Search Results - "Ting, J.W."

JEDEC-Qualified Highly Reliable 22nm FD-SOI Embedded MRAM For Low-Power Industrial-Grade, and Extended Performance Towards Automotive-Grade-1 Applications by Naik, V. B., Yamane, K., Lee, T.Y., Kwon, J., Chao, R., Lim, J.H., Chung, N.L., Behin-Aein, B., Hau, L.Y., Zeng, D., Otani, Y., Chiang, C., Huang, Y., Pu, L., Jang, S.H., Neo, W.P., Dixit, H., Goh, S. K L. C., Toh, E. H., Ling, T., Hwang, J., Ting, J.W., Low, R., Zhang, L., Lee, C.G., Balasankaran, N., Tan, F., Gan, K. W., Yoon, H., Congedo, G., Mueller, J., Pfefferling, B., Kallensee, O., Vogel, A., Kriegerstein, V., Merbeth, T., Seet, C.S., Ong, S., Xu, J., Wong, J., You, Y.S., Woo, S.T., Chan, T.H., Quek, E., Siah, S. Y.

“…We demonstrate highly reliable and mass-production ready 22nm FD-SOI 40Mb embedded-MRAM for industrial-grade (-40~125°C) applications. This technology having…”
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A comparison of the neurotropism of Theiler's virus and poliovirus in CBA mice by Villarreal, D., Young, C.R., Storts, R., Ting, J.W., Welsh, C.J.R.

“…Theiler's murine encephalomyelitis virus (TMEV) and poliovirus infect the central nervous system (CNS) and cause neurological damage. The exact route by which…”
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STT-MRAM Product Reliability and Cross-Talk by Naik, V. B., Yamane, K., Kwon, J., Lim, J.H., Balasankaran, N., Chung, N.L., Hau, L.Y., Chao, R., Chiang, C., Huang, Y., Pu, L., Ma, L., Meng, C., Otani, Y., Zhang, L., Jang, S.H., Ling, T., Ting, J.W., Yoon, H., Mueller, J., Pfefferling, B., Kallensee, O., Merbeth, T., Seet, C.S., Wong, J., You, Y.S., Soss, S., Chan, T.H., Siah, S.Y.

“…STT-MRAM has been showcased to be a viable solution to replace eFlash and SRAM technologies. With the increasing demand for connected edge computing and…”
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High voltage amplifier by Ting, J.W., Peng, W.-P., Chang, H.-C.

“…In typical ion trap experiments, two or more electrodes are drive by sine waves. Their amplitude and frequency determine the atomic mass (amu) of the particles…”
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