Search Results - "Tsuzukiyama, Koji"
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Ellipsometry for Measurement of Complex Dielectric Permittivity in Millimeter-Wave Region
Published in 2003 33rd European Microwave Conference (01-10-2003)“…The ellipsometry method is extended to a measurement for complex permittivities of materials in millimeter-wave region. We propose an effective technique based…”
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Conference Proceeding
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2
Ellipsometry for measurement of complex dielectric permittivity in millimeter-wave region
Published in 33rd European Microwave Conference Proceedings (IEEE Cat. No.03EX723C) (2003)“…The ellipsometry method is extended to a measurement for complex permittivities; of materials in millimeter-wave region. We propose an effective technique…”
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Conference Proceeding