Search Results - "Tierno, Davide"

Temperature-dependent resistivity of alternative metal thin films by Siniscalchi, Marco, Tierno, Davide, Moors, Kristof, Tőkei, Zsolt, Adelmann, Christoph

“…The temperature coefficients of the resistivity (TCR) of Cu, Ru, Co, Ir, and W thin films have been investigated as a function of film thickness below 10 nm…”
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Resistance modeling of short-range connections: impact of current spreading by Tierno, Davide, Vega-Gonzalez, Victor, Esposto, Simone, Ciofi, Ivan

“…Abstract We investigated the impact of current spreading on the resistance of short-range connections by performing simulations in Synopsys Sentaurus, based on…”
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Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopy by Saini, Nishant, Tierno, Davide, Croes, Kristof, Afanas’ev, Valeri, Houdt, Jan Van

“…Time-dependent dielectric breakdown (TDDB) is commonly used to assess dielectric failures. However, TDDB provides limited insights into the physics of…”
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Reliability Investigation of W2W Hybrid Bonding Interface: Breakdown Voltage and Leakage Mechanism by Hou, Lin, Chery, Emmanuel, Croes, Kristof, Tierno, Davide, Chew, Soon Aik, Chen, Yangyin, Rakbin, Peter, Beyne, Eric

“…The electrical reliability of 1 µm pitch wafer-to-wafer (W2W) Cu/SiCN hybrid bonding interface is evaluated. Breakdown voltage distributions of the W2W hybrid…”
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Microwave Characterization of Ba-Substituted PZT and ZnO Thin Films by Tierno, Davide, Dekkers, Matthijn, Wittendorp, Paul, Xiao Sun, Bayer, Samuel C., King, Seth T., Van Elshocht, Sven, Heyns, Marc, Radu, Iuliana P., Adelmann, Christoph

“…The microwave dielectric properties of (Ba 0.1 Pb 0.9 )(Zr 0.52 Ti 0.48 )O 3 (BPZT) and ZnO thin films with thicknesses below 2 μm were investigated. No…”
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Exploring the Benefits of Cryogenic Temperatures for Co and Ru Metallizations by Tierno, Davide, Ciofi, Ivan, Pedreira, Olalla Varela, Parvais, Bertrand, Croes, Kristof

“…We benchmarked Co and Ru metallizations against Cu at cryogenic temperatures (5K-300K) by using imec resistivity model and actual interconnects, with widths…”
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Cryo-Computing for Infrastructure Applications: A Technology-to-Microarchitecture Co-optimization Study by Prasad, Divya, Vangala, Manoj, Bhargava, Mudit, Beckers, Arnout, Grill, Alexander, Tierno, Davide, Nathella, Krishnendra, Achuthan, Thanusree, Pietromonaco, David, Myers, James, Walker, Matthew, Parvais, Bertrand, Cline, Brian

“…Cryo-computing has been proposed for data center and HPC applications. Ultra-low temperature CMOS not only has the potential to aid the node-to-node…”
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Temperature-Dependent Resistivity of Alternative Metal Thin Films by Siniscalchi, Marco, Tierno, Davide, Moors, Kristof, Tokei, Zsolt, Adelmann, Christoph

“…Applied Physics Letters 117, 043104 (2020) The temperature coefficients of the resistivity (TCR) of Cu, Ru, Co, Ir, and W thin films have been investigated as…”
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ALD Mo for Advanced MOL Local Interconnects by Hosseini, Maryamsadat, Tierno, Davide, Maes, Jan Willem, Zhu, Chiyu, Datta, Sukanya, Byun, Young, Mousa, Moataz, Jourdan, Nicolas, Litta, Eugenio Dentoni, Horiguchi, Naoto

“…This paper introduces ALD Mo as a potential replacement for W and Co as the conductor for logic MOL interconnects. 10nm ALD Mo without a liner and barrier has…”
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Impact of surface condition on Cobalt drift into LK3.0 films by Tierno, Davide, Lesniewska, A., Kljucar, L., van der Veen, M. H., Tokei, Zs, Croes, K.

“…Metal drift induced failure is a serious threat to the reliability of advanced back-end-of-line (BEOL) systems based on ultra-thin dielectric layers and…”
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Reliability of Barrierless PVD Mo by Tierno, Davide, Hosseini, M., van der Veen, M., Dangol, A., Croes, K., Demuynck, S., Tokei, Zs, Litta, E.D., Horiguchi, N.

“…We evaluate the reliability of barrierless Mo metallization on various dielectrics that are used in both BEOL and MOL integration schemes. In particular, we…”
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Strain coupling optimization in magnetoelectric transducers by Tierno, Davide, Ciubotaru, Florin, Duflou, Rutger, Heyns, Marc, Radu, Iuliana P, Adelmann, Christoph

“…The mechanical behavior of magnetoelectric transducers consisting of piezoelectric-magnetostrictive bilayers has been modeled. The effect of the aspect ratio…”
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