Search Results - "Tiemeijer, L F"
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1
RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics
Published in IEEE electron device letters (01-01-2003)“…We present a MOS Capacitance-Voltage measurement methodology that, contrary to present methods, is highly robust against gate leakage current densities up to…”
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Journal Article -
2
Effects of nonlinear gain on four-wave mixing and asymmetric gain saturation in a semiconductor laser amplifier
Published in Applied physics letters (29-07-1991)“…Nearly degenerate four-wave mixing (NDFWM) and asymmetric gain saturation were studied in a 1.5 μm InGaAsP semiconductor laser amplifier at highly saturated…”
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3
The impact of an aluminum top layer on inductors integrated in an advanced CMOS copper backend
Published in IEEE electron device letters (01-11-2004)“…The performance of inductors realized in various metal layer combinations available in an advanced CMOS process with a mixed copper-aluminum backend is…”
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4
Record Q symmetrical inductors for 10-GHz LC-VCOs in 0.18-μm gate-length CMOS
Published in IEEE electron device letters (01-12-2002)“…We report a single-loop inductor suitable for integration in a differential voltage-controlled oscillator (LC-VCO) with 0.6-nH inductance and record quality…”
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5
The RF-CV method for characterization of leaky gate dielectrics
Published in Microelectronic engineering (01-04-2004)“…This paper presents a new method, developed for the capacitance–voltage ( C– V) characterization of leaky dielectrics. The method comprises measurements in the…”
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Journal Article Conference Proceeding -
6
Numerical modeling of RF noise in scaled MOS devices
Published in Solid-state electronics (2006)“…A new approach to numerical noise simulation for MOSFETs based on bipolar 2D drift-diffusion and hydrodynamic models is presented, where the hierarchical…”
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Journal Article Conference Proceeding -
7
Noise modeling for RF CMOS circuit simulation
Published in IEEE transactions on electron devices (01-03-2003)“…The RF noise in 0.18-/spl mu/m CMOS technology has been measured and modeled. In contrast to some other groups, we find only a moderate enhancement of the…”
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8
Spectral reflectance of the human eye
Published in Vision research (Oxford) (1986)“…Spectral reflectance of the eye was assessed in four young Caucasian subjects with the Utrecht densitometer. Three retinal locations were studied, the fovea,…”
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9
Polarization insensitive multiple quantum well laser amplifiers for the 1300 nm window
Published in Applied physics letters (22-02-1993)“…A polarization insensitive (less than 1 dB gain difference over the 3 dB gain bandwidth) multiple quantum well laser amplifier for the 1300 nm window is…”
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10
A calibrated lumped-element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors
Published in IEEE transactions on electron devices (01-03-2003)“…The impedance errors remaining after conventional de-embedding for a high-speed transistor and a single-loop inductor test structure are investigated. A new…”
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11
Reduced intermodulation distortion in 1300 nm gain-clamped MQW laser amplifiers
Published in IEEE photonics technology letters (01-03-1995)“…A 1300 nm gain-clamped DFB multiple quantum well laser amplifier with negligible pass band ripple, 20 dB fiber to fiber gain, and 10 dB reduction in gain…”
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12
Dependence of polarization, gain, linewidth enhancement factor, and K factor on the sign of the strain of InGaAs/InP strained-layer multiquantum well lasers
Published in Applied physics letters (17-06-1991)“…The sign of the strain in a multiquantum well (MQW) active layer of an InGaAs/InP laser determines whether lasing occurs from the electron–heavy hole…”
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13
Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives
Published in IEEE transactions on microwave theory and techniques (01-02-2005)“…The impedance errors remaining after applying the industry standard "open-short," a "pad-open-short," and a "open-short-load" deembedding scheme on a 0.43-nH…”
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14
RF-CMOS performance trends
Published in IEEE transactions on electron devices (01-08-2001)“…The impact of scaling on the analog performance of MOS devices at RF frequencies was studied. Trends in the RF performance of nominal gate length NMOS devices…”
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15
Improved performance of compressively as well as tensile strained quantum-well lasers
Published in Applied physics letters (12-10-1992)“…The results of a theoretical study together with an experimental verification of the effects of strain on the laser characteristics of InxGa1−xAs/InGaAsP…”
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16
A single-pass single-amplifier polarization-insensitive semiconductor laser amplifier configuration
Published in IEEE journal of quantum electronics (01-01-1994)“…A novel single-pass single-amplifier polarization-insensitive optical amplifier configuration is proposed and used to solve the inherent polarization…”
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Journal Article -
17
89 km 10 Gbit/s 1310 nm repeaterless transmission experiments using direct laser modulation and two SL-MQW laser preamplifiers with low polarization sensitivity
Published in IEEE photonics technology letters (01-05-1994)“…An unrepeatered 89 km 1310 mn 10 Gbit/s transmission experiment has been carried out for the first time employing an SL-MQW DFB laser diode and a high…”
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18
27-dB gain unidirectional 1300-nm polarization-insensitive multiple quantum well laser amplifier module
Published in IEEE photonics technology letters (01-12-1994)“…An unidirectional polarization-insensitive multiple quantum well laser amplifier module for the 1300-nm window with a record high gain of 27 dB and a 3-dB…”
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19
Polarization resolved, complete characterization of 1310 nm fiber pigtailed multiple-quantum-well optical amplifiers
Published in Journal of lightwave technology (01-06-1996)“…A new method allowing an automated, polarization resolved, complete characterization of fiber pigtailed semiconductor optical amplifiers is presented and…”
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20
Improved Y-factor method for wide-band on-wafer noise-parameter measurements
Published in IEEE transactions on microwave theory and techniques (01-09-2005)“…A new noise-figure measurement method, which combines the simplicity of the "classical" Y-factor method with the accuracy of the widely used "cold…”
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