A Study of Implication Based Pseudo Functional Testing

This paper presents a study of the implication based functional constraint extraction techniques to generate pseudo functional scan tests. Novel algorithms to extract pair-wise and multi-node constraints as Boolean expressions on arbitrary gates in the design are presented. Its impact on reducing th...

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Bibliographic Details
Published in:	2006 IEEE International Test Conference pp. 1 - 10
Main Authors:	Syal, M., Chandrasekar, K., Vimjam, V., Hsiao, M.S., Yi-Shing Chang, Chakravarty, S.
Format:	Conference Proceeding
Language:	English Japanese
Published:	IEEE 01-10-2006
Subjects:	Algorithm design and analysis Automatic test pattern generation Binary decision diagrams Circuit faults Circuit testing Computational modeling Design for testability Fault diagnosis Power generation State-space methods
Online Access:	Get full text
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Summary:	This paper presents a study of the implication based functional constraint extraction techniques to generate pseudo functional scan tests. Novel algorithms to extract pair-wise and multi-node constraints as Boolean expressions on arbitrary gates in the design are presented. Its impact on reducing the overkill in testing was analyzed, and report the trade-offs in coverage and scan-loads for a number of fault models. In the case of path-delay fault model, it was shown that the longest paths contribute most to the over-testing problem, raising the question about scan testing of the longest paths. Finally, the evaluation of the functional constraints on large industrial circuits show that the proposed constraint generation algorithm generate a powerful set of constraints most of which are not captured in the constraints extracted by designers for design-verification purposes
ISBN:	9781424402915 1424402913
ISSN:	1089-3539 2378-2250
DOI:	10.1109/TEST.2006.297667