Search Results - "Vialletelle, Philippe"

Refine Results
  1. 1

    Optimizing multiple qualifications of products on non-identical parallel machines by Perraudat, Antoine, Dauzère-Pérès, Stéphane, Vialletelle, Philippe

    Published in Computers & operations research (01-08-2022)
    “…In some manufacturing contexts, such as semiconductor manufacturing, machines must be qualified, or eligible, to process a product, and machines cannot be…”
    Get full text
    Journal Article
  2. 2

    Robust tactical qualification decisions in flexible manufacturing systems by Perraudat, Antoine, Dauzère-Pérès, Stéphane, Vialletelle, Philippe

    Published in Omega (Oxford) (01-01-2022)
    “…•A robust tactical qualification management problem is investigated.•A static robust optimization paradigm is proposed to model demand uncertainty and product…”
    Get full text
    Journal Article
  3. 3

    A sampling-based approach for managing lot release in time constraint tunnels in semiconductor manufacturing by Lima, Alexandre, Borodin, Valeria, Dauzère-Pérès, Stéphane, Vialletelle, Philippe

    “…For the sake of product yield and quality considerations, time constraints (TCs) are imposed between process operations in various multi-product manufacturing…”
    Get full text
    Journal Article
  4. 4

    Integrated planning of maintenance operations and workload allocation by Rodoplu, Melek, Dauzère-Pérès, Stéphane, Vialletelle, Philippe

    “…Motivated by a practical problem, this paper investigates the integrated planning of maintenance operations and workload allocation on a set of machines in a…”
    Get full text
    Journal Article
  5. 5

    Semantic modeling for smart manufacturing: towards a data alignment through knowledge formalization for semiconductor wafer fabrication by Maslov, Giulia, Yugma, Claude, Vialletelle, Philippe

    “…This paper describes a new approach for the data alignment in the front-end part of semiconductor manufacturing, i.e., wafer fabrication. The approach is based…”
    Get full text
    Conference Proceeding
  6. 6

    Sampling-based release control of multiple lots in time constraint tunnels by Lima, Alexandre, Borodin, Valeria, Dauzère-Pérès, Stéphane, Vialletelle, Philippe

    Published in Computers in industry (01-09-2019)
    “…•Time constraint management in semiconductor manufacturing is considered.•An approach to control in real time the release of multiple lots is proposed.•The…”
    Get full text
    Journal Article
  7. 7

    Heuristic Algorithm for a WIP Projection Problem at Finite Capacity in Semiconductor Manufacturing by Mhiri, Emna, Mangione, Fabien, Jacomino, Mireille, Vialletelle, Philippe, Lepelletier, Guillaume

    “…In this paper, we propose a heuristic approach for fixing work-in-progress (WIP) projection issues in the semiconductor industry especially for high mix low…”
    Get full text
    Journal Article
  8. 8

    Quality and exposure control in semiconductor manufacturing. Part I: Modelling by Bettayeb, Belgacem, Bassetto, Samuel, Vialletelle, Philippe, Tollenaere, Michel

    “…The purpose of this paper is to present a heuristic algorithm for quality control planning from an insurance perspective. The approach proposed here is…”
    Get full text
    Journal Article
  9. 9

    Evaluating the Impact of Dynamic Qualification Management in Semiconductor Manufacturing by Perraudat, Antoine, Dauzere-Peres, Stephane, Vialletelle, Philippe

    Published in 2019 Winter Simulation Conference (WSC) (01-12-2019)
    “…In semiconductor manufacturing, before executing any operation on a product, a machine must be qualified, i.e., certified, to ensure quality and yield…”
    Get full text
    Conference Proceeding
  10. 10

    A decision support system for a critical time constraint tunnel by Perraudat, Antoine, Lima, Alexandre, Dauzere-Peres, Stephane, Vialletelle, Philippe

    “…This paper motivates the development of and presents a Decision Support System (DSS) for a critical Time Constraint Tunnel (TCT) in a High-Mix/Low-Volume…”
    Get full text
    Conference Proceeding
  11. 11

    Maintenance with Production Planning Constraints in Semiconductor Manufacturing by Moritz, Alexandre, Dauzere-Peres, Stephane, Ben-Ammar, Oussama, Vialletelle, Philippe

