Search Results - "Thevenod, Laurent"

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Carrier transport in HfO2/metal gate MOSFETs : Physical insight into critical parameters

    Carrier transport in HfO2/metal gate MOSFETs : Physical insight into critical parameters by CASSE, Mikaël, THEVENOD, Laurent, BILLON, Thierry, MOUIS, Mireille, BOULANGER, Fabien, GUILLAUMOT, Bernard, TOSTI, Lucie, MARTIN, Francois, MITARD, Jérome, WEBER, Olivier, ANDRIEU, Francois, ERNST, Thomas, REIMBOLD, Gilles

    Published in IEEE transactions on electron devices (01-04-2006)
    Get full text
    Journal Article
    Save to List
    Saved in:
  2. 2
    On the mobility in high- κ/metal gate MOSFETs: Evaluation of the high- κ phonon scattering impact

    On the mobility in high- κ/metal gate MOSFETs: Evaluation of the high- κ phonon scattering impact by Weber, Olivier, Cassé, Mikael, Thevenod, Laurent, Ducroquet, Frédérique, Ernst, Thomas, Deleonibus, Simon

    Published in Solid-state electronics (01-04-2006)
    “…We report an experimental study of the mobility in TiN/HfO 2 gate stacks focused on the accurate determination of the HfO 2 remote soft phonon scattering…”
    Get full text
    Journal Article
    Save to List
    Saved in:
  3. 3
    On the mobility in high-k/metal gate MOSFETs : Evaluation of the high-k phonon scattering impact

    On the mobility in high-k/metal gate MOSFETs : Evaluation of the high-k phonon scattering impact by WEBER, Olivier, CASSE, Mikael, THEVENOD, Laurent, DUCROQUET, Frédérique, ERNST, Thomas, DELEONIBUS, Simon

    Published in Solid-state electronics (2006)
    Get full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: