Search Results - "Van Olmen, J."

Refine Results
  1. 1

    'What kind of life is this?' Diabetes related notions of wellbeing among adults in eastern Uganda and implications for mitigating future chronic disease risk by Mayega, R W, Ekirapa, E, Kirunda, B, Nalwadda, C, Aweko, J, Tomson, G, Ostenson, C G, Van Olmen, J, Daivadanam, M, Kiguli, J

    Published in BMC public health (27-12-2018)
    “…Effective prevention and care for type 2 diabetes requires that people link healthy behaviours to chronic disease-related wellbeing. This study explored how…”
    Get full text
    Journal Article
  2. 2
  3. 3

    Integration challenges of copper Through Silicon Via (TSV) metallization for 3D-stacked IC integration by Olmen, J. Van, Huyghebaert, C., Coenen, J., Aelst, J. Van, Sleeckx, E., Ammel, A. Van, Armini, S., Katti, G., Vaes, J., Dehaene, W., Beyne, E., Travaly, Y.

    Published in Microelectronic engineering (01-05-2011)
    “…In this paper we will highlight key integration issues that were encountered during the development of the 3D-stacked IC Through Silicon Via (TSV) module and…”
    Get full text
    Journal Article Conference Proceeding
  4. 4

    A policy analysis of the chronic care policies in Belgium by Danhieux, K, Martens, M, Colman, E, Remmen, R, Van Olmen, J, Anthierens, S

    Published in European journal of public health (01-09-2020)
    “…Abstract Introduction Chronic diseases form the largest burden of disease in European countries. Redesign of health systems towards chronic integrated care is…”
    Get full text
    Journal Article
  5. 5

    Process evaluation of care scale up for hypertension in diabetes in Belgium, Slovenia and Cambodia by Martens, M, Wouters, E, Stjepanovič, TK, Stojnic, N, Chham, S, Por, I, van Olmen, J, Klipstein-Grobusch, K, Boateng, D

    Published in European journal of public health (20-10-2021)
    “…Background Effective integrated care interventions for hypertension (HT) and type 2 diabetes (T2D) exist and need to be scaled-up. The ‘SCale-Up diaBetes and…”
    Get full text
    Journal Article
  6. 6

    The quality of routine data for measuring facility-based maternal mortality in public and private health facilities in Kampala City, Uganda by Birabwa, Catherine, Banke-Thomas, Aduragbemi, Semaan, Aline, van Olmen, Josefien, Kananura, Rornald Muhumuza, Arinaitwe, Emma Sam, Waiswa, Peter, Beňová, Lenka

    Published in Population health metrics (23-08-2024)
    “…Routine health facility data are an important source of health information in resource-limited settings. Regular quality assessments are necessary to improve…”
    Get full text
    Journal Article
  7. 7

    Scale-up integrated care for diabetes and hypertension in Cambodia, Slovenia and Belgium by Klipstein-Grobusch, K, Poplas Susič, T A, Por, I, Wouters, E, Makivič, I, Te, V, Martens, M, Danhieux, K, Remmen, R, Van Olmen, J

    Published in European journal of public health (01-11-2019)
    “…Abstract Many countries struggle to find the best way to treat hypertension (HT) and type 2 diabetes (T2D). As a result, many patients receive suboptimal care,…”
    Get full text
    Journal Article
  8. 8
  9. 9
  10. 10
  11. 11
  12. 12
  13. 13

    Processing assessment and adhesion evaluation of copper through-silicon vias (TSVs) for three-dimensional stacked-integrated circuit (3D-SIC) architectures by Yang, Y., Labie, R., Ling, F., Zhao, C., Radisic, A., Van Olmen, J., Travaly, Y., Verlinden, B., De Wolf, I.

    Published in Microelectronics and reliability (01-09-2010)
    “…Through-silicon vias (TSVs) are critical components in most 3D architectures. In this paper, fully filled cylindrical Cu TSVs with a diameter of 5 μm and a…”
    Get full text
    Journal Article Conference Proceeding
  14. 14

    Electrical performance, reliability and microstructure of sub-45 nm copper damascene lines fabricated with TEOS backfill by Leaming-Sphabmixay, K., Van Olmen, J., Moon, K.J., Vanstreels, Kris, D’Haen, J., Tokei, Z., List, S., Beyer, G.

    Published in Microelectronic engineering (01-11-2007)
    “…The fabrication of narrow Cu trenches using a conformal TEOS backfill approach is shown. Cu trenches with widths down to 30–40 nm were achieved. With an…”
    Get full text
    Journal Article Conference Proceeding
  15. 15

    Electrical performance, reliability and microstructure of sub-45nm copper damascene lines fabricated with TEOS backfill by Leaming-Sphabmixay, K, Van Olmen, J, Moon, K J, Vanstreels, Kris, D'Haen, J, Tokei, Z, List, S, Beyer, G

    Published in Microelectronic engineering (01-11-2007)
    “…The fabrication of narrow Cu trenches using a conformal TEOS backfill approach is shown. Cu trenches with widths down to 30-40nm were achieved. With an…”
    Get full text
    Journal Article
  16. 16
  17. 17
  18. 18

    On a More Accurate Assessment of Scaled Copper/Low-k Interconnects Performance by Travaly, Y., Mandeep, B., Carbonell, L., Tokei, Z., Van Olmen, J., Iacopi, F., Van Hove, M., Stucchi, M., Maex, K.

    “…Interconnect RC delay, predominantly affected by the effective dielectric constant (k-value) and by the copper resistivity (rho Cu ), is an important…”
    Get full text
    Journal Article
  19. 19

    Mapping patient pathways for NCDs from a policy perspective: a novel multinational initiative by Danhieux, K, Monnet, F, Safadi, H, Surján, C, Varga, G, Lám, J, Van Olmen, J, Wouters, E

    Published in European journal of public health (01-11-2024)
    “…Abstract Background Chronic diseases like CVD and DM pose global health challenges. Understanding patient pathways is vital for effective disease management…”
    Get full text
    Journal Article
  20. 20