Search Results - "Tsusaka, Yoshiyuki"

Large-area total-thickness imaging and Burgers vector analysis of dislocations in β-Ga2O3 using bright-field x-ray topography based on anomalous transmission by Yao, Yongzhao, Tsusaka, Yoshiyuki, Sasaki, Kohei, Kuramata, Akito, Sugawara, Yoshihiro, Ishikawa, Yukari

“…Using bright-field x-ray topography based on anomalous transmission (AT), we have demonstrated the first large-area total-thickness imaging of dislocations in…”
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Study of dislocations in AlN single-crystal using bright-field synchrotron x-ray topography under a multiple-beam diffraction condition by Yao, Yongzhao, Tsusaka, Yoshiyuki, Ishikawa, Yukari, Sugawara, Yoshihiro, Fujita, Yu, Matsui, Junji, Okada, Narihito, Tadatomo, Kazuyuki

“…Dislocations in an AlN single crystal were studied via bright-field synchrotron x-ray topography under a multiple-beam diffraction (MBD) condition. Two-beam…”
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X-ray topographical analysis of 4H-SiC epitaxial layers using a forward-transmitted beam under a multiple-beam diffraction condition by Kamata, Isaho, Tsusaka, Yoshiyuki, Tanuma, Ryohei, Matsui, Junji

“…Multiple-beam diffraction X-ray topography was used to determine the Burgers vector b of threading edge dislocations (TEDs) and basal plane dislocations (BPDs)…”
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Development of hard X-ray dark-field microscope using full-field optics by Takano, Hidekazu, Azuma, Hiroaki, Shimomura, Sho, Tsuji, Takuya, Tsusaka, Yoshiyuki, Kagoshima, Yasushi

“…We develop a dark-field X-ray microscope using full-field optics based on a synchrotron beamline. Our setup consists of a condenser system and a microscope…”
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Hard X-ray nanoimaging method using local diffraction from metal wire by Takano, Hidekazu, Konishi, Shigeki, Shimomura, Sho, Azuma, Hiroaki, Tsusaka, Yoshiyuki, Kagoshima, Yasushi

“…A simple hard X-ray imaging method achieving a high spatial resolution is proposed. Images are obtained by scanning a metal wire through the wave field to be…”
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Simple Scanning Phase-Contrast X-ray Tomography Using Intensity Detectors by Takano, Hidekazu, Shimomura, Sho, Konishi, Shigeki, Azuma, Hiroaki, Tsusaka, Yoshiyuki, Kagoshima, Yasushi

“…We have developed a phase-contrast X-ray microtomography system based on scanning microscopy with X-ray focusing optics. The system is very simple because only…”
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Tandem-Phase Zone-Plate Optics for High-Energy X-ray Focusing by Kagoshima, Yasushi, Takano, Hidekazu, Koyama, Takahisa, Tsusaka, Yoshiyuki, Saikubo, Akihiko

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Stability-instability transition of reaction fronts in thermal oxidation of silicon by Omi, Hiroo, Kageshima, Hiroyuki, Kawamura, Tomoaki, Uematsu, Masashi, Kobayashi, Yoshihiro, Fujikawa, Seiji, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji

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Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography by Koyama, Takahisa, Tsuji, Takuya, Yoshida, Keisuke, Takano, Hidekazu, Tsusaka, Yoshiyuki, Kagoshima, Yasushi

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In-plane strain distribution in the surface region of thin silicon overlayers on insulator by Omi, Hiroo, Kawamura, Tomoaki, Fujikawa, Seiji, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji

“…A thin silicon nano-overlayer (SNOL) fabricated by oxidation and etchback in a separation by implantation of oxygen wafer was investigated by grazing incident…”
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Crystallinity estimation of thin silicon-on-insulator layers by means of diffractometry using a highly parallel X-ray microbeam by Takeda, Shingo, Yokoyama, Kazushi, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji, Ogura, Atsushi

