Search Results - "Vishnyakov, N.V."

Investigation of recombination centers in the active layers of HIT solar cells by Maslov, A.D., Litvinov, V.G., Ermachikhin, A.V., Vishnyakov, N.V., Gudzev, V.V., Vikhrov, S.P.

“…In this paper we present results of DLTS investigating HIT solar cells. Analysis of DLTS spectra gave deep level activation energies and concentrations…”
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Geomorphological Characteristics, Monitoring and Ways of Optimization of Erosion Processes in a Small Bend of the Don River by Vishnyakov N.V., Kanishchev S.N., Solodovnikov D.A., Semenova D.A., Khavanskaya N.M.

“…The article analyzes the main geomorphological characteristics of Small meanders of the Don, namely: heterogeneity of geomorphological structure, two-level Don…”
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Study of Deep Levels in a HIT Solar Cell by Vikhrov, S. P., Vishnyakov, N. V., Gudzev, V. V., Ermachikhin, A. V., Shilina, D. V., Litvinov, V. G., Maslov, A. D., Mishustin, V. G., Terukov, E. I., Titov, A. S.

“…The results of studying a HIT (heterojunction with an intrinsic thin layer) Ag/ITO/ a -Si:H( p )/ a -Si:H( i )/ c -Si( n )/ a -Si:H( i )/ a -Si:H( n + )/ITO/Ag…”
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On a combined approach to studying the correlation parameters of self-organizing structures by Alpatov, A. V., Vikhrov, S. P., Vishnyakov, N. V., Mursalov, S. M., Rybin, N. B., Rybina, N. V.

“…The correlation parameters of self-organizing structures are investigated using a combined approach, a combination of 2D detrended fluctuation analysis and the…”
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Scanning Near-Field Optical Microscopy of Light Emitting Semiconductor Nanostructures by Ankudinov, A. V., Mintairov, A. M., Slipchenko, S.O., Shelaev, A.V., Yanul, M.L., Dorozhkin, P. S., Vishnyakov, N.V.

“…A technique of cantilever based scanning near-field optical microscopy is applied. Using InP/GaInP quantum dots structures, 100nm (λ/7) spatial resolution of…”
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Phase transitions in thin [Ge.sub.2][Sb.sub.2][Te.sub.5] chalcogenide films according to Raman spectroscopy data by Avachev, A.P, Vikhrov, S.P, Vishnyakov, N.V, Kozyukhin, S.A, Mitrofanov, K.V, Terukov, E.I

“…Data on the Raman spectra of thin [Ge.sub.2][Sb.sub.2][Te.sub.5] chalcogenide semiconductor films are reported. The study is performed with the purpose of…”
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