Search Results - "Van Tuyen, Vo"

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  1. 1

    3-D low-loss coplanar waveguide transmission lines in multilayer MMICs by Van Tuyen Vo, Krishnamurthy, L., Qing Sun, Rezazadeh, A.A.

    “…Newly developed transmission-line structures using the great flexibility of three-dimensional multilayer technology have been designed and fabricated. In this…”
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    Journal Article Conference Proceeding
  2. 2

    Optimization and Realization of Planar Isolated GaAs Zero-Biased Planar Doped Barrier Diodes for Microwave/Millimeter-Wave Power Detectors/Sensors by Vo, V.T., Hu, Z.

    “…A high tangential signal sensitivity (TSS) zero-bias GaAs planar doped barrier (PDB) diode for microwave and millimeter-wave power detection applications is…”
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    Journal Article
  3. 3

    DC isolation and RF dissipation loss of coplanar waveguide on GaAs multi conductive layers bombarded by H+ and Fe+ ions by ZHIRUN HU, VAN TUYEN VO, REZAZADEH, Ali A

    “…This letter explores the dc isolation and radio frequency (RF) dissipation loss of coplanar waveguide (CPW) lines of H/+/ and Fe/+/ ion bombarded GaAs multi…”
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    Journal Article
  4. 4

    Linear Temperature Dependent Small Signal Model for InGaP/GaAs DHBTs Using IC-CAP by Chitrashekaraiah, S., Van Tuyen Vo, Rezazadeh, A.A.

    “…This paper presents extensive measurements and extractions carried out on InGaP/GaAs double heterojunction bipolar transistors to achieve a simple linear…”
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    Conference Proceeding
  5. 5

    Anomalous temperature dependence of series resistance in Ag\Si and Al\Si Schottky junctions by Horváth, Zs J, Ádám, M, Pintér, I, Cvikl, B, Korošak, D, Mrdjen, T, Tuyen, Vo Van, Makaró, Zs, Dücsö, Cs, Bársony, I

    Published in Vacuum (01-07-1998)
    “…Recently high temperature dependence of series resistance was obtained in Ag\n-Si and Al\n-Si\p-Si Schottky junctions prepared by ionised cluster beam…”
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    Journal Article
  6. 6

    Growth and electrical characteristics of InAs/GaAs quantum well and quantum dot structures by HORVATH, Zs. J, DOZSA, L, VO VAN TUYEN, PÖDÖR, B, NEMCSICS, A, FRIGERI, P, GOMBIA, E, MOSCA, R, FRANCHI, S

    Published in Thin solid films (15-05-2000)
    “…The electrical characteristics of InAs quantum dot (QDot) and quantum well (QW) structures embedded in GaAs confining layers were compared using…”
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    Conference Proceeding Journal Article
  7. 7

    GaAs planar doped barrier diodes by Szentpáli, B., Van Tuyen, Vo, Constantinidis, G., Lagadas, M.

    “…The planar doped barrier diodes are majority carrier devices with technologically controlled barrier height. This paper reviews the main current conducting…”
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    Journal Article Conference Proceeding
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    Electrical and photoelectrical behaviour of CdTe structures by Horváth, Zs.J., Makhniy, V.P., Demych, M.V., Van Tuyen, Vo, Balázs, J, Réti, I., Gorley, P.M., Ulyanitsky, K.S., Horley, P.P., Stifter, D., Sitter, H., Dózsa, L.

    “…The electrical and photoelectrical behaviour of Au/n-CdTe junctions prepared on CdTe monocrystalline substrates and CdTe epitaxial layers grown on n + GaAs…”
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    Journal Article Conference Proceeding
  11. 11

    Modification of Al/Si interface and Schottky barrier height with chemical treatment by Horváth, Zs.J., Ádám, M., Szabó, I., Serényi, M., Van Tuyen, Vo

    Published in Applied surface science (08-05-2002)
    “…The influence of different chemical treatments on the electrical behaviour of n- and p-type Al/Si Schottky junctions was studied. A Schottky barrier height of…”
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    Journal Article Conference Proceeding
  12. 12

    High tangential signal sensitivity GaAs planar doped barrier diodes for microwave/millimeter-wave power detector applications by Zhirun Hu, Vo, V.T., Rezazadeh, A.A.

