Novel investigation for specimens aging tests under partial discharges and temperature
This paper is based on the investigations made by applying H.V. test on four different specimens under different combinations of voltage and temperature considering effect on partial discharge (PD). According to the IS: 11322-1985 manual and IOP publication 35 {IOP report publication 35(2002) 33-39}...
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Published in: | 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena pp. 433 - 436 |
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Main Authors: | , |
Format: | Conference Proceeding |
Language: | English |
Published: |
IEEE
01-08-2009
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Subjects: | |
Online Access: | Get full text |
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Summary: | This paper is based on the investigations made by applying H.V. test on four different specimens under different combinations of voltage and temperature considering effect on partial discharge (PD). According to the IS: 11322-1985 manual and IOP publication 35 {IOP report publication 35(2002) 33-39} the effects of an investigation of interaction between PD and temperature on epoxy resin has been studied. These are simple electrode system with a pin hole (cavity) in epoxy resin widely employed in high-voltage insulation apparatus. Each specimen is passed from x-ray unit to check the size of pin hole and placed at high voltage assembly. The specimen temperature regulation from -20°C to 120°C is performed by thermal chamber at work place. On the basis of a previously performed analysis of the ageing mechanism taking place in different materials, simple phenomenological aging and life effects are proposed in this work. It gives a new approach to the problem that appears to be a useful tool for future application on electrical components. Also investigation relation between the temperature and PD was modeled considering stress function as per inverse power law. |
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ISBN: | 9781424445578 1424445574 |
ISSN: | 0084-9162 2576-2397 |
DOI: | 10.1109/CEIDP.2009.5377733 |