“…An X-ray microbeam with a small angular divergence and a narrow energy bandwidth has been produced at BL24XU at SPring-8. The beam size was measured to be 3.1…”
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Crystallinity Investigation of Compositionally Graded SiGe Layers by Synchrotron X-ray Cross-Sectional Diffraction by Senda, Takeshi, Izunome, Koji, Tsusaka, Yoshiyuki, Fukuda, Kazunori, Hayashi, Kazuki, Abe, Maiko, Takahata, Sayuri, Takano, Hidekazu, Kagoshima, Yasushi, Matsui, Junji

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Structural analysis of ELO-GaN grown on a sapphire substrate as the underlying layer of a GaN-based laser diode by Miyajima, Takao, Takeda, Shingo, Tsusaka, Yoshiyuki, Matsui, Junji, Kudo, Yoshihiro, Tomiya, Shigetaka, Hino, Tomonori, Goto, Shu, Ikeda, Masao, Narui, Hironobu

“…Using micro‐beam X‐ray diffraction (XRD), small c‐axis tilting was observed in maskless epitaxially laterally overgrown GaN (ELO‐GaN), which is a suitable…”
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High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope by Koyama, Takahisa, Kagoshima, Yasushi, Wada, Izumi, Saikubo, Akihiko, Shimose, Kenichi, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji

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Formation of Parallel X-Ray Microbeam and Its Application by Tsusaka, Yoshiyuki, Yokoyama, Kazushi, Takeda, Shingo, Urakawa, Masafumi, Kagoshima, Yasushi, Matsui, Junji, Kimura, Shigeru, Kimura, Hidekazu, Kobayashi, Kenji, Izumi, Koichi

“…We have developed a parallel X-ray microbeam of 7×5 µm 2 in size with a small angular divergence, which aims high-resolution strain measurements in a very…”
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Scanning Differential-Phase-Contrast Hard X-Ray Microscopy with Wedge Absorber Detector by Kagoshima, Yasushi, Shimose, Ken-ich, Koyama, Takahisa, Wada, Izumi, Saikubo, Akihiko, Hayashi, Kenji, Tsusaka, Yoshiyuki, Matsui, Junji

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High-resolution microbeam x-ray diffractometry applied to InGaAsP/InP layers grown by narrow-stripe selective metal-organic vapor phase epitaxy by Kimura, Shigeru, Kimura, Hidekazu, Kobayashi, Kenji, Oohira, Tomoaki, Izumi, Koich, Sakata, Yasutaka, Tsusaka, Yoshiyuki, Yokoyama, Kazushi, Takeda, Shingo, Urakawa, Masafumi, Kagoshima, Yasushi, Matsui, Junji

“…We measure the diffraction peaks of InGaAsP selective metal-organic vapor-phase epitaxial layers on 1.7-μm-wide InP stripe regions between a pair of SiO2 mask…”
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Focusing Hard X-Ray with a Single Lens by Zhang, Yanping, Katoh, Takanori, Kagoshima, Yasushi, Matui, Junji, Tsusaka, Yoshiyuki

“…We show that a 10 keV X-ray has been focused into 3.4–8.4 µm at a focal length F =0.4–1.5 m with a single refractive lens and such X-ray microbeams can be…”
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Real-Time Observation of Fractional-Order X-ray Reflection Profiles of InP(001) During Step-Flow Growth by Fujikawa, Seiji, Kawamura, Tomoaki, Bhunia, Satyaban, Watanabe, Yoshio, Tokushima, Kenshi, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji

“…Fractional-order X-ray reflection profiles of (2×1)-InP(001) have been observed for the first time during step-flow growth of metalorganic chemical vapor…”
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500-nm-Resolution 10 keV X-Ray Imaging Transmission Microscope with Tantalum Phase Zone Plates by Kagoshima, Yasushi, Ibuki, Takashi, Takai, Kengo, Yokoyama, Yoshiyuki, Miyamoto, Naoki, Tsusaka, Yoshiyuki, Matsui, Junji

“…An imaging transmission hard X-ray microscope has been constructed at the Hyogo-BL (BL24XU) of SPring-8. It makes use of X-ray phase zone plates (PZP's) made…”
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