Search Results - "Uruma, Takeshi"

Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope by Nakazawa, Kenta, Fukazawa, Kengo, Uruma, Takeshi, Hashiguchi, Gen, Iwata, Futoshi

“…An imaging method for a highly charged material using a Kelvin probe force microscope (KFM) was developed. Energy harvesters generate electric energy from the…”
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Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu, Iwata, Futoshi

“…We have imaged an n− layer of a commercial silicon fast recovery diode (Si-FRD) under applied bias voltages using frequency modulation atomic force microscopy…”
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Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices by Uruma, Takeshi, Tsunemitsu, Chiaki, Terao, Katsuki, Nakazawa, Kenta, Satoh, Nobuo, Yamamoto, Hidekazu, Iwata, Futoshi

“…Atomic force microscopy (AFM) was combined with scanning electron microscopy (SEM) to investigate electronic devices. In general, under observation using an…”
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Nanoscale observation of organic thin film by atomic force microscopy by Mochizuki, Shota, Uruma, Takeshi, Satoh, Nobuo, Saravanan, Shanmugam, Soga, Tetsuo

“…Organic photovoltaics (OPVs) fabricated using organic semiconductors and hybrid solar cells (HSCs) based on organic semiconductors/quantum dots (QDs) have been…”
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Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy by Yamamoto, Hidekazu, Agui, Kazuya, Uchida, Yuhki, Mochizuki, Shota, Uruma, Takeshi, Satoh, Nobuo, Hashizume, Tamotsu

“…The carrier concentration in a gallium nitride (GaN) substrate of a GaN-on-GaN wafer grown by hydride vapor phase epitaxy (HVPE) was evaluated by Raman…”
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Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu

“…We have developed a scanning probe microscope (SPM) that combines atomic force microscopy (AFM) with both Kelvin probe force microscopy (KFM - to measure the…”
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Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu

“…We have observed a commercial silicon-carbide Schottky barrier diode (SiC-SBD) using our novel analysis system, in which atomic force microscopy (AFM) is…”
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Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu, Iwata, Futoshi

“…We have measured a semiconductor region of a commercial silicon fast recovery diode (Si-FRD) under applied bias voltages by frequency modulation atomic force…”
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Investigation on the surface potential and the depletion layer of Si-Schottky barrier diode - Evaluation by numerical calculation by Komori, Kyohei, Oda, Akinori, Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu

“…Spatiotemporal variations of carrier density and potential in silicon-Schottky barrier diode (Si-SBD) have been simulated using a self-consistent spatially…”
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Investigation of the surface potential and the depletion layer of Silicon-Schottky barrier diode - Evaluation by scanning probe microscopy by Uruma, Takeshi, Satoh, Nobuo, Komori, Kyouhei, Oda, Akinori, Yamamoto, Hidekazu

“…We have developed a scanning-probe microscope (SPM) that combines atomic-force microscopy (AFM) with both Kelvin-probe force microscopy (KFM - to measure the…”
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