Search Results - "Wörtge, M."
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1
Contrast mechanisms in photothermal scanning tunneling microscopy
Published in Applied Physics A Solids and Surfaces (01-08-1994)Get full text
Journal Article -
2
A compact scanning tunneling microscopy control and data acquisition system based on a Macintosh II workstation
Published in Journal of vacuum science & technology. A, Vacuum, surfaces, and films (01-01-1990)“…A compact system based on a Macintosh II workstation for scanning tunneling microscopy (STM) control, data acquisition, and image display and processing is…”
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Journal Article Conference Proceeding -
3
Analysis and compensation of thermal effects in laser‐assisted scanning tunneling microscopy
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures (01-03-1991)“…As an indispensable step towards detection of selective, resonant light absorption in laser‐assisted STM, we analyzed the thermal expansion produced by laser…”
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Conference Proceeding -
4
Prospects for electron cooling of antiprotons at low energies
Published in Hyperfine interactions (01-03-1989)Get full text
Journal Article -
5
The LEAR Electron Cooler: Recent Improvements and Tests
Published in Physica scripta (01-01-1988)Get full text
Journal Article -
6
Positron accumulation and storage for antihydrogen production
Published in Hyperfine interactions (01-03-1989)Get full text
Journal Article -
7
Antihydrogen production in a merged beam arrangement
Published in Hyperfine interactions (01-03-1989)Get full text
Journal Article -
8
Scanning tunneling microscopy of liquid crystals, perylene‐tetracarboxylic‐dianhydride, and phthalocyanine
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures (01-05-1994)“…Scanning tunneling microscopy measurements conducted on pure liquid crystals and liquid crystals in combination with the dyes…”
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Conference Proceeding -
9
A tunneling atomic force microscope with inertial tip‐to‐sensor approach
Published in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures (01-03-1991)“…An atomic force microscope is presented which uses the tunneling effect for signal detection, the tunneling tip‐to‐sensor approach being based on an inertial…”
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Conference Proceeding