Search Results - "Tianli Duan"
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Capacitance Hysteresis in the High-k/Metal Gate-Stack From Pulsed Measurement
Published in IEEE transactions on electron devices (01-04-2013)“…An unusual hysteresis is observed while measuring the capacitance-voltage ( C - V ) curve of the high-k/metal gate-stack using a pulsed-voltage technique. The…”
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Journal Article -
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Overshoot Stress on Ultra-Thin HfO2 High- \kappa Layer and Its Impact on Lifetime Extraction
Published in IEEE electron device letters (01-12-2015)“…Overshoot stress (stimulating the actual IC operating condition) on an ultra-thin HfO2 (EOT~0.8 nm) high-κ layer is investigated, which reveals that overshoot…”
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Journal Article -
3
Investigation of AlGaN/GaN HEMTs degradation with gate pulse stressing at cryogenic temperature
Published in AIP advances (01-09-2017)“…Degradation on DC characteristics of AlGaN/GaN high electron mobility transistors (HEMTs) after applying pulsed gate stress at cryogenic temperatures is…”
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4
A novel fabrication technique for three-dimensional concave nanolens arrays
Published in Journal of Materiomics (01-09-2020)“…A novel facile technique is proposed for fabricating three-dimensional (3D) concave nanolens arrays on a silicon substrate. The technique leverages an inherent…”
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Journal Article -
5
Overshoot stress impact on HfO2 high-κ layer dynamic SILC
Published in 2015 IEEE 11th International Conference on ASIC (ASICON) (01-11-2015)“…Overshoot stress (mimicking the actual IC operating condition) in dynamic stress induced leakage increase (D-SILC) on ultra-thin HfO 2 (EOT~0.8 nm) high-κ…”
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Conference Proceeding -
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Investigation on PECVD-deposited SiO2 underlayer in permalloy-based magnetoelectronic devices
Published in Journal of alloys and compounds (15-07-2024)“…This study presents a comprehensive investigation into the dependence among processing conditions, surface properties of the PECVD-deposited SiO2 underlayer,…”
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Journal Article -
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Facile synthesis of noble metal decorated carbon nanostructure for SERS detection
Published in Journal of Raman spectroscopy (01-01-2022)“…Surface enhanced Raman scattering (SERS) is a highly sensitive spectral analysis technique for ultra‐low trace molecule detection. Conventionally, noble metals…”
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Journal Article -
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A novel fabrication technique for high-aspect-ratio nanopillar arrays for SERS application
Published in RSC advances (21-12-2020)“…A novel technique is demonstrated for the fabrication of silicon nanopillar arrays with high aspect ratios. Our technique leverages on an "antenna effect"…”
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Journal Article -
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Investigating the impact of the defect dynamic characteristics on the PBTI in the high-κ gate device
Published in Microelectronics and reliability (01-01-2018)“…Recent device reliability studies on the metal/high-κ device observed the inter-convertible characteristics of the electron trap levels between the shallow and…”
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Journal Article -
10
Overshoot Stress on Ultra-Thin HfO2 High-[Formula Omitted] Layer and Its Impact on Lifetime Extraction
Published in IEEE electron device letters (01-12-2015)“…Overshoot stress (stimulating the actual IC operating condition) on an ultra-thin HfO2 (EOT[Formula Omitted] nm) high-[Formula Omitted] layer is investigated,…”
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Journal Article