Search Results - "Vander Wiel, Scott A."

Driving mode analysis—How uncertain functional inputs propagate to an output by Vander Wiel, Scott A., Grosskopf, Michael J., Michaud, Isaac J., Neudecker, Denise

“…Driving mode analysis elucidates how correlated features of uncertain functional inputs jointly propagate to produce uncertainty in the output of a…”
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Modeling material stress using integrated Gaussian Markov random fields by Marcy, Peter W., Vander Wiel, Scott A., Storlie, Curtis B., Livescu, Veronica, Bronkhorst, Curt A.

“…The equations of a physical constitutive model for material stress within tantalum grains were solved numerically using a tetrahedrally meshed volume. The…”
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Algorithmic Statistical Process Control: An Elaboration by Tucker, William T., Faltin, Frederick W., Vander Wiel, Scott A.

“…Statistical process control (SPC) has traditionally been applied to processes in which successive observations would ideally be independent and identically…”
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Accelerated Event Times with Multiple Thresholds by Weaver, Brian P., Vander Wiel, Scott A.

“…In some systems lowering any one of several stress variables limits the extent to which the others are able to accelerate random event times. That is, each…”
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Modeling Material Stress Using Integrated Gaussian Markov Random Fields by Marcy, Peter W, Wiel, Scott A. Vander, Storlie, Curtis B, Livescu, Veronica, Bronkhorst, Curt A

“…The equations of a physical constitutive model for material stress within tantalum grains were solved numerically using a tetrahedrally meshed volume. The…”
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Driving mode analysis—How uncertain functional inputs propagate to an output by Vander Wiel, Scott A., Grosskopf, Michael J., Michaud, Isaac J., Neudecker, Denise

“…Abstract Driving mode analysis elucidates how correlated features of uncertain functional inputs jointly propagate to produce uncertainty in the output of a…”
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Algorithmic Statistical Process Control: Concepts and an Application by Scott A. Vander Wiel, Tucker, William T., Faltin, Frederick W., Doganaksoy, Necip

“…The goal of algorithmic statistical process control is to reduce predictable quality variations using feedback and feedforward techniques and then monitor the…”
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A Discussion of All-or-None Inspection Policies by Vander Wiel, Scott A., Vardeman, Stephen B.

“…An optimal inspection policy will inspect either every item produced or no item when (a) product characteristics are well modeled as iid and (b) overall…”
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A New Method for Multinomial Inference using Dempster-Shafer Theory by Lawrence, Earl C, Murph, Alexander C, Wiel, Scott A. Vander, Liu, Chaunhai

“…A new method for multinomial inference is proposed by representing the cell probabilities as unordered segments on the unit interval and following…”
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Algorithmic Statistical Process Control: Some Practical Observations by Faltin, Frederick W., Hahn, Gerald J., Tucker, William T., Scott A. Vander Wiel

“…Algorithmic Statistical Process Control (ASPC) is an approach to quality improvement that reduces predictable quality variations using feedback and feedforward…”
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Stochastic identification of malware with dynamic traces by Storlie, Curtis B, Vander Wiel, Scott A, Anderson, Blake H, Quist, Daniel A

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Stochastic identification of malware and dynamic traces by Storlie, Curtis B, Vander Wiel, Scott A, Anderson, Blake H, Quist, Daniel A

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Algorithmic Statistical Process Control: Concepts and an Application by Vander Wiel, Scott A., Tucker, Wlliam T., Faltin, Frederick W., Doganaksoy, Necip

“…The goal of algorithmic statistical process control is to reduce predictable quality variations using feedback and feedforward techniques and then monitor the…”
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[Statistical Process Monitoring and Feedback Adjustment]: Discussion by Wiel, Scott A. Vander, Vardeman, Stephen B.

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Discussion by Vander Wiel, Scott A., Vardeman, Stephen B.

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[Statistical Process Monitoring and Feedback Adjustment]: Discussion by Scott A. Vander Wiel, Vardeman, Stephen B.

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A Discussion of All-or-None Inspection Policies by Wiel, Scott A. Vander, Vardeman, Stephen B.

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Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests by Vander Wiel, S.A., Meeker, W.Q.

“…For censored Weibull regression data arising from typical accelerated life tests (ALTs), the performance of small-sample normal-theory confidence intervals is…”
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