Search Results - "Tseng, Sheng Tsaing"

Mis-Specification Analysis of Linear Degradation Models by Peng, Chien-Yu, Tseng, Sheng-Tsaing

“…Degradation models are widely used to assess the lifetime information of highly reliable products if there exists quality characteristics whose degradation…”
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Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes by Sheng-Tsaing Tseng, Balakrishnan, N., Chih-Chun Tsai

“…Step-stress accelerated degradation testing (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use…”
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Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects by Chih-Chun Tsai, Sheng-Tsaing Tseng, Balakrishnan, N.

“…Degradation models are usually used to provide information about the reliability of highly reliable products that are not likely to fail within a reasonable…”
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Optimal design for step-stress accelerated degradation tests by Liao, C.-M., Tseng, S.-T.

“…Today, many products are designed to function for a long period of time before they fail. For such highly-reliable products, collecting accelerated degradation…”
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Global planning of accelerated degradation tests based on exponential dispersion degradation models by Lee, I‐Chen, Tseng, Sheng‐Tsaing, Hong, Yili

“…The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is…”
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Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models by Chien-Yu Peng, Sheng-Tsaing Tseng

“…Degradation models are widely used to assess the lifetime information of highly reliable products possessing quality characteristics that both degrade over…”
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Planning gamma accelerated degradation tests with two accelerating variables by Tung, Hung‐Ping, Tseng, Sheng‐Tsaing

“…Gamma accelerated degradation tests (ADT) are widely used to assess timely lifetime information of highly reliable products with degradation paths that follow…”
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Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products by Peng, Chien-Yu, Tseng, Sheng-Tsaing

“…For highly reliable products with very few test units, a progressive-stress accelerated degradation test (PSADT) has been proposed in the literature to obtain…”
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Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process by Chih-Chun Tsai, Sheng-Tsaing Tseng, Balakrishnan, N

“…Burn-in test is a manufacturing process applied to products to eliminate latent failures or weak components in the factory before the products reach customers…”
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Adaptive Warranty Prediction for Highly Reliable Products by Hsu, Nan-Jung, Tseng, Sheng-Tsaing, Chen, Ming-Wei

“…Field return rate prediction is important for manufacturers to assess the product reliability and develop effective warranty management. To get timely…”
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Fault Detection Based on Statistical Multivariate Analysis and Microarray Visualization by Ming-Da Ma, Wong, D.S.-H., Shi-Shang Jang, Sheng-Tsaing Tseng

“…In this work, a statistical method is proposed to mine out key variables from a large set of variables recorded in a limited number of runs through a…”
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Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysis by Khakifirooz, Marzieh, Fathi, Michel, Lee, I-Chen, Tseng, Sheng-Tsaing

“…The literature on fatigue analysis can be classified into parametric or analytic approaches that try to model the fatigue data with a specific distribution,…”
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Determination of burn-in parameters and residual life for highly reliable products by Tseng, Sheng-Tsaing, Tang, Jen, Ku, In-Hong

“…Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge…”
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Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models by Tseng, Sheng-Tsaing, Lee, I-Chen

“…Optimum allocation problem in accelerated degradation tests (ADTs) is an important task for reliability analysts. Several researchers have attempted to address…”
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Analytical approach for designing accelerated degradation tests under an exponential dispersion model by Tung, Hung-Ping, Lee, I-Chen, Tseng, Sheng-Tsaing

“…To provide timely lifetime information of manufactured products to potential customers, designing an efficient accelerated degradation test (ADT) is an…”
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Mis-specification analyses of gamma and Wiener degradation processes by Tsai, Chih-Chun, Tseng, Sheng-Tsaing, Balakrishnan, N.

“…Degradation models are widely used these days to assess the lifetime information of highly reliable products if there exist some quality characteristics (QC)…”
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Sequential Bayesian Design for Accelerated Life Tests by Lee, I-Chen, Hong, Yili, Tseng, Sheng-Tsaing, Dasgupta, Tirthankar

“…Most of the recently developed methods on optimum planning for accelerated life tests (ALT) involve "guessing" values of parameters to be estimated, and…”
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Performance Analysis of EWMA Controllers Subject to Metrology Delay by Ming-Feng Wu, Chien-Hua Lin, Wong, D.S.-H., Shi-Shang Jang, Sheng-Tsaing Tseng

“…Metrology delay is a natural problem in the implementation of advanced process control scheme in semiconductor manufacturing systems. It is very important to…”
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Stability conditions and robustness analysis of a general MMSE run-to-run controller by Tseng, Sheng-Tsaing, Tsung, Fugee, Jo-Hua, Wu

“…Run-to-run (R2R) control plays a vital role in monitoring or adjusting the manufacturing process of integrated circuits. In this article we propose a…”
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A generalized pH acceleration model of nano-sol products and the effects of model misspecification on shelf-life prediction by Hung-Ping, Tung, Tseng, Sheng-Tsaing, Nan-Jung Hsu, Yi-Ting Hou

“…In existing pH acceleration models, which are used to assess the shelf-life of liquid-phase nano-sol products, a mixture of normal distributions is commonly…”
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