Search Results - "Tsunemi, Eika"

Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy by Hirose, Masaharu, Tsunemi, Eika, Kobayashi, Kei, Yamada, Hirofumi

“…We performed electrical transport measurements on α-sexithiophene crystalline grains using a dual-probe atomic force microscopy system having two independently…”
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Fabrication and Characterization of Floating Memory Devices Based on Thiolate-Protected Gold Nanoclusters by Hirata, Naoyuki, Sato, Minako, Tsunemi, Eika, Watanabe, Yoshio, Tsunoyama, Hironori, Nakaya, Masato, Eguchi, Toyoaki, Negishi, Yuichi, Nakajima, Atsushi

“…The floating memory properties of thiolate-protected gold (Au:SR) nanoclusters, Au25(SR)18, Au38(SR)24, Au144(SR)60, and Au333(SR)79 (R = C12H25), and Au…”
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Visualization of Charge Injection Processes in Polydiacetylene Thin Film Grains by Dual-Probe Atomic Force Microscopy by Hirose, Masaharu, Tsunemi, Eika, Kobayashi, Kei, Yamada, Hirofumi

“…We have recently developed a dual-probe atomic force microscopy (DP-AFM) system having two AFM cantilever probes whose positions can be independently…”
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Investigations of Local Electrical Properties of Pentacene Thin Films by Dual-Probe Atomic Force Microscopy by Hirose, Masaharu, Tsunemi, Eika, Kobayashi, Kei, Yamada, Hirofumi, Matsushige, Kazumi

“…We performed local electrical transport measurement on single grains of a pentacene thin film using a lab-built dual-probe atomic force microscopy (DP-AFM)…”
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Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method by Tsunemi, Eika, Satoh, Nobuo, Miyato, Yuji, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi

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Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes by Satoh, Nobuo, Tsunemi, Eika, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi

“…We developed a multi-probe atomic force microscopy (MP-AFM) system using piezo-resistive cantilevers. The use of piezo-resistive self-sensing cantilevers with…”
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Multi-Probe Atomic Force Microscopy Using Piezoelectric Cantilevers by Satoh, Nobuo, Tsunemi, Eika, Miyato, Yuji, Kobayashi, Kei, Watanabe, Shunji, Fujii, Toru, Matsushige, Kazumi, Yamada, Hirofumi

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Twin-Probe Atomic Force Microscopy with Optical Beam Deflection Using Vertically Incident Lasers by Two Beam Splitter by SATOH, NOBUO, TSUNEMI, EIKA, KOBAYASHI, KEI, KOMATSUBARA, TAKASHI, HIGUCHI, SEIJI, MATSUSHIGE, KAZUMI, YAMADA, HIROFUMI

“…SUMMARY We developed a twin‐probe atomic force microscopy (AFM) system using Si cantilever‐probes. The system utilizes the optical beam deflection method in…”
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