Search Results - "Verwijst, Joop"
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A Statistical Explanation of CDM Qualification Variability
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16-09-2024)“…CDM testing is known to sometimes have qualification reproducibility problems. This paper discusses possible sources of variability and two statistical…”
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Conference Proceeding -
2
Altitude and underground real-time SER tests of embedded SRAM
Published in 2009 European Conference on Radiation and Its Effects on Components and Systems (01-09-2009)“…Real-time SER tests have been performed on embedded SRAMs in a 0.13-μm process technology. 511 samples of a product IC have been tested at two locations…”
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Conference Proceeding