Structural, optical and thermo electrical properties of nanostructured vacuum evaporated CdS thin films

Nano structured thin films having different thickness of CdS were deposited by thermal evaporation techniques, onto precleaned amorphous glass substrate at room temperature. The structural properties of films were evaluated by XRD, Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM)...

Full description

Saved in:

Bibliographic Details
Published in:	Electronic materials letters Vol. 10; no. 1; pp. 21 - 25
Main Authors:	Kale, M. S., Toda, Y. R., Bhole, M. P., Bhavsar, D. S.
Format:	Journal Article
Language:	English
Published:	Dordrecht Springer Netherlands 2014 대한금속·재료학회
Subjects:	Cadmium sulfides Characterization and Evaluation of Materials Chemistry and Materials Science Condensed Matter Physics Deposition Energy gaps (solid state) Evaporation Fermi surfaces Materials Science Nanostructure Nanotechnology Nanotechnology and Microengineering Optical and Electronic Materials Scanning electron microscopy Thin films 전자/정보통신공학 AFM SEM thermal evaporation XRD EDAX optical band gap
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

Description
Summary:	Nano structured thin films having different thickness of CdS were deposited by thermal evaporation techniques, onto precleaned amorphous glass substrate at room temperature. The structural properties of films were evaluated by XRD, Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). The quantitative analysis was done by Energy Dispersive Analysis for x-ray to determine atomic % of the material used. The optical band gaps of the films were measured by using optical absorption spectra. Thermo Electrical parameters such as Fermi energy (0.098 to 0.006 eV), absorption coefficient (1.04 to 1.16) have been estimated. The x-ray diffraction analysis confirms that films are polycrystalline in nature having orthorhombic structure with a preferential orientation along the (040) plane. The degree of such a preferred orientation was found to increase with film thickness. The lattice parameters ( a = 14.315, b = 14.568 and c = 14.074 Å) size (D) were calculated and found to be 242.9 nm. Unit cell volume is found to be 2935. SEM investigation confirms that films were uniformly deposited over the surface and particles were granular in nature. The particle size was determined by using SEM and found to be 6.88–10.86 nm. It is found that CdS is direct band gap material having value of 2.42 eV.
Bibliography:	ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 G704-SER000000579.2014.10.1.018
ISSN:	1738-8090 2093-6788
DOI:	10.1007/s13391-013-3142-y