Search Results - "Valdman, Lukáš"

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  1. 1

    Ambient-Stable Two-Dimensional CrI3 via Organic-Inorganic Encapsulation by Gish, J. Tyler, Lebedev, Dmitry, Stanev, Teodor K, Jiang, Shizhou, Georgopoulos, Leonidas, Song, Thomas W, Lim, Gilhwan, Garvey, Ethan S, Valdman, Lukáš, Balogun, Oluwaseyi, Sofer, Zdeněk, Sangwan, Vinod K, Stern, Nathaniel P, Hersam, Mark C

    Published in ACS nano (22-06-2021)
    “…Two-dimensional transitional metal halides have recently attracted significant attention due to their thickness-dependent and electrostatically tunable…”
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    Journal Article
  2. 2

    Layered ZnIn2S4 Single Crystals for Ultrasensitive and Wearable Photodetectors by Valdman, Lukáš, Mazánek, Vlastimil, Marvan, Petr, Serra, Marco, Arenal, Raul, Sofer, Zdeněk

    Published in Advanced optical materials (01-11-2021)
    “…Zinc indium sulfide belongs to the family of layered ternary chalcogenides. Although ZnIn2S4 has a suitable bandgap in the visible range, its optoelectronic…”
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    Journal Article
  3. 3

    Unraveling the Mechanism of the Persistent Photoconductivity in InSe and its Doped Counterparts by Liao, Liping, Kovalska, Evgeniya, Luxa, Jan, Dekanovsky, Lukáš, Mazanek, Vlastimil, Valdman, Lukáš, Wu, Bing, Huber, Štěpán, Mikulics, Martin, Sofer, Zdenek

    Published in Advanced optical materials (01-10-2022)
    “…Dopant levels in layered compound InSe have considerable potential in optoelectronic devices. Dopant‐induced trap states are essential in determining the…”
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    Journal Article
  4. 4

    Germanane and (3‐Hydroxypropyl)germanane as Single Crystal Photodetectors by Hartman, Tomáš, Valdman, Lukáš, Šturala, Jiří, Sarkar, Kalyan J., Oliveira, Filipa M., Sofer, Zdenek

    Published in Advanced optical materials (01-08-2023)
    “…2D materials are being widely investigated for their potential application in light‐detecting devices. Very recently, a spin‐coated flexible 2D germanium‐based…”
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    Journal Article
  5. 5

    Layered ZnIn 2 S 4 Single Crystals for Ultrasensitive and Wearable Photodetectors by Valdman, Lukáš, Mazánek, Vlastimil, Marvan, Petr, Serra, Marco, Arenal, Raul, Sofer, Zdeněk

    Published in Advanced optical materials (01-11-2021)
    “…Abstract Zinc indium sulfide belongs to the family of layered ternary chalcogenides. Although ZnIn 2 S 4  has a suitable bandgap in the visible range, its…”
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    Journal Article
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  8. 8

    High-Crystallinity Epitaxial Sb2Se3 Thin Films on Mica for Flexible Near-Infrared Photodetectors by Wen, Xixing, Lu, Zonghuan, Valdman, Lukas, Wang, Gwo-Ching, Washington, Morris, Lu, Toh-Ming

    Published in ACS applied materials & interfaces (05-08-2020)
    “…The V–VI binary chalcogenide, Sb2Se3, has attracted considerable attention for its applications in thin film optoelectronic devices because of its unique 1D…”
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    Journal Article
  9. 9

    All‐Solution‐Processed Van der Waals Heterostructures for Wafer‐Scale Electronics by Kim, Jihyun, Rhee, Dongjoon, Song, Okin, Kim, Miju, Kwon, Yong Hyun, Lim, Dong Un, Kim, In Soo, Mazánek, Vlastimil, Valdman, Lukas, Sofer, Zdeněk, Cho, Jeong Ho, Kang, Joohoon

    Published in Advanced materials (Weinheim) (01-03-2022)
    “…2D van der Waals (vdW) materials have been considered as potential building blocks for use in fundamental elements of electronic and optoelectronic devices,…”
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    Journal Article
  10. 10
  11. 11

    Surface and interface structures of epitaxial Sb2Se3 on mica by Valdman, Lukas, Wen, Xixing, Lu, Zonghuan, Chen, Xuegang, Hiebel, Fanny, Zhang, Lihua, Kisslinger, Kim, Tao, Ye, Washington, Morris, Lu, Toh-Ming, Wang, Gwo-Ching

    Published in Applied surface science (30-11-2021)
    “…[Display omitted] •2D reciprocal space map of Sb2Se3(120) film was constructed via azimuthal RHEED.•2D map reveals top most layer’s unit mesh and in-plane…”
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    Journal Article
  12. 12

    Water-assisted exfoliation of epitaxial CdTe film from mica analyzed with azimuthal RHEED by Valdman, Lukas, Wen, Xixing, Chen, Zhizhong, Washington, Morris, Lu, Toh-Ming, Shi, Jian, Wang, Gwo-Ching

    Published in Applied surface science (15-01-2021)
    “…[Display omitted] •A simple method to release epitaxial films from its substrates is presented.•Electron diffraction reveals complicated near-surface…”
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    Journal Article
  13. 13

    Construction of Moke Microscope for Magnetic Studies of Vanadium Disulfide Flakes by Valdman, Lukas

    Published 01-01-2020
    “…Electron orbiting around its core produces orbital magnetic moment. Each electron also has its own intrinsic angular momentum, that is, spin. The overall…”
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    Dissertation
  14. 14

    All‐Solution‐Processed Van der Waals Heterostructures for Wafer‐Scale Electronics (Adv. Mater. 12/2022) by Kim, Jihyun, Rhee, Dongjoon, Song, Okin, Kim, Miju, Kwon, Yong Hyun, Lim, Dong Un, Kim, In Soo, Mazánek, Vlastimil, Valdman, Lukas, Sofer, Zdeněk, Cho, Jeong Ho, Kang, Joohoon

    Published in Advanced materials (Weinheim) (01-03-2022)
    “…2D Nanomaterials In article number 2106110, Joohoon Kang and co‐workers demonstrate various electronic devices such as field‐effect transistors,…”
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    Journal Article
  15. 15

    Improving conductivity in carbon nanotube percolating networks through inclusion of Laponite nanoparticles by Valdman, Lukas, Dobbs, Don, Cortez, Rebecca, Hagerman, Michael E.

    Published in Materials letters (15-04-2018)
    “…•Laponite/carbon nanotube (CNT) films were synthesized via aqueous phase self-assembly.•AFM studies confirmed that incorporating Laponite nanoparticles…”
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    Journal Article
  16. 16

    Anomaly of NBTI data for PMOS transistors degraded by plasma processing induced charging damage (PID) by Martin, Andreas, Valdman, Lukas, Stafford, Benjamin Hamilton, Nielen, Heiko

    “…Anomalous NBTI degradation characteristics have been observed for pMOS transistors which had experienced plasma processing induced charging damage. This is a…”
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    Conference Proceeding
  17. 17

    Plasma induced charging damage causing MOS device reliability lifetime degradation originating from well charging of a technology with deep trench isolation by Martin, Andreas, Berger, Johannes, Kamp, Angelika, Valdman, Lukas, Lehner, Anja, Mykytenko, Sergii, Nielen, Heiko

    “…Well charging from plasma processing induced charging damage (PID) is an important reliability failure mechanism, which is present for technologies with…”
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    Magazine Article