    Published in 2020 Winter Simulation Conference (WSC) (14-12-2020)
    “…In semiconductor manufacturing, as in most manufacturing contexts, preventive maintenance is required to avoid machine failures and to ensure product quality…”
    Get full text
    Conference Proceeding
  12. 12

    Quality and exposure control in semiconductor manufacturing. Part II: Evaluation by Bettayeb, Belgacem, Bassetto, Samuel, Vialletelle, Philippe, Tollenaere, Michel

    “…The purpose of this article is to test the performance of a heuristic algorithm that computes a quality control plan. The objective of the tests reported in…”
    Get full text
    Journal Article
  13. 13

    Scheduling and Simulation in wafer fabs: Competitors, Independent Players or Amplifiers? by Lendermann, Peter, Dauzere-Peres, Stephane, McGinnis, Leon, Monch, Lars, O'Donnell, Tina, Seidel, Georg, Vialletelle, Philippe

    Published in 2020 Winter Simulation Conference (WSC) (14-12-2020)
    “…This panel will discuss the inherent conflict between the application of (Discrete-Event) Simulation and Scheduling techniques to manage and optimise capacity…”
    Get full text
    Conference Proceeding
  14. 14

    GENERIC DATA MODEL FOR SEMICONDUCTOR MANUFACTURING SUPPLY CHAINS by Laipple, Georg, Dauzere-Peres, Stephane, Ponsignon, Thomas, Vialletelle, Philippe

    Published in 2018 Winter Simulation Conference (WSC) (01-12-2018)
    “…Semiconductor manufacturing systems, with several hundreds of different production steps, reentrant loops, cleanroom conditions and a job shop organization,…”
    Get full text
    Conference Proceeding
  15. 15

    A literature review on variability in semiconductor manufacturing: The next forward leap to Industry 4.0 by Dequeant, Kean, Vialletelle, Philippe, Lemaire, Pierre, Espinouse, Marie-Laure

    Published in 2016 Winter Simulation Conference (WSC) (01-12-2016)
    “…Semiconductor fabrication plants are subject to high levels of variability because of a variety of factors including re-entrant flows, multiple products,…”
    Get full text
    Conference Proceeding
  16. 16

    A Literature Review on Sampling Techniques in Semiconductor Manufacturing by Nduhura-Munga, Justin, Rodriguez-Verjan, Gloria, Dauzere-Peres, Stephane, Yugma, Claude, Vialletelle, Philippe, Pinaton, Jacques

    “…This paper reviews sampling techniques for inspection in semiconductor manufacturing. We discuss the strengths and weaknesses of techniques developed in the…”
    Get full text
    Journal Article
  17. 17

    Analyzing different dispatching policies for probability estimation in time constraint tunnels in semiconductor manufacturing by Lima, Alexandre, Borodin, Valeria, Dauzere-Peres, Stephane, Vialletelle, Philippe

    Published in 2017 Winter Simulation Conference (WSC) (01-12-2017)
    “…In semiconductor manufacturing, new technologies impose more and more time constraints in product routes, i.e. a maximum time between two (often…”
    Get full text
    Conference Proceeding
  18. 18

    A mathematical programming approach for optimizing control plans in semiconductor manufacturing by Nduhura Munga, Justin, Dauzère-Pérès, Stéphane, Yugma, Claude, Vialletelle, Philippe

    “…In a globally competitive environment, sustaining high yield with a minimum number of quality controls is key for manufacturing plants to remain competitive…”
    Get full text
    Journal Article
  19. 19

    Flexibility measures for qualification management in wafer fabs by Johnzén, Carl, Dauzère-Pérès, Stéphane, Vialletelle, Philippe

    Published in Production planning & control (01-01-2011)
    “…Due to the high investment costs in semiconductor manufacturing facilities (wafer fabs), it is crucial to ensure high utilisation rates of tools. And, by…”
    Get full text
    Journal Article
  20. 20

    A multi-purpose operational capacity and production planning tool by Christ, Quentin, Dauzere-Peres, Stephane, Lepelletier, Guillaume, Vialletelle, Philippe

    “…This paper presents a decision support system for operational production and capacity planning in a High-Mix/Low-Volume (HM/LV) 300 mm wafer fab. The decision…”
    Get full text
    Conference Proceeding