Search Results - "Twesten, Ray D"

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  1. 1

    Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity by Hart, James L., Lang, Andrew C., Leff, Asher C., Longo, Paolo, Trevor, Colin, Twesten, Ray D., Taheri, Mitra L.

    Published in Scientific reports (15-08-2017)
    “…In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional,…”
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    Journal Article
  2. 2

    Fast, Completely Reversible Li Insertion in Vanadium Pentoxide Nanoribbons by Chan, Candace K, Peng, Hailin, Twesten, Ray D, Jarausch, Konrad, Zhang, Xiao Feng, Cui, Yi

    Published in Nano letters (01-02-2007)
    “…Layered-structure nanoribbons with efficient electron transport and short lithium ion insertion lengths are promising candidates for Li battery applications…”
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    Journal Article
  3. 3

    The performance evaluation of direct detection electron energy-loss spectroscopy at 200 kV and 80 kV accelerating voltages by Cheng, Shaobo, Pofelski, Alexandre, Longo, Paolo, Twesten, Ray D., Zhu, Yimei, Botton, Gianluigi A.

    Published in Ultramicroscopy (01-05-2020)
    “…•The performance of direct electron detector (K2 IS) has been compared with the charge coupled device (CCD) detector at both 200 kV and 80 kV.•The advantages…”
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    Journal Article
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    Vacancy ordering and lithium insertion in III2VI3 nanowires by Peng, Hailin, Zhang, Xiao Feng, Twesten, Ray D., Cui, Yi

    Published in Nano research (01-04-2009)
    “…Superlattice structures resulting from vacancy ordering have been observed in many materials. Here we report vacancy ordering behavior in III 2 VI 3 nanowires…”
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    Journal Article
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    Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy by Bogle, Stephanie N., Nittala, Lakshmi N., Twesten, Ray D., Voyles, Paul M., Abelson, John R.

    Published in Ultramicroscopy (01-09-2010)
    “…Variable resolution fluctuation electron microscopy can reveal the characteristic decay length over which nanoscale order persists in amorphous materials. In…”
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    Journal Article
  8. 8

    Physical Evidence that Yeast Frataxin Is an Iron Storage Protein by Gakh, Oleksandr, Adamec, Jiri, Gacy, A. Marquis, Twesten, Ray D, Owen, Whyte G, Isaya, Grazia

    Published in Biochemistry (Easton) (28-05-2002)
    “…Frataxin is a conserved mitochondrial protein required for iron homeostasis. We showed previously that in the presence of ferrous iron recombinant yeast…”
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    Journal Article
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    Properties of combined TiN and Pt thin films applied to gas sensing by Åbom, A. Elisabeth, Hultman, Lars, Eriksson, Mats, Twesten, Ray D.

    “…TiN was introduced as a part of the sensing layer of gas sensitive metal–insulator–semiconductor (MIS) devices. Three types of metallic gate layer structures…”
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    Journal Article
  11. 11

    Review of recent advances in spectrum imaging and its extension to reciprocal space by Maigné, Alan, Twesten, Ray D.

    Published in Journal of electron microscopy (01-06-2009)
    “…Using examples from various domains of science, this review covers some recent developments in spectrum imaging (SI) using scanning transmission electron…”
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    Journal Article
  12. 12
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    Vacancy ordering and lithium insertion in III sub(2)VI sub(3) nanowires by Peng, Hailin, Zhang, Xiao Feng, Twesten, Ray D, Cui, Yi

    Published in Nano research (01-04-2009)
    “…Superlattice structures resulting from vacancy ordering have been observed in many materials. Here we report vacancy ordering behavior in III sub(2)VI sub(3)…”
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    Journal Article
  14. 14

    Advances in selective wet oxidation of AlGaAs alloys by Choquette, K.D., Geib, K.M., Ashby, C.I.H., Twesten, R.D., Blum, O., Hou, H.Q., Follstaedt, D.M., Hammons, B.E., Mathes, D., Hull, R.

    “…We review the chemistry, microstructure, and processing of buried oxides converted from AlGaAs layers using wet oxidation. Hydrogen is shown to have a central…”
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    Journal Article
  15. 15

    Fast STEM Spectrum Imaging Using Simultaneous EELS and EDS by Longo, Paolo, Twesten, Ray D

    Published in Microscopy today (01-01-2013)
    “…Up to now, researchers performing analytical investigations in the transmission electron microscope typically had to choose between analytical spectroscopy…”
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    Magazine Article
  16. 16

    Simultaneous EELS/EDS Composition Mapping at Atomic Resolution Using Fast STEM Spectrum-Imaging by Longo, Paolo, Thomas, Paul, Aitouchen, Aziz, Schaffer, Bernhard, Twesten, Ray D.

    Published in Microscopy today (01-07-2013)
    “…With advancements in aberration-corrected electron optics, the resolution in scanning transmission electron microscopy (STEM) has been significantly improved…”
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    Magazine Article
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    Atomic-Level EELS Mapping Using High-Energy Edges in Dualeels™ Mode by Longo, Paolo, Thomas, Paul J., Twesten, Ray D.

    Published in Microscopy today (01-07-2012)
    “…With advancements in aberration correction, the spatial resolution of scanning transmission electron microscopy (STEM) has been enormously improved. In…”
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    Magazine Article
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    Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph by Longo, Paolo, Thomas, Paul J, Aitouchen, Aziz, Rice, Phil, Topuria, Teya, Twesten, Ray D

    Published in Microscopy today (01-07-2015)
    “…Scanning transmission electron microscopy (STEM) based techniques continue to be the gold standard for such analysis at interfaces, and aberration correction…”
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    Magazine Article