Search Results - "Tollenaere, Michel"

Defining and Measuring Supply Chain Performance: A Systematic Literature Review by Fatma, Lehyani, Zouari, Alaeddine, Ghorbel, Ahmed, Tollenaere, Michel

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Do KM and TQM have an impact on employee effectiveness and supply chain performance? by Lehyani, Fatma, Zouari, Alaeddine, Ghorbel, Ahmed, Tollenaere, Michel

“…Purpose Companies should enhance their market position and competitiveness by improving staff effectiveness, skills, resource commitment, and applying relevant…”
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Modular and platform methods for product family design: literature analysis by Jose, Alberto, Tollenaere, Michel

“…After the industrial revolution, the literature has mentioned different principles to allow a better management of the production and product life cycle…”
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Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing by Sahnoun, M’hammed, Bettayeb, Belgacem, Bassetto, Samuel-Jean, Tollenaere, Michel

“…Semiconductor manufacturing processes are very long and complex, needing several hundreds of individual steps to produce the final product (chip). In this…”
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Quality and exposure control in semiconductor manufacturing. Part I: Modelling by Bettayeb, Belgacem, Bassetto, Samuel, Vialletelle, Philippe, Tollenaere, Michel

“…The purpose of this paper is to present a heuristic algorithm for quality control planning from an insurance perspective. The approach proposed here is…”
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Controlling non-conformities propagation in manufacturing by Fiegenwald, Valérie, Bassetto, Samuel, Tollenaere, Michel

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Quality and exposure control in semiconductor manufacturing. Part II: Evaluation by Bettayeb, Belgacem, Bassetto, Samuel, Vialletelle, Philippe, Tollenaere, Michel

“…The purpose of this article is to test the performance of a heuristic algorithm that computes a quality control plan. The objective of the tests reported in…”
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The management of process control deployment using interactions in risks analyses by Bassetto, Samuel, Siadat, Ali, Tollenaere, Michel

“…The purpose of this article is to present the concept of risk typology and its use in the management of process control deployment at a fab-wide level. This…”
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Dynamic risk management unveil productivity improvements by Mili, Aymen, Bassetto, Samuel, Siadat, Ali, Tollenaere, Michel

“…Maintenance process and planning are at the heart of industrial occupations. Processes and equipments require controls and strategies to reduce costs and yield…”
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Domain knowlege versioning and aggregation mechanisms in product design processes by Aleddine, Zouari, Tollenaere, Michel, Habib, Ben, Aref, Y

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Experts’ knowledge renewal and maintenance actions effectiveness in high-mix low-volume industries, using Bayesian approach by Ben Said, Anis, Shahzad, Muhammad Kashif, Zamai, Eric, Hubac, Stéphane, Tollenaere, Michel

“…Increasing demand diversity has resulted in high-mix low-volume production where success depends on the ability to quickly design and develop new products…”
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Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling by Sahnoun, M'Hammed, Bassetto, Samuel, Tollenaere, Michel, Vialletelle, Philippe, Bastoini, Soidri

“…This article studies the skip, under some assumptions, of process control operations. The case of one tool, one enhanced buffer and one metrology tool of a…”
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Domain knowledge versioning and aggregation mechanisms in product design processes by Zouari, Alaeddine, Tollenaere, Michel, Ben Bacha, Habib, Maalej, Aref Y

“…In the context of concurrent engineering and routine design, this study consists in the first step of structuring knowledge models. In the second step, it…”
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Risks > management unveil productivity improvements by Mili, Aymen, Bassetto, Samuel, Siadat, Ali, Tollenaere, Michel

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Modular and Platform methods for product family design: Literature review by Flores, J.-A., Tollenaere, Michel

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Product information systems engineering: an approach for building product models by reuse of patterns by Gzara, Lilia, Rieu, Dominique, Tollenaere, Michel

“…This paper deals with an approach for Product Information Systems (PIS) engineering by reuse of patterns. Patterns form generic solutions to problems…”
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Optimized design of control plans based on risk exposure and resources capabilities by Bettayeb, B, Vialletelle, P, Bassetto, S, Tollenaere, M

“…In this paper, we present a coherent method for Quality Control planning that tackles the limitations of traditional approaches when applied to an advanced…”
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4.2.1 Business meets Systems Engineering: Facing and Handling Collaboration Challenges in Requirements Analysis by Laudan, Timo, Mauritz, Axel, Tollenaere, Michel, Gardoni, Mickaël

“…Traditional requirements analysis models focused on system‐ and user interactions. Whereas, much effort – in particular industrial – is devoted to the logical…”
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Optimizing return on inspection trough defectivity smart sampling by Sahnoun, M, Vialletelle, P, Bassetto, S, Bastoini, S, Tollenaere, M

“…In this paper we describe the use of an index to continuously monitor the risk of producing defective parts in a semiconductor production line. This index is…”
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Patterns Approach to Product Information Systems Engineering by Gzara, Lilia, Rieu, Dominique, Tollenaere, Michel

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