Search Results - "Uchibori, C J"

  • Showing 1 - 11 results of 11
Refine Results
  1. 1

    InxGa1-xAs ohmic contacts to n-type GaAs with a tungsten nitride barrier by UCHIBORI, C. J, OHTANI, Y, OKU, T, ONO, N, MURAKAMI, M

    Published in Journal of electronic materials (01-04-1997)
    “…Significant reduction of the contact resistance of In0.7Ga0.3As/Ni/W contacts (which were previously developed by sputtering in our laboratory) was achieved by…”
    Get full text
    Journal Article
  2. 2
  3. 3

    SEILA: Soft error immune latch for mitigating multi-node-SEU and local-clock-SET by Uemura, T, Tosaka, Y, Matsuyama, H, Shono, K, Uchibori, C J, Takahisa, K, Fukuda, M, Hatanaka, K

    “…We have developed a robust latch for achieving high reliability in LSI. The latch can attenuate multi-node single-event-upset (MNSEU) and single event…”
    Get full text
    Conference Proceeding
  4. 4

    Direct Attach of Photonic Components on Substrates With Optical Interconnects by Glebov, A.L., Uchibori, C.J., Lee, M.G.

    Published in IEEE photonics technology letters (15-04-2007)
    “…Direct attach of lasers and photodiodes on boards with optical interconnects can facilitate high-density packaging of high-speed optical components. For the…”
    Get full text
    Journal Article
  5. 5

    Thermal stress analysis of FCBGA during cooling under reflow process by Uchibori, C J, Lee, M

    Published in 2010 IEEE CPMT Symposium Japan (01-08-2010)
    “…Thermal stresses in Flip Chip Ball Grid Array (FCBGA) generated by the Chip Package Interaction (CPI) while cooling during the reflow process were calculated…”
    Get full text
    Conference Proceeding
  6. 6

    Formation mechanism of In sub(x)Ga sub(1-x)As ohmic contacts to n-type GaAs prepared by radio frequency sputtering by Uchibori, C J, Okunishi, M, Oku, T, Otsuki, A, Ono, N, Murakami, M

    Published in Journal of electronic materials (01-01-1994)
    “…The formation mechanisms of InAs/Ni/W ohmic contacts to n-type GaAs prepared by radio-frequency (rf) sputtering were studied by measuring contact resistances…”
    Get full text
    Journal Article
  7. 7
  8. 8
  9. 9

    Formation of WSi-based ohmic contacts to n-type GaAs by Oku, Takeo, Furumai, Masaki, Uchibori, Chihiro J., Murakami, Masanori

    Published in Thin solid films (28-05-1997)
    “…An outcome of the indirect doping concept conceived recently in NiGe-based Ohmic contacts has led to the development of annealed WSi-based Ohmic contacts to…”
    Get full text
    Journal Article
  10. 10
  11. 11

    In situ x-ray photoelectron spectroscopy measurement during Ta deposition on low- k dielectric SiLK by Uchibori, Chihiro. J., Kimura, Takahiro

    “…The bonding energy of Ta and C was measured by in situ x-ray photoelectron spectroscopy during sequential tantalum (Ta) deposition on low- k SiLK™. A tantalum…”
    Get full text
    Journal Article