Search Results - "Veeger, C. P. L."

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  1. 1

    Predicting Cycle Time Distributions for Integrated Processing Workstations: An Aggregate Modeling Approach by Veeger, C P L, Etman, L F P, Lefeber, E, Adan, I J B F, van Herk, J, Rooda, J E

    “…To predict cycle time distributions of integrated processing workstations, detailed simulation models are almost exclusively used; these models require…”
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    Journal Article
  2. 2

    Generating Cycle Time-Throughput Curves Using Effective Process Time Based Aggregate Modeling by Veeger, C P L, Etman, L F P, van Herk, J, Rooda, J E

    “…In semiconductor manufacturing, cycle time-throughput (CT-TH) curves are often used for planning purposes. To generate CT-TH curves, detailed simulation models…”
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    Journal Article
  3. 3

    Lumped parameter modelling of the litho cell by Kock, A.A.A., Veeger, C.P.L., Etman, L.F.P., Lemmen, B., Rooda, J.E.

    Published in Production planning & control (01-01-2011)
    “…Litho cells are the most expensive equipment in a wafer fab. To support decision-making on this equipment, accurate simulation models for throughput and cycle…”
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    Journal Article
  4. 4

    Aggregate modeling of semiconductor equipment using effective process times by Etman, L. F. P., Veeger, C. P. L., Lefeber, E., Adan, I. J. B. F., Rooda, J. E.

    “…Performance evaluation using queueing models is common practice in semiconductor manufacturing. Analytical closed-form expressions and simulation models are…”
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    Conference Proceeding
  5. 5

    Predicting the mean cycle time as a function of throughput and product mix for cluster tool workstations using EPT-based aggregate modeling by Veeger, C.P.L., Etman, L.F.P., van Herk, J., Rooda, J.E.

    “…Predicting the mean cycle time as a function of throughput and product mix is helpful in making the production planning for cluster tools. To predict the mean…”
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    Conference Proceeding
  6. 6

    Generating Cycle Time-Throughput Curves using Effective Process Time based Aggregate Modeling by Veeger, C.P.L., Etman, L.F.P., van Herk, J., Rooda, J.E.

    “…In semiconductor manufacturing, cycle time-throughput (CT-TH) curves are often used to make a trade-off between throughput and mean cycle time of bottleneck…”
    Get full text
    Conference Proceeding