Search Results - "Vassilevski, K. V."

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  1. 1

    Device processing and characterisation of high temperature silicon carbide Schottky diodes by Vassilevski, K.V., Nikitina, I.P., Wright, N.G., Horsfall, A.B., O’Neill, A.G., Johnson, C.M.

    Published in Microelectronic engineering (2006)
    “…High temperature silicon carbide diodes with nickel silicide Schottky contacts were fabricated by deposition of titanium–nickel metal film on 4H-SiC epitaxial…”
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    Journal Article Conference Proceeding
  2. 2

    Determination of the adhesion energy of graphene on SiC(0001) via measurement of pleat defects by Wells, G. H., Hopf, T., Vassilevski, K. V., Escobedo-Cousin, E., Wright, N. G., Horsfall, A. B., Goss, J. P., O'Neill, A. G., Hunt, M. R. C.

    Published in Applied physics letters (10-11-2014)
    “…Pleat defects in graphene grown on SiC(0001) were studied and used to determine the adhesion energy between few-layer graphene (3 ± 1 monolayers) and the…”
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    Journal Article
  3. 3

    Optimisation of a 4H-SiC enhancement mode power JFET for high temperature operation by Bhatnagar, P., Horsfall, A.B., Wright, N.G., Johnson, C.M., Vassilevski, K.V., O’Neill, A.G.

    Published in Solid-state electronics (01-03-2005)
    “…We present the optimization of an enhancement mode vertical channel junction field effect transistor (VJFET), by investigating the variation of the controlled…”
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    Journal Article
  4. 4

    4H-SiC rectifiers with dual metal planar Schottky contacts by Vassilevski, K.V., Horsfall, A.B., Johnson, C.M., Wright, N.G., O'Neill, A.G.

    Published in IEEE transactions on electron devices (01-05-2002)
    “…4H-SiC rectifiers with dual metal planar (DMP) Schottky contacts have been fabricated with a main titanium and an annular nickel contact. Fabricated diodes…”
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    Journal Article
  5. 5

    Study of annealing conditions on the formation of ohmic contacts on p+ 4H–SiC layers grown by CVD and LPE by Vassilevski, K.V, Constantinidis, G, Papanicolaou, N, Martin, N, Zekentes, K

    “…The quality of Al/Ti-based ohmic contacts formed on 4H–SiC films under various annealing conditions has been examined. Atmospheric, vacuum and high vacuum…”
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    Journal Article Conference Proceeding
  6. 6

    High temperature vibration energy harvester system by Barker, S, Vassilevski, K V, Wright, N G, Horsfall, A B

    Published in 2010 IEEE Sensors (01-11-2010)
    “…This work presents the first demonstration of a high temperature piezoelectric energy harvester system, capable of operation up to 300°C. The system comprises…”
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    Conference Proceeding
  7. 7
  8. 8

    Microwave p-i-n diodes and switches based on 4H-SiC by Camara, N., Zekentes, K., Romanov, L.P., Kirillov, A.V., Boltovets, M.S., Vassilevski, K.V., Haddad, G.

    Published in IEEE electron device letters (01-02-2006)
    “…The 4H-SiC p-i-n diodes were designed, fabricated, and characterized for use in microwave applications. The diodes with mesa structure diameters between 80 and…”
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    Journal Article
  9. 9

    Experimental determination of electron drift velocity in 4H-SiC p +-n-n+ avalanche diodes by Vassilevski, K.V, Zekentes, K, Zorenko, A.V, Romanov, L.P

    Published in IEEE electron device letters (01-10-2000)
    “…4H-SiC p( )-n-n( ) diodes of low series resistivity ( < 1x10(-4) Omicron.;cm(2)) were fabricated and packaged. The diodes exhibited homogeneous avalanche…”
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    Journal Article
  10. 10

    4H-SiC Schottky diode arrays for X-ray detection by Lioliou, G., Chan, H.K., Gohil, T., Vassilevski, K.V., Wright, N.G., Horsfall, A.B., Barnett, A.M.

