Search Results - "Van den Bosch, G."

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  1. 1

    Reduced efficacy of fluazinam against Phytophthora infestans in the Netherlands by Schepers, H. T. A. M., Kessel, G. J. T., Lucca, F., Förch, M. G., van den Bosch, G. B. M., Topper, C. G., Evenhuis, A.

    “…Phytophthora infestans is the causal organism of potato late blight, the most important disease in potato, the second most important arable crop in Europe. The…”
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  2. 2

    Overall intact cognitive function in male X-linked adrenoleukodystrophy adults with normal MRI by Buermans, Noortje J M L, van den Bosch, Sharon J G, Huffnagel, Irene C, Steenweg, Marjan E, Engelen, Marc, Oostrom, Kim J, Geurtsen, Gert J

    Published in Orphanet journal of rare diseases (14-09-2019)
    “…Men with the hereditary peroxisomal disorder X-linked adrenoleukodystrophy (ALD) are at risk of developing inflammatory demyelinating lesions in the brain. In…”
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  3. 3

    Are patients accurate forecasters of their emotional response to medical conditions? A scoping review on affective forecasting by Bosch, G J van den, Roos, R A N, Otten, R, Bockting, Claudi, Smulders, Y M

    Published in BMJ open (06-12-2021)
    “…ObjectiveIn this paper, we challenge the premise that patients are capable of accurately predicting their emotional response or quality of life in anticipation…”
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    Defect profiling in FEFET Si:HfO2 layers by O'Sullivan, B. J., Putcha, V., Izmailov, R., Afanas'ev, V., Simoen, E., Jung, T., Higashi, Y., Degraeve, R., Truijen, B., Kaczer, B., Ronchi, N., McMitchell, S., Banerjee, K., Clima, S., Breuil, L., Van den Bosch, G., Linten, D., Van Houdt, J.

    Published in Applied physics letters (16-11-2020)
    “…Ferroelectric Si-doped HfO2 is a promising candidate for future generation memory devices. However, such devices are vulnerable to significant threshold…”
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    Analgesics and Sedatives in Critically Ill Newborns and Infants: The Impact on Long‐Term Neurodevelopment by Schiller, R.M., Allegaert, K., Hunfeld, Maayke, den Bosch, G.E., den Anker, John, Tibboel, D.

    Published in Journal of clinical pharmacology (01-10-2018)
    “…Inadequate pain and/or stress management in preterm‐ and term‐born infants has been associated with increased morbidity and even mortality. However, exposure…”
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  7. 7

    Low-frequency noise assessment of ferro-electric field-effect transistors with Si-doped HfO2 gate dielectric by Simoen, E., O’Sullivan, B. J., Ronchi, N., Van den Bosch, G., Linten, D., Van Houdt, J.

    Published in AIP advances (01-01-2021)
    “…The low-frequency noise of planar transistors with ferroelectric Si-doped HfO2 as a gate dielectric is investigated and compared with that of undoped HfO2…”
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  8. 8

    Cerebellar Growth Impairment Characterizes School-Aged Children Born Preterm without Perinatal Brain Lesions by Pieterman, K, White, T J, van den Bosch, G E, Niessen, W J, Reiss, I K M, Tibboel, D, Hoebeek, F E, Dudink, J

    Published in American journal of neuroradiology : AJNR (01-05-2018)
    “…Infants born preterm are commonly diagnosed with structural brain lesions known to affect long-term neurodevelopment negatively. Yet, the effects of preterm…”
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  9. 9

    Ex vivo induction of viral antigen‐specific CD8+ T cell responses using mRNA‐electroporated CD40‐activated B cells by Van den Bosch, G. A., Ponsaerts, P., Nijs, G., Lenjou, M., Vanham, G., Van Bockstaele, D. R., Berneman, Z. N., Van Tendeloo, V. F. I.

    Published in Clinical and experimental immunology (01-03-2005)
    “…Summary Cell‐based immunotherapy, in which antigen‐loaded antigen‐presenting cells (APC) are used to elicit T cell responses, has become part of the search for…”
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  10. 10

    Validation of Retention Modeling as a Trap-Profiling Technique for SiN-Based Charge-Trapping Memories by Suhane, A., Arreghini, A., Degraeve, R., Van den bosch, G., Breuil, L., Zahid, M.B., Jurczak, M., De Meyer, K., Van Houdt, J.

