Search Results - "Tzintzarov, George N"

Using TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs by Fleetwood, Zachary E., Lourenco, Nelson E., Ildefonso, Adrian, Warner, Jeffrey H., Wachter, Mason T., Hales, Joel M., Tzintzarov, George N., Roche, Nicolas J-H, Khachatrian, Ani, Buchner, Steven P., McMorrow, Dale, Paki, Pauline, Cressler, John D.

“…Silicon-germanium heterojunction bipolar transistor (SiGe HBT) models are used in technology computer aided design (TCAD) to investigate single event…”
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High Responsivity Ge Phototransistor in Commercial CMOS Si-Photonics Platform for Monolithic Optoelectronic Receivers by Frounchi, Milad, Tzintzarov, George N., Ildefonso, Adrian, Cressler, John D.

“…A high-gain phototransistor (PT) is demonstrated on a commercial 90-nm CMOS Si-photonics platform. The Gummel and output characteristics, the gain, and the…”
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A Comparison of Total-Ionizing-Dose Effects in Silicon and Silicon-Nitride Waveguides by Ringel, Brett L., Teng, Jeffrey W., Hosseinzadeh, Mozhgan, Sam, Delwyn G., Francis, Peter J., Parameswaran, Hari, Little, Arielle, Tzintzarov, George N., Monahan, Daniele M., LaLumondiere, Stephen D., Cressler, John D.

“…The total-ionizing-dose (TID) responses of silicon and low-loss silicon-nitride (SiN) integrated waveguides are evaluated. Mach-Zehnder interferometers (MZIs),…”
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Single-Event Transients in a Commercially Available, Integrated Germanium Photodiode for Silicon Photonic Systems by Tzintzarov, George N., Teng, Jeffrey W., Bozovich, Amanda N., Allen, Gregory R., Nergui, Delgermaa, Mensah, Yaw A., Cressler, John D.

“…Ion-induced SETs were captured from a germanium photodiode (PD) in an integrated silicon photonics technology platform. Statistics from 400 ion-strike events…”
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The Propagation of Extended SET Tails in RF Amplifiers Using 45-nm CMOS on PDSOI by Teng, Jeffrey W., Ringel, Brett L., Brumbach, Zachary R., Heimerl, Justin P., Mensah, Yaw A., Tzintzarov, George N., Ildefonso, Adrian, Khachatrian, Ani, McMorrow, Dale, Oldiges, Phil, Cressler, John D.

“…The propagation of long-duration single-event transient (SET) tails in radio-frequency (RF) amplifiers implemented with silicon-on-insulator (SOI)…”
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Direct Measurement of Total-Ionizing-Dose-Induced Phase Shifts in Commercially Available, Integrated Silicon-Photonic Waveguides by Tzintzarov, George N., Teng, Jeffrey W., Nergui, Delgermaa, Ringel, Brett L., Lalumondiere, Stephen D., Monahan, Daniele M., Little, Arielle, Cressler, John D.

“…In this work, integrated silicon photonic waveguides are exposed to ionizing radiation. A micro-beam X-ray source was utilized to deliver an isolated dose to a…”
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Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption by Tzintzarov, George N., Ildefonso, Adrian, Teng, Jeffrey W., Frounchi, Milad, Djikeng, Albert, Iyengar, Prahlad, Goley, Patrick S., Khachatrian, Ani, Hales, Joel, Bahr, Ryan, Buchner, Stephen P., Mcmorrow, Dale, Cressler, John D.

“…Optical single-event transients (OSETs) were measured for the first time in integrated silicon-photonic waveguides. A custom test fixture and novel…”
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The Effects of Carbon Doping on the Single-Event Transient Response of SiGe HBTs by Ildefonso, Adrian, Hales, Joel M., Khachatrian, Ani, Teng, Jeffrey W., Tzintzarov, George N., Nergui, Delgermaa, Ringel, Brett L., Raghunathan, Uppili, Jain, Vibhor, Cressler, John D., McMorrow, Dale

“…The impact of carbon doping on the single-event transient (SET) response of SiGe HBTs was evaluated using pulsed-laser charge generation via two-photon…”
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Cryogenic Total-Ionizing-Dose Response of 4th-Generation SiGe HBTs Using 1-MeV Electrons for Europa-Surface Applications by Teng, Jeffrey W., Nergui, Delgermaa, Tzintzarov, George N., Ringel, Brett L., Brumbach, Zachary R., Heimerl, Justin P., Mensah, Yaw A., Moody, Jackson P., Thorbourn, Dennis O., Castillo, Linda Del, Mojarradi, Mohammad M., Blalock, Benjamin J., Cressler, John D.

“…To support the use of SiGe BiCMOS for future mission targets such as Europa, which are subject to high radiation doses and cryogenic temperatures, SiGe…”
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New Approach for Pulsed-Laser Testing That Mimics Heavy-Ion Charge Deposition Profiles by Hales, Joel M., Cressler, John D., McMorrow, Dale, Khachatrian, Ani, Buchner, Stephen, Warner, Jeffrey, Ildefonso, Adrian, Tzintzarov, George N., Nergui, Delgermaa, Monahan, Daniele M., LaLumondiere, Stephen D.

