test functions by McAdams, H., Neal, J.H., Holland, B., Inoue, S., Loh, W.K., Poteet, K.

    Published in IEEE journal of solid-state circuits (01-10-1986)
    “…A 1-Mb CMOS DRAM measuring 4.3/spl times/11.7 mm/SUP 2/ (50.32 mm/SUP 2/) has been fabricated using 1.0-/spl mu/m CMOS double-poly single-metal process…”
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