    Published in IEEE electron device letters (01-01-2010)
    “…We applied the developed trap spectroscopy by charge injection and sensing to validate the extraction of the silicon nitride trap distribution (both in space…”
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    Stability of partial resistance in potato cultivars exposed to aggressive strains of Phytophthora infestans by Flier, W. G., Van Den Bosch, G. B. M., Turkensteen, L. J.

    Published in Plant pathology (01-06-2003)
    “…Potato cultivars were evaluated for their resistance responses to aggressive strains of Phytophthora infestans in field and laboratory experiments. Analysis of…”
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  12. 12

    An inner gate as enabler for vertical pitch scaling in macaroni channel gate-all-around 3-D NAND flash memory by Verreck, D., Arreghini, A., den bosch, G. Van, Rosmeulen, M.

    Published in Solid-state electronics (01-01-2023)
    “…Scaling the vertical cell pitch to increase bit density in 3-D NAND flash memories degrades both the cell transistor characteristics and the memory operation…”
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  13. 13

    Evaluation of the enzyme-linked immunosorbent assay for the detection of antibodies against infectious bursal disease virus (IBDV) and the estimation of the optimal age for IBDV vaccination in broilers by Herdt, P. de, Jagt, E, Paul, G, Colen, S. van, Renard, R, Destrooper, C, Bosch, G. van den

    Published in Avian pathology (01-12-2005)
    “…In order to evaluate the usefulness of the enzyme-linked immunosorbent assay (ELISA) in determining the optimal age for infectious bursal disease virus (IBDV)…”
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  14. 14

    Epidemiological importance of Solanum sisymbriifolium, S. nigrum and S. dulcamara as alternative hosts for Phytophthora infestans by Flier, W. G., Van Den Bosch, G. B. M., Turkensteen, L. J.

    Published in Plant pathology (01-10-2003)
    “…Lesions of Phytophthora infestans were found on woody nightshade (Solanum dulcamara), black nightshade (S. nigrum) and S. sisymbriifolium during a nationwide…”
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    Modeling the Operation of Charge Trap Flash Memory-Part I: The Importance of Carrier Energy Relaxation by Schanovsky, F., Verreck, D., Stanojevic, Z., Schallert, S., Arreghini, A., van den Bosch, G., Rosmeulen, M., Karner, M.

    Published in IEEE transactions on electron devices (01-01-2024)
    “…We present a novel approach to the modeling of carrier energy relaxation during high-field phases in semiconductor-oxide-nitride-oxide-semiconductor (SONOS)…”
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  16. 16

    Epidemiology and significance of chicken infectious anemia virus infections in broilers and broiler parents under nonvaccinated European circumstances by Herdt, P. de, Bosch, G. van den, Ducatelle, R, Uyttebroek, E, Schrier, C

    Published in Avian diseases (01-07-2001)
    “…A serologic survey in unvaccinated broiler parent and broiler progeny flocks demonstrated seroconversion against chicken infectious anemia virus (CIAV) in all…”
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  17. 17

    Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO₂-Based Ferroelectric FET by Higashi, Y., Ronchi, N., Kaczer, B., Alam, Md Nur K., O'Sullivan, B. J., Banerjee, K., McMitchell, S. R. C., Breuil, L., Walke, A., Van den Bosch, G., Linten, D., Van Houdt, J.

    Published in IEEE transactions on electron devices (01-09-2021)
    “…The ferroelectric (FE)-HfO 2 -based field-effect transistor (FEFET) is a promising candidate for emerging memory. However, data retention (DR) loss has been…”
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    A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication by Kruv, A., Gonzalez, M., Okudur, O.O., Spampinato, V., Franquet, A., Palayam, S.V., Arreghini, A., Van den bosch, G., Rosmeulen, M., De Wolf, I.

    Published in Microelectronic engineering (01-02-2022)
    “…The introduction of the 3D NAND architecture brought new integration challenges, including the impact of fabrication-induced mechanical stress. If not…”
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    A Novel Ni-Al Alloy Metal Induced Lateral Crystallization Process for Improved Channel Conduction in 3-D NAND Flash by Ramesh, S., Banerjee, K., Opsomer, K., Rachita, I., Bastos, J. P., Soulie, J-Ph, Sebaai, F., Favia, P., Korytov, M., Richard, O., Breuil, L., Arreghini, A., Van Den Bosch, G., Rosmeulen, M.

    Published in IEEE electron device letters (01-12-2022)
    “…In this letter, a Ni-Al alloy based metal induced lateral crystallization (MILC) process in a vertical Si channel, from 3-D NAND flash cell, is reported…”
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