Search Results - "Tulala, Peter"
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1
Unsupervised Wafermap Patterns Clustering via Variational Autoencoders
Published in 2018 International Joint Conference on Neural Networks (IJCNN) (01-07-2018)“…Semiconductor manufacturing processes are prone to process deviations or other production issues. Quality assurance of every processing step and measuring…”
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Conference Proceeding -
2
DeepWafer: A Generative Wafermap Model with Deep Adversarial Networks
Published in 2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA) (01-12-2022)“…A certain amount of process deviations characterizes semiconductor manufacturing processes. Automated detection of these production issues followed by an…”
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Conference Proceeding