Search Results - "Thust, A"

High-resolution transmission electron microscopy on an absolute contrast scale by Thust, A

“…A fully quantitative approach to high-resolution transmission electron microscopy requires a satisfactory match between image simulations and experiments…”
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On the optical stability of high-resolution transmission electron microscopes by Barthel, J., Thust, A.

“…In the recent two decades the technique of high-resolution transmission electron microscopy experienced an unprecedented progress through the introduction of…”
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Modification of fluid inclusions in quartz by deviatoric stress. III: Influence of principal stresses on inclusion density and orientation by Tarantola, A., Diamond, L. W., Stünitz, H., Thust, A., Pec, M.

“…Extraction of useful geochemical, petrologic and structural information from deformed fluid inclusions is still a challenge in rocks displaying moderate…”
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Quantification of the information limit of transmission electron microscopes by Barthel, J, Thust, A

“…The resolving power of high-resolution transmission electron microscopes is characterized by the information limit, which reflects the size of the smallest…”
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Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image by Jia, C. L., Mi, S. B., Barthel, J., Wang, D. W., Dunin-Borkowski, R. E., Urban, K. W., Thust, A.

“…Although the overall atomic structure of a nanoscale crystal is in principle accessible by modern transmission electron microscopy, the precise determination…”
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On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM by Jia, C.L., Houben, L., Thust, A., Barthel, J.

“…Employing an aberration corrector in a high-resolution transmission electron microscope, the spherical aberration C S can be tuned to negative values,…”
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Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns by Barthel, J., Thust, A.

“…The precise characterisation of the instrumental imaging properties in the form of aberration parameters constitutes an almost universal necessity in…”
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Water redistribution in experimentally deformed natural milky quartz single crystals—Implications for H2O‐weakening processes by Stünitz, H., Thust, A., Heilbronner, R., Behrens, H., Kilian, R., Tarantola, A., Fitz Gerald, J. D.

“…Natural quartz single crystals were experimentally deformed in two orientations: (1) ⊥ to one prism plane and (2) in O+ orientation at 900 and 1000°C, 1.0 and…”
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Atomic-scale analysis of the oxygen configuration at a SrTiO3 dislocation core by JIA, C. L, THUST, A, URBAN, K

“…The atomic structure of a SrTiO3 dislocation is revealed directly by phase-retrieval electron microscopy. In particular, atomic columns of light oxygen are…”
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Atomic-precision determination of the reconstruction of a 90()? tilt boundary in YBa2Cu3O7--delta by aberration corrected HRTEM by Houben, L, Thust, A, Urban, K

“…Aberration corrected high-resolution transmission electron microscopy is used to determine the reconstruction of atomic bonds of a 90 [100] grain boundary. A…”
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REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns by Barthel, J., Thust, A.

“…The precise characterisation of the instrumental imaging properties in the form of aberration parameters constitutes an almost universal necessity in…”
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High-resolution imaging with an aberration-corrected transmission electron microscope by Lentzen, M., Jahnen, B., Jia, C.L., Thust, A., Tillmann, K., Urban, K.

“…Recently an electromagnetic hexapole system for the correction of the spherical aberration of the objective lens of a 200 kV transmission electron microscope…”
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Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy by Coene, W.M.J., Thust, A., Op de Beeck, M., Van Dyck, D.

“…This paper deals with image reconstruction in high-resolution transmission electron microscopy (HRTEM) via focus variation. This technique aims at the…”
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Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution by Kisielowski, C., Hetherington, C.J.D., Wang, Y.C., Kilaas, R., O’Keefe, M.A., Thust, A.

“…It is reported that lattice imaging with a 300 kV field emission microscope in combination with numerical reconstruction procedures can be used to reach an…”
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Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects by Thust, A., Coene, W.M.J., Op de Beeck, M., Van Dyck, D.

“…The reliability of focal-series reconstruction algorithms for the retrieval of the wavefunction at the exit plane of the object (exit-plane wavefunction) is…”
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Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval by Tillmann, K., Houben, L., Thust, A.

“…With improvements in the instrumental information limit and the simultaneous minimization of image delocalization, high-resolution transmission electron…”
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Spherical aberration correction in tandem with exit-plane wave function reconstruction: interlocking tools for the atomic scale imaging of lattice defects in GaAs by Tillmann, K, Thust, A, Urban, K

“…With the availability of resolution boosting and delocalization minimizing techniques, for example, spherical aberration correction and exit-plane wave…”
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Numerical correction of lens aberrations in phase-retrieval HRTEM by Thust, A., Overwijk, M.H.F., Coene, W.M.J., Lentzen, M.

“…Phase-retrieval methods in high-resolution transmission electron microscopy allow one to determine the wave function at the exit-plane of the object (the…”
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Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopy by MAHALINGAM, K, EYINK, K.G, BROWN, G.J, DORSEY, D.L, KISIELOWSKI, C.F, THUST, A

“…Employing exit-plane wave function (EPWF) reconstruction in high-resolution transmission electron microscopy (HRTEM), we have developed an approach to atomic…”
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Sub-Ångstrom high-resolution transmission electron microscopy at 300 keV by O’Keefe, M.A., Hetherington, C.J.D., Wang, Y.C., Nelson, E.C., Turner, J.H., Kisielowski, C., Malm, J.-O., Mueller, R., Ringnalda, J., Pan, M., Thust, A.

“…Sub-Ångstrom transmission electron microscopy has been achieved at the National Center for Electron Microscopy (NCEM) by a one-Ångstrom microscope (OÅM)…”
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