Search Results - "Vartanian, Sergeh"

Investigation of a High-Power COTS Solution for Space by Scheick, Leif, Vartanian, Sergeh

“…A power switch solution for a space environment using commercial off the shelf (COTS) devices is presented. The application was for a high load switch required…”
Get full text

Single-Event Effects Measurements on COTS Electronic Devices for Use on NASA Mars Missions by Irom, Farokh, Vartanian, Sergeh, Allen, Gregory R.

“…This paper reports recent single-event effects measurements results for a variety of microelectronic devices that include a voltage level translator, bus…”
Get full text

Towards a Qualification Data Set: Expanded SEE Data on the P2020 Processor by Guertin, Steven M., Vartanian, Sergeh

“…Earlier P2020 SEE data are compared and expanded to a recent die revision, significantly increasing samples tested by protons by five devices, and by heavy…”
Get full text

Single Event Effects Results for COTS Microcontrollers and Microprocessors by Vartanian, Sergeh, Allen, Gregory R., Irom, Farokh, Daniel, Andrew, Zajac, Stephanie

“…We present single event effects (SEE) results for a variety of microcontrollers and microprocessors. The devices tested include Blackfin embedded processors…”
Get full text

Single-Event Latchup Measurements on COTS Electronic Devices for Use in ISS Payloads by Irom, Farokh, Allen, Gregory R., Vartanian, Sergeh

“…This paper reports recent single-event latchup results for a variety of microelectronic devices that include an ADC, OpAmp, EEPROM, CPLD, PWM, transceiver,…”
Get full text

Single-Event Latchup Measurements on Wireless and Powerline Network Communication Devices for Use in Mars Missions by Irom, Farokh, Vartanian, Sergeh, Allen, Gregory R.

“…This paper reports recent single-event latchup results for a variety of microelectronic devices that include Wireless and Powerline Network Communication…”
Get full text

Raspberry Pi Zero and 3B+ SEE and TID Test Results by Guertin, Steven M., Vartanian, Sergeh, Daniel, Andrew C.

“…We report SEE and TID testing of Raspberry Pi Zero and Raspberry Pi 3B+ computers. SEFI modes, display errors, and file transfer failures dominated the…”
Get full text

Electron Irradiation of Samsung 8-Gb NAND Flash Memory by Irom, Farokh, Edmonds, Larry D., Allen, Gregory R., Kim, Wousik, Vartanian, Sergeh

“…This paper reports the results of electron irradiations at various energies of the Samsung 8-Gb single-level cell nand flash memory. The percentage of bit…”
Get full text

Proton Radiation Effect on Barrier Infrared Detector Focal Plane Arrays by Azizi, Alireza, Forouhar, Siamak, Gunapala, Sarath, Rafol, Sir, Soibel, Alexander, Maruyama, Yuki, Keo, Sam, Ting, David, Vartanian, Sergeh

“…This work reports effect of proton radiation on barrier infrared detector with cutoff wavelength of 10.5 and 12.2 \mu \mathrm{m} . The results indicate that…”
Get full text

Test Results of Proton Single-Event Effects Conducted by the Jet Propulsion Laboratory by Allen, Gregory R., Irom, Farokh, Vartanian, Sergeh

“…This paper reports recent single-event effects results for a variety of microelectronic devices that include SRAM, FPGA, Flash Memory and a Linear Voltage…”
Get full text

Radiation Effects Characterization of Commercial Multi-Channel Digital to Analog Converters for Spaceflight Applications by Daniel, Andrew C., Vartanian, Sergeh, Allen, Gregory R.

“…This paper presents recent heavy ion single-event effects test results for commercial off the shelf multi-channel digital to analog converter devices. Data was…”
Get full text

Single Event Latchup Results for COTS Devices Used on SmallSat Missions by Vartanian, Sergeh, Irom, Farokh, Allen, Gregory R., Parker, Wilson P., O'Connor, Michael D.

“…We present single event latchup (SEL) results for a variety of microelectronic devices frequently designated for SmallSat missions. The data presented is only…”
Get full text

Total Ionizing Dose and Reliability Evaluation of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM) by Vartanian, Sergeh, Yang-Scharlotta, Jean, Allen, Gregory R., Daniel, Andrew C., Costanzo, Daniel, Mancoff, Frederick B., Symalla, Daniel, Olsen, Andy

“…We present total ionizing dose (TID) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM, and its effects on the…”
Get full text

Total Ionizing Dose Measurements of a Commercial Samsung NAND Flash Memory for a High Dose Mission by Allen, Gregory R., Irom, Farokh, Edmonds, Larry, Nguyen, Duc, Scheick, Leif Z., Vartanian, Sergeh, McClure, Steven S., Stanford, Kelly

“…We present total ionizing dose (TID) measurements of a commercial Samsung NAND flash memory intended for use on a high dose mission. Statistical variation in…”
Get full text

2017 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group by Allen, Gregory R., Vartanian, Sergeh, Irom, Farokh, Scheick, Leif Z., Adell, Philippe, O'Connor, Michael D., Guertin, Steven M.

“…This paper reports heavy ion induced single event effects (SEE) results for a variety of microelectronic devices targeted for possible use in JPL spacecraft…”
Get full text

Single-Event Effects Measurements on COTS Electronic Devices for Use on NASA Mars Missions by Irom, Farokh, Vartanian, Sergeh, Allen, Gregory R.

“…This paper reports recent single-event effects measurements results for a variety of microelectronic devices that include a D-type flip flops, Mixed-Signal…”
Get full text

SRAM-Based FPGA: High Dose Test Methods Using Evaluation Boards by Vartanian, Sergeh, Allen, Gregory R., Thorbourn, Dennis

“…We present low-cost and effective methods and results for high levels of Total Ionizing Dose testing performed on the Xilinx Kintex UltraScale (20nm)…”
Get full text

Single Event Effects Characterization of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM) by Vartanian, Sergeh, Yang-Scharlotta, Jean, Allen, Gregory R., Daniel, Andrew C., Mancoff, Frederick B., Symalla, Daniel, Olsen, Andy

“…We present single event effects (SEE) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM…”
Get full text

Single Event Effects Characterization of Dosed UT200Sp WPHY01 SpaceWire Physical Layer Transceiver by Vartanian, Sergeh, Allen, Gregory R., Irom, Farokh, Scheick, Leif Z.

“…We present SEE test results for the Cobham Space Wire transceiver after dosing the device to 300 krad(Si). We performed SEU characterization with variable data…”
Get full text

Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors by Guertin, Steven M., Amrbar, Mehran, Vartanian, Sergeh

“…SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611,…”
Get full text