Search Results - "Turanský, R."

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  1. 1

    Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism by Bamidele, J., Lee, S.H., Kinoshita, Y., Turanský, R., Naitoh, Y., Li, Y.J., Sugawara, Y., Štich, I., Kantorovich, L.

    Published in Nature communications (31-07-2014)
    “…Manipulation is the most exciting feature of the non-contact atomic force microscopy technique as it allows building nanostructures on surfaces. Usually…”
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    Journal Article
  2. 2

    Structure and Properties of Heavily B and P Codoped Amorphous Silicon Quantum Dots by Turanský, R, Brndiar, J, Pershin, A, Gali, Á, Sugimoto, H, Fujii, M, Štich, I

    Published in Journal of physical chemistry. C (28-10-2021)
    “…Colloidal silicon quantum dots feature a number of outstanding properties, such as size and termination controlled band gap and photoluminescence, which, in…”
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  3. 3

    Promoting Atoms into Delocalized Long-Living Magnetically Modified State Using Atomic Force Microscopy by Kinoshita, Y, Turanský, R, Brndiar, J, Naitoh, Y, Li, Y. J, Kantorovich, L, Sugawara, Y, Štich, I

    Published in Nano letters (14-12-2016)
    “…We report on a low-temperature atomic force microscropy manipulation of Co atoms in ultrahigh vacuum on an oxidized copper surface in which the manipulated…”
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  4. 4

    Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces by Bamidele, J., Kinoshita, Y., Turanský, R., Lee, S. H., Naitoh, Y., Li, Y. J., Sugawara, Y., Štich, I., Kantorovich, L.

    “…Joint experimental and theoretical investigation of image formation in non-contact atomic force microscopy (NC-AFM) of the c(6 x 2) and p(2 x 1) phases of the…”
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  5. 5

    Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface by Bamidele, J., Kinoshita, Y., Turanský, R., Lee, S. H., Naitoh, Y., Li, Y. J., Sugawara, Y., Štich, I., Kantorovich, L.

    “…We present a joint experimental/theoretical study of the oxygen-terminated Cu(110) surface. Noncontact atomic force microscopy (NC-AFM) identifies patches of…”
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