Search Results - "WEPPELMANN, E. R"

Determination of elastic modulus of thin layers using nanoindentation by Menčík, J., Munz, D., Quandt, E., Weppelmann, E. R., Swain, M. V.

“…Elastic modulus of thin homogeneous films can be determined by indenting the specimen to various depths and extrapolating the measured (apparent) E-values to…”
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Observation, analysis, and simulation of the hysteresis of silicon using ultra-micro-indentation with spherical indenters by Weppelmann, E.R., Field, J.S., Swain, M.V.

“…The recently reported hysteretic behavior of silicon under indentation (Clarke et al.1 and Pharret al.2-5) is investigated using an ultra-micro-indentation…”
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Influence of spherical indentor radius on the indentation-induced transformation behaviour of silicon by WEPPELMANN, E. R, FIELD, J. S, SWAIN, M. V

“…The force-displacement records of the indentation of silicon single crystals have been monitored with an ultra-micro indentation system using spherical-tipped…”
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