    “…Five SiC Schottky photodiodes for X-ray detection have been electrically characterized at room temperature. One representative diode was also electrically…”
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    Journal Article
  11. 11

    Silicon carbide based instrumentation amplifiers for extreme applications by Chan, H. K., Wood, N. G., Vassilevski, K. V., Wright, N. G., Peters, A., Horsfall, A. B.

    Published in 2015 IEEE SENSORS (01-11-2015)
    “…While instrumentation amplifiers based on silicon technology have revolutionized our understanding of the world in which we live, they are limited to operating…”
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    Conference Proceeding
  12. 12

    Semi-transparent SiC Schottky diodes for X-ray spectroscopy by Lees, J.E., Bassford, D.J., Fraser, G.W., Horsfall, A.B., Vassilevski, K.V., Wright, N.G., Owens, A.

    “…We describe a novel SiC Schottky diode architecture. The semi-transparent SiC Schottky diode has an “ultra-thin” (18 nm Ni/Ti) Schottky contact, a gold annular…”
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    Journal Article
  13. 13

    Ti/Ni ohmic contacts to n-type gallium nitride by Vassilevski, K.V., Rastegaeva, M.G., Babanin, A.I., Nikitina, I.P., Dmitriev, V.A.

    “…We investigated Ti and Ni based contacts to find a metallization which is convenient for a self aligned technology such that the ohmic contact can be used as a…”
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    Journal Article
  14. 14

    Novel SiC self starting DC-DC converter for high temperature wireless sensor nodes by Brennan, D. R., Mostaghimi, O., Vassilevski, K. V., Wright, N. G., Horsfall, A. B.

    Published in 2012 IEEE Sensors (01-10-2012)
    “…We report on the first demonstration of a novel self starting DC-DC converter to supply power to a wireless sensor node for deployment in high temperature…”
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    Conference Proceeding
  15. 15

    SiC gas sensor arrays for extreme environments by Roy, S. K., Furnival, B. J. D., Wood, N. G., Vassilevski, K. V., Wright, N. G., Horsfall, A. B., O'Malley, C. J.

    Published in 2013 IEEE SENSORS (01-11-2013)
    “…For the first time SiC-based gas sensor arrays have been demonstrated, which are capable of discriminating gas species under harsh environments. The structures…”
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    Conference Proceeding
  16. 16

    CMOS compatible gas sensor arrays for hostile environments by Furnival, B. J. D., Roy, S. K., Vassilevski, K. V., Wright, N. G., Horsfall, A. B., O'Malley, C. J.

    Published in 2012 IEEE Sensors (01-10-2012)
    “…This study demonstrates the first SiC-based gas sensor array, which is compatible with CMOS processing and capable of discriminating between the constituents…”
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    Conference Proceeding
  17. 17

    On the Way to the Silicon Carbide IMPATT by Vassilevski, K. V., Dmitriev, V. A., Zorenko, A. V.

    “…An analysis of current situation in silicon carbide R&D shows that it is most real to fabricate SIC IMPATT diode on an epitaxial pn structure grown on the…”
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    Conference Proceeding
  18. 18

    4H-SiC PIN diodes for microwave applications by Zekentes, K., Camara, N., Romanov, L., Kirillov, A., Boltovets, M.S., Lebedev, A., Vassilevski, K.V.

    “…4H-SiC p-i-n diodes were designed, fabricated and characterized with the aim to be used for microwave applications. The best diodes with mesa structure…”
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    Conference Proceeding
  19. 19

    Experimental determination of electron drift velocity in 4H-SiC p super(+)-n-n super(+) avalanche diodes by Vassilevski, Konstantin V, Zekentes, Konstantinos, Zorenko, Alexander V, Romanov, Leonid P

    Published in IEEE electron device letters (01-10-2000)
    “…4H-SiC p super(+)-n-n super(+) diodes of low series resistivity ( < 1x10 super(-4) Omega times cm super(2)) were fabricated and packaged. The diodes exhibited…”
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    Journal Article