“…A novel approach for two-photon absorption (TPA) pulsed-laser testing produces extended charge deposition profiles that are analogous to those produced by…”
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Using Bessel beams and two-photon absorption to predict radiation effects in microelectronics by Hales, Joel M, Khachatrian, Ani, Warner, Jeffrey, Buchner, Stephen, Ildefonso, Adrian, Tzintzarov, George N, Nergui, Delgermaa, Monahan, Daniele M, LaLumondiere, Stephen D, Cressler, John D, McMorrow, Dale

“…Pulsed-laser testing is an attractive tool for studying space-based radiation effects in microelectronics because it provides a high degree of spatial…”
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Variability in Total-Ionizing-Dose Response of Fourth-Generation SiGe HBTs by Teng, Jeffrey W., Ildefonso, Adrian, Tzintzarov, George N., Ying, Hanbin, Moradinia, Arya, Wang, Peng Fei, Li, Xun, Zhang, En Xia, Fleetwood, Daniel M., Cressler, John D.

“…Statistical analysis is performed on the totalionizing-dose (TID) response of fourth-generation silicon-germanium heterojunction bipolar transistors, revealing…”
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Response of Waveguide-Integrated Germanium-on-Silicon p-i-n Photodiodes to Neutron Displacement Damage by Goley, Patrick S., Dodds, Nathaniel A., Frounchi, Milad, Tzintzarov, George N., Nowlin, R. Nathan, Cressler, John D.

“…The effects of 14-MeV neutron displacement damage (DD) on waveguide (WG)-integrated germanium-on-silicon p-i-n photodiodes (PDs) for silicon photonics have…”
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Using Machine Learning to Mitigate Single-Event Upsets in RF Circuits and Systems by Ildefonso, Adrian, Kimball, Jacob P., Khachatrian, Ani, Mensah, Yaw, Teng, Jeffrey W., Tzintzarov, George N., Rao, Sunil G., Moradinia, Arya, Cressler, John D., McMorrow, Dale

“…The present article applies the <inline-formula> <tex-math notation="LaTeX">k </tex-math></inline-formula>-nearest neighbors (<inline-formula> <tex-math…”
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Integrated Silicon Photonics for Enabling Next-Generation Space Systems by Tzintzarov, George N., Rao, Sunil G., Cressler, John D.

“…A review of silicon photonics for space applications is presented. The benefits and advantages of size, weight, power, and cost (SWaP-C) metrics inherent to…”
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Comparison of Single-Event Transients in SiGe HBTs on Bulk and Thick-Film SOI by Ildefonso, Adrian, Warner, Jeffrey H., Cressler, John D., Tzintzarov, George N., Nergui, Delgermaa, Omprakash, Anup P., Goley, Patrick S., Hales, Joel M., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale

“…A comparison of heavy-ion-induced single-event transients (SETs) in silicon-germanium heterojunction bipolar transistors (SiGe HBTs) fabricated on both bulk…”
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Optimizing Optical Parameters to Facilitate Correlation of Laser- and Heavy-Ion-Induced Single-Event Transients in SiGe HBTs by Ildefonso, Adrian, Fleetwood, Zachary E., Tzintzarov, George N., Hales, Joel M., Nergui, Delgermaa, Frounchi, Milad, Khachatrian, Ani, Buchner, Stephen P., Mcmorrow, Dale, Warner, Jeffrey H., Harms, Joseph, Erickson, Anna, Voss, Kay, Ferlet-Cavrois, Veronique, Cressler, John D.

“…An approach for determining the optimal laser parameters (i.e., pulse energy, focused spot size, wavelength, and pulse duration) for correlating single-event…”
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Tradeoffs Between RF Performance and SET Robustness in Low-Noise Amplifiers in a Complementary SiGe BiCMOS Platform by Ildefonso, Adrian, Tzintzarov, George N., Lourenco, Nelson E., Fleetwood, Zachary E., Khachatrian, Ani, Buchner, Stephen P, McMorrow, Dale, Warner, Jeffrey H., Kaynak, Mehmet, Cressler, John D.

“…Low-noise amplifiers (LNAs) are necessary components for any communications system. Single-event transients (SETs) induced by energetic particles in space can…”
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Total Ionizing Dose Effects in 70-GHz Bandwidth Photodiodes in a SiGe Integrated Photonics Platform by Goley, Patrick S., Tzintzarov, George N., Zeinolabedinzadeh, Saeed, Ildefonso, Adrian, Motoki, Keisuke, Rong Jiang, En Xia Zhang, Fleetwood, Daniel M., Zimmermann, Lars, Kaynak, Mehmet, Lischke, Stefan, Mai, Christian, Cressler, John D.

“…Silicon waveguide (WG) integrated p-i-n germanium photodiodes (PDs) from a monolithic electronic-photonic integrated circuit technology were exposed to…”
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Single-Event Transients in SiGe HBTs Induced by Pulsed X-Ray Microbeam by Nergui, Delgermaa, Ildefonso, Adrian, Tzintzarov, George N., Lourenco, Nelson E., Omprakash, Anup P., Goley, Patrick S., Fleetwood, Zachary E., LaLumondiere, Stephen D., Bonsall, Jeremy P., Monahan, Daniele M., Kettering, Hunter, Brewe, Dale L., Cressler, John D.

“…This article presents an experimental study of single-event transients (SETs) induced by pulsed X-rays in SiGe heterojunction bipolar transistors (HBTs)…”
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