Search Results - "VESPUCCI, S."

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns by Vespucci, S., Winkelmann, A., Naresh-Kumar, G., Mingard, K. P., Maneuski, D., Edwards, P. R., Day, A. P., O'Shea, V., Trager-Cowan, C.

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Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction by Naresh-Kumar, G., Vilalta-Clemente, A., Jussila, H., Winkelmann, A., Nolze, G., Vespucci, S., Nagarajan, S., Wilkinson, A. J., Trager-Cowan, C.

“…Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially…”
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Practical application of direct electron detectors to EBSD mapping in 2D and 3D by Mingard, K.P., Stewart, M., Gee, M.G., Vespucci, S., Trager-Cowan, C.

“…•A direct electron detector has been used to acquire electron backscatter diffraction patterns to produce EBSD maps.•The small detector size allows the simple…”
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Diffraction effects and inelastic electron transport in angle‐resolved microscopic imaging applications by WINKELMANN, A., NOLZE, G., VESPUCCI, S., NARESH‐KUMAR, G., TRAGER‐COWAN, C., VILALTA‐CLEMENTE, A., WILKINSON, A.J., VOS, M.

“…Summary We analyse the signal formation process for scanning electron microscopic imaging applications on crystalline specimens. In accordance with previous…”
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Diffractive triangulation of radiative point sources by Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K. P., Maneuski, D., O'Shea, V., Winkelmann, A.

“…We describe a general method to determine the location of a point source of waves relative to a two-dimensional single-crystalline active pixel detector. Based…”
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