    “…Tangential signal sensitivity (TSS) of GaAs planar doped barrier (PDB) detector diodes as low as -55 dBm at 35 GHz has been achieved. In comparison with that…”
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    Journal Article
  13. 13

    Miniature CPW Inductors for 3-D MMICs by Vo, Van Tuyen, Krishnamurthy, Lokesh, Sun, Qing, Rezazadeh, Ali A.

    “…Newly developed miniaturized CPW inductors using the great flexibility of three-dimensional multilayer technology have been designed and fabricated. Their…”
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    Conference Proceeding
  14. 14

    Electrical peculiarities in Al/Si/Ge/…/Ge/Si and Al/SiGe/Si structures by Horváth, Zs.J., Jarrendähl, K., Ádám, M., Szabó, I., Van Tuyen, Vo, Czigány, Zs

    Published in Applied surface science (08-05-2002)
    “…The current–voltage ( I– V) and capacitance–voltage ( C– V) behaviour of different Si/Ge multilayers and SiGe single layers prepared on p-type Si substrates by…”
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    Journal Article Conference Proceeding
  15. 15

    Current instabilities in GaAs/InAs self-aggregated quantum dot structures by Horváth, Zs.J., Frigeri, P., Franchi, S., Van Tuyen, Vo, Gombia, E., Mosca, R., Dózsa, L.

    Published in Applied surface science (08-05-2002)
    “…Excess current was obtained in GaAs/InAs quantum dot structures at low temperatures and low current levels. This excess current exhibited instabilities with…”
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    Journal Article Conference Proceeding
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    Engineered Schottky barriers on n-In 0.35Ga 0.65As by Horváth, Zs.J., Van Tuyen, Vo, Franchi, S., Bosacchi, A., Frigeri, P., Gombia, E., Mosca, R., Pal, D., Kalmár, I., Szentpáli, B.

    “…The Schottky barrier height in Al/n-In 0.35Ga 0.65As was engineered using thin p-type near-interface In 0.35Ga 0.65As layers grown by molecular beam epitaxy…”
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    Journal Article
  18. 18

    The effect of InAs quantum layer and quantum dots on the electrical characteristics of GaAs structures by Dózsa, L, Horváth, Zs.J, Van Tuyen, Vo, Pődör, B, Mohácsy, T, Franchi, S, Frigeri, P, Gombia, E, Mosca, R

    Published in Microelectronic engineering (2000)
    “…InAs monolayer (QL) and self-aggregated quantum dots (QD) were grown by atomic layer MBE at 460°C on an n-type GaAs-buffer layer and were capped with a 2×10…”
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    Journal Article
  19. 19

    Electrical characterisation of Al/n–Si/p–Si Schottky junctions prepared by plasma immersion implantation by Horváth, Zs.J., Ádám, M., Dücsö, Cs, Pintér, I., Van Tuyen, Vo, Bársony, I., Gombia, E., Mosca, R., Makaró, Zs

    Published in Solid-state electronics (16-03-1998)
    “…Current–voltage and capacitance–voltage measurements on Al/n–Si/p–Si Schottky junctions prepared by plasma immersion implantation of H + and P + ions have been…”
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    Journal Article
  20. 20

    Electrical characterization of Au/SiO x/ n-GaAs junctions by Ivanèo, J., Horváth, Zs.J., Van Tuyen, Vo, Coluzza, C., Almeida, J., Terrasi, A., Pécz, B., Vincze, Gy, Margaritondo, G.

    Published in Solid-state electronics (1998)
    “…The electrical behavior of Au/SiO x / n-GaAs Schottky structures has been studied using a statistical approach. It has been concluded that the obtained unusual…”
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    Journal Article