Search Results - "Tuntasood, P."

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  1. 1

    A novel self-aligned highly reliable sidewall split-gate flash memory by Caleb Yu-Sheng Cho, Ming-Jer Chen, Chiou-Feng Chen, Tuntasood, P., Fan, D.-T., Tseng-Yi Liu

    Published in IEEE transactions on electron devices (01-03-2006)
    “…A self-aligned sidewall split-gate Flash memory cell is fabricated with overerase immunity. Particularly, the sidewall corner of the floating-gate is…”
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    Journal Article
  2. 2

    Increased current gain and suppression of peripheral base currents in silicide self-aligned narrow-width polysilicon-emitter transistors of an advanced BiCMOS technology by El-Diwany, M.H., Brassington, M.P., Tuntasood, P.

    Published in IEEE electron device letters (01-05-1988)
    “…Silicidation of the emitter and base regions of the bipolar transistors of an advanced single-level polysilicon BiCMOS (bipolar complementary metal oxide…”
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    Journal Article
  3. 3

    An advanced single-level polysilicon submicrometer BiCMOS technology by Brassington, M.P., El-Diwany, M.H., Razouk, R.R., Thomas, M.E., Tuntasood, P.T.

    Published in IEEE transactions on electron devices (01-04-1989)
    “…An advanced VLSI (very large scale integration) technology providing high-performance n-p-n bipolar (f/sub T/=9 GHz) and submicrometer gate-length MOS…”
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    Journal Article
  4. 4

    Use of the polysilicon gate layer for local interconnect in a CMOS technology incorporating LDD structures by El-Diwany, M.H., Brassington, M.P., Tuntasood, P., Razouk, R.R., Poulter, M.W.

    Published in IEEE transactions on electron devices (01-09-1988)
    “…In conventional single-level polysilicon technologies, the polysilicon gate layer can be used as an interconnect layer through buried contacts between…”
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    Journal Article
  5. 5

    Split-gate NAND flash memory at 120nm technology node featuring fast programming and erase by Cheng-Yuan Hsu, Chi-Wei Hung, Da Sung, Chi-Shan Wu, Chen, S.C., Kuo, H.H., Pan, J.Y., Chen, C.L., Chuang, I.C., Huang, V., Hsue, C.C., Fan, D.-T., Jung-Chang Lu, Cho, C.Y.-S., Tseng, K., Hsu, A., Sheen, B., Tuntasood, P., Chiou-Feng Chen

    “…For the first time, split-gate NAND flash memory featuring interpoly erase and mid-channel programming is demonstrated at 120nm technology node. The cell array…”
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    Conference Proceeding
  6. 6

    Increased current gain and suppression of peripheral base currents in silicided self-aligned narrow width polysilicon-emitter transistors of an advanced BiCMOS technology by EL-DIWANY, M. H, BRASSINGTON, M. P, TUNTASOOD, P

    Published in IEEE electron device letters (01-05-1988)
    “…Silicidation of the emitter and base regions of the biopolar transistors of an advanced single-level polysilicon BiCMOS (bipolar complementary metal oxide…”
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    Journal Article
  7. 7

    Advanced One Micron BICMOS Technology for High Speed 256K SRAMS by Bastani, B., Lage, C., Wong, L., Small, J., Lahri, R., Bouknight, L., Bowman, T., Manoliu, J., Tuntasood, P.

    “…One micron BiCMOS technology for high speed 256K SRAM is developed. Advanced lithography and processing techniques support high density CMOS design with ECL…”
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    Conference Proceeding
  8. 8

    New techniques for elimination of the bird's head and bird's beak by Burton, G., Tuntasood, P., Chien, F., Kovacs, R., Vora, M.

    “…This paper introduces new techniques for the elimination of the infamous bird's head and bird's beak which result from the recessed Isoplanar technology. The…”
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    Conference Proceeding