Search Results - "Vici, Andrea"

Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs by Panarella, Luca, Kaczer, Ben, Smets, Quentin, Tyaginov, Stanislav, Saraza Canflanca, Pablo, Vici, Andrea, Verreck, Devin, Schram, Tom, Lin, Dennis, Knobloch, Theresia, Grasser, Tibor, Lockhart de la Rosa, César, Kar, Gouri S., Afanas’ev, Valeri

“…Evidence of microscopic inhomogeneities of the side source/drain contacts in 300 mm wafer integrated MoS 2 field-effect transistors is presented. In…”
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Performance and Reliability Degradation of CMOS Image Sensors in Back-Side Illuminated Configuration by Vici, Andrea, Russo, Felice, Lovisi, Nicola, Marchioni, Aldo, Casella, Antonio, Irrera, Fernanda

“…We present a systematic characterization of wafer-level reliability dedicated test structures in Back-Side-Illuminated CMOS Image Sensors. Noise and electrical…”
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On Border Traps in Back-Side-Illuminated CMOS Image Sensor Oxides by Vici, Andrea, Russo, Felice, Lovisi, Nicola, Irrera, Fernanda

“…CMOS image sensors (CISs) in back-side-illuminated configuration consist of photodiode arrays having metal lines and drive electronics beneath the active…”
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Analytical Markov Model to Calculate TDDB at Any Voltage and Temperature Stress Condition by Vici, Andrea, Degraeve, Robin, Franco, Jacopo, Kaczer, Ben, Roussel, Philippe J., De Wolf, Ingrid

“…We propose an analytical approach for calculating the time-to-breakdown of metal-oxide-semiconductor (MOS) systems under different stress conditions. Our…”
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A multi-energy level agnostic approach for defect generation during TDDB stress by Vici, Andrea, Degraeve, Robin, Kaczer, Ben, Franco, Jacopo, Van Beek, Simon, De Wolf, Ingrid

“…•Multi-energy level agnostic approach describes defects generation during time-dependent dielectric breakdown.•Defect generation is both fluence and…”
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A multi-energy level agnostic simulation approach to defect generation by Vici, Andrea, Degraeve, Robin, Kaczer, Ben, Franco, Jacopo, Van Beek, Simon, De Wolf, Ingrid

“…•Multi-energy level agnostic approach describes defects generation during time-dependent dielectric breakdown.•Defect generation is both fluence and…”
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Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current by Varanasi, Anirudh, Degraeve, Robin, Roussel, Philippe J., Vici, Andrea, Merckling, Clement

“…In this work, we introduce a physics-informed machine learning framework that models stochastically-behaving defects in the gate oxide of an individual device…”
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SILC and TDDB reliability of novel low thermal budget RMG gate stacks by Vici, Andrea, Degraeve, Robin, Horiguchi, Naoto, De Wolf, Ingrid, Franco, Jacopo

“…The fabrication of gate stacks with a low-thermal budget is crucial for enabling upcoming CMOS technology innovations such as sequential 3D integration and…”
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Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks by Vici, Andrea, Degraeve, Robin, Bastos, Joao Pedro, Roussel, Philippe, De Wolf, Ingrid

“…We propose a geometric statistical model to describe stress-induced leakage current (SILC) as a function of trap density (D ot ). We demonstrate how soft…”
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Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress by Lee, Kookjin, Kaczer, Ben, Kruv, Anastasiia, Gonzalez, Mario, Eneman, Geert, Okudur, Oguzhan Orkut, Grill, Alexander, Franco, Jacopo, Vici, Andrea, Degraeve, Robin, De Wolf, Ingrid

“…Significant enhancement of hot-carrier degradation and time-dependent dielectric breakdown by mechanical stress was observed in CMOS FETs. Mechanical stress…”
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Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability by Vici, Andrea, Russo, Felice, Lovisi, Nicola, Marchioni, Aldo, Casella, Antonio, Irrera, Fernanda

“…A systematic characterization of peripheral transistors in Front-Side and Back-Side-Illuminated CMOS Image Sensors is presented. Experimental results are…”
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Cyclic Thermal Effects on Devices of Two‐Dimensional Layered Semiconducting Materials by Kim, Yeonsu, Kaczer, Ben, Verreck, Devin, Grill, Alexander, Kim, Doyoon, Song, Jaeick, Diaz‐Fortuny, Javier, Vici, Andrea, Park, Jongseon, Van Beek, Simon, Simicic, Marko, Bury, Erik, Chasin, Adrian, Linten, Dimitri, Lee, Jaewoo, Chun, Jungu, Kim, Seongji, Seo, Beumgeun, Choi, Junhee, Shim, Joon Hyung, Lee, Kookjin, Kim, Gyu‐Tae

“…Field‐effect transistors (FETs), using transition metal dichalcogenides (TMD) as channels, have various types of interfaces, and their characteristics are…”
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Dirk Helmbreker en zijn voorstellingen van Romeins volksleven by Busiri Vici, Andrea

“…Dirk or Theodoor Helmbreker, who was born at Haarlem in 1633, spent the greater part of his life in Rome, where he died in 1696. The author reviews his career,…”
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Dirk Helmbreker and his Representations of Roman Folk Scenes by Busiri Vici, Andrea

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Dirk Helmbreker en zijn voorstellingen van Romeins volksleven by VICI, ANDREA BUSIRI

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