Search Results - "Tien-Yen Wang"

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  1. 1

    A Retention-Aware Multilevel Cell Phase Change Memory Program Evaluation Metric by Win-San Khwa, Meng-Fan Chang, Jau-Yi Wu, Ming-Hsiu Lee, Tzu-Hsiang Su, Tien-Yen Wang, Hsiang-Pang Li, BrightSky, Matthew, SangBum Kim, Hsiang-Lan Lung, Chung Lam

    Published in IEEE electron device letters (01-11-2016)
    “…Multilevel cell (MLC) phase change memory (PCM) offers many potential advantages in scalability, bit-alterability, non-volatility, and high program speed…”
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    Journal Article
  2. 2

    A Resistance Drift Compensation Scheme to Reduce MLC PCM Raw BER by Over 100\times for Storage Class Memory Applications by Win-San Khwa, Meng-Fan Chang, Jau-Yi Wu, Ming-Hsiu Lee, Tzu-Hsiang Su, Keng-Hao Yang, Tien-Fu Chen, Tien-Yen Wang, Hsiang-Pang Li, Brightsky, Matthew, Sangbum Kim, Hsiang-Lan Lung, Chung Lam

    Published in IEEE journal of solid-state circuits (01-01-2017)
    “…For multilevel cell (MLC) phase change memory (PCM), resistance drift (R-drift) phenomenon causes cell resistance to increase with time, even at room…”
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    Journal Article
  3. 3

    The impact of melting during reset operation on the reliability of phase change memory by Pei-Ying Du, Jau-Yi Wu, Tzu-Hsuan Hsu, Ming-Hsiu Lee, Tien-Yen Wang, Huai-Yu Cheng, Erh-Kun Lai, Sheng-Chih Lai, Hsiang-Lan Lung, SangBum Kim, BrightSky, M. J., Yu Zhu, Mittal, S., Cheek, R., Raoux, S., Joseph, E. A., Schrott, A., Jing Li, Chung Lam

    “…Operation impact on endurance performance in GST-based phase change memory is investigated from small arrays to large test chips. SET operation induced…”
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    Conference Proceeding
  4. 4

    Excellent resistance variability control of WOx ReRAM by a smart writing algorithm by Yu-Hsuan Lin, Jau-Yi Wu, Ming-Hsiu Lee, Tien-Yen Wang, Yu-Yu Lin, Feng-Ming Lee, Dai-Ying Lee, Erh-Kun Lai, Kuang-Hao Chiang, Hsiang-Lan Lung, Kuang-Yeu Hsieh, Tseung-Yuen Tseng, Chih-Yuan Lu

    “…TMO ReRAMs, being built on defect states, are intrinsically subject to variability. In this work, cell to cell variability is studied by applying write shots…”
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    Conference Proceeding
  5. 5

    A Novel Reconfigurable Sensing Scheme for Variable Level Storage in Phase Change Memory by Jing Li, Chao-I Wu, Lewis, S C, Morrish, J, Tien-Yen Wang, Jordan, R, Maffitt, T, Breitwisch, M, Schrott, A, Cheek, R, Hsiang-Lan Lung, Chung Lam

    “…This paper presents a novel reconfigurable sensing scheme with the flexibility to change reading precision of analog resistance levels for MLC PCM. A 2Mcell…”
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    Conference Proceeding
  6. 6