Search Results - "Theuwissen, Albert"

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  1. 1

    A CMOS Image Sensor Dark Current Compensation Using In-Pixel Temperature Sensors by Abarca, Accel, Theuwissen, Albert

    Published in Sensors (Basel, Switzerland) (01-11-2023)
    “…This paper presents a novel technique for dark current compensation of a CMOS image sensor (CIS) by using in-pixel temperature sensors (IPTSs) over a…”
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    Journal Article
  2. 2

    Development and Evaluation of a Highly Linear CMOS Image Sensor With a Digitally Assisted Linearity Calibration by Wang, Fei, Han, Liqiang, Theuwissen, Albert J. P.

    Published in IEEE journal of solid-state circuits (01-10-2018)
    “…This paper presents a highly linear CMOS image sensor (CIS) designed in a commercial 0.18-<inline-formula> <tex-math notation="LaTeX">\mu…”
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    Journal Article
  3. 3

    A Charge Transfer Model for CMOS Image Sensors by Liqiang Han, Suying Yao, Theuwissen, Albert J. P.

    Published in IEEE transactions on electron devices (01-01-2016)
    “…Based on the thermionic emission theory, a charge transfer model has been developed which describes the charge transfer process between a pinned photodiode and…”
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    Journal Article
  4. 4

    On-Chip Smart Temperature Sensors for Dark Current Compensation in CMOS Image Sensors by Xie, Shuang, Theuwissen, Albert J. P.

    Published in IEEE sensors journal (15-09-2019)
    “…This paper proposes various types of on-chip smart temperature sensors, intended for thermal compensation of dark current in CMOS image sensors (CIS). It…”
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    Journal Article
  5. 5

    Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity by Fei Wang, Theuwissen, Albert J. P.

    “…In this paper, different methodologies are employed to improve the linearity performance of a prototype CMOS image sensor (CIS). First, several pixel…”
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    Journal Article
  6. 6

    Suppression of Spatial and Temporal Noise in a CMOS Image Sensor by Xie, Shuang, Theuwissen, Albert J. P.

    Published in IEEE sensors journal (01-01-2020)
    “…This paper presents methodologies for suppressing the spatial and the temporal noise in a CMOS image sensor (CIS). First of all, it demonstrates by using a…”
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    Journal Article
  7. 7

    A CMOS Image Sensor With Thermal Sensing Capability and Column Zoom ADCs by Xie, Shuang, Theuwissen, Albert J. P.

    Published in IEEE sensors journal (01-03-2020)
    “…This paper presents a CMOS image sensor (CIS) with a zoom ADC, to quantize in-pixel temperature sensors, as well as for faster readout speed of the image…”
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    Journal Article
  8. 8

    Compensation for Process and Temperature Dependency in a CMOS Image Sensor by Xie, Shuang, Theuwissen, Albert

    Published in Sensors (Basel, Switzerland) (19-02-2019)
    “…This paper analyzes and compensates for process and temperature dependency among a (Complementary Metal Oxide Semiconductor) CMOS image sensor (CIS) array…”
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    Journal Article
  9. 9

    Digital Image Sensor Evolution and New Frontiers by Fossum, Eric R, Teranishi, Nobukazu, Theuwissen, Albert J.P

    Published in Annual review of vision science (01-09-2024)
    “…This article reviews nearly 60 years of solid-state image sensor evolution and identifies potential new frontiers in the field. From early work in the 1960s,…”
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    Journal Article
  10. 10

    Temporal Noise Analysis of Charge-Domain Sampling Readout Circuits for CMOS Image Sensors by Ge, Xiaoliang, Theuwissen, Albert J P

    Published in Sensors (Basel, Switzerland) (27-02-2018)
    “…This paper presents a temporal noise analysis of charge-domain sampling readout circuits for Complementary Metal-Oxide Semiconductor (CMOS) image sensors. In…”
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    Journal Article
  11. 11

    A Potential-Based Characterization of the Transfer Gate in CMOS Image Sensors by Yang Xu, Xiaoliang Ge, Theuwissen, Albert J. P.

    Published in IEEE transactions on electron devices (01-01-2016)
    “…A method to characterize the transfer gate (TG)- related parameters in a 4 T pixel is presented. The method is based on the pinning voltage measurement, which…”
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    Journal Article
  12. 12

    Temperature Effects on Feedforward Voltage in Standard CMOS Pinned Photodiodes by Sarkar, Mukul, Buttgen, Bernhard, Theuwissen, Albert J. P.

    Published in IEEE transactions on electron devices (01-05-2016)
    “…The dynamic range and the signal-to-noise ratio of a CMOS image sensor depend on the saturation level of the photodiodes. A very high charge handling capacity…”
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    Journal Article
  13. 13

    A 0.5erms− Temporal Noise CMOS Image Sensor With Gm-Cell-Based Pixel and Period-Controlled Variable Conversion Gain by Xiaoliang Ge, Theuwissen, Albert J. P.

    Published in IEEE transactions on electron devices (01-12-2017)
    “…A deep subelectron temporal noise CMOS image sensor (CIS) with a Gm-cell based pixel and a correlated-double charge-domain sampling technique has been…”
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    Journal Article
  14. 14

    A Deep Subelectron Temporal Noise CMOS Image Sensor With Adjustable Sinc-Type Filter to Achieve Photon-Counting Capability by Han, Liqiang, Theuwissen, Albert J. P.

    Published in IEEE solid-state circuits letters (2021)
    “…This letter introduces a Gm-cell-based CMOS image sensor (CIS) achieving deep subelectron noise performance. The CIS presents a new compensation block and…”
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    Journal Article
  15. 15

    In-Pixel Temperature Sensors with an Accuracy of ±0.25 °C, a 3σ Variation of ±0.7 °C in the Spatial Domain and a 3σ Variation of ±1 °C in the Temporal Domain by Abarca, Accel, Theuwissen, Albert

    Published in Micromachines (Basel) (08-07-2020)
    “…This article presents in-pixel (of a CMOS image sensor (CIS)) temperature sensors with improved accuracy in the spatial and the temporal domain. The goal of…”
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    Journal Article
  16. 16

    Multiple-Ramp Column-Parallel ADC Architectures for CMOS Image Sensors by Snoeij, M.F., Theuwissen, A.J.P., Makinwa, K.A.A., Huijsing, J.H.

    Published in IEEE journal of solid-state circuits (01-12-2007)
    “…This paper presents a CMOS imager with a column-parallel ADC architecture based on a multiple-ramp single-slope (MRSS) ADC. Like the well-known column-level…”
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    Journal Article Conference Proceeding
  17. 17

    CMOS image sensors: State-of-the-art by Theuwissen, Albert J.P.

    Published in Solid-state electronics (01-09-2008)
    “…This paper gives an overview of the state-of-the-art of CMOS image sensors. The main focus is put on the shrinkage of the pixels : what is the effect on the…”
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    Journal Article Conference Proceeding
  18. 18

    Temperature Effect on the Linearity Performance of a CMOS Image Sensor by Wang, Fei, Theuwissen, Albert J. P.

    Published in IEEE sensors letters (01-09-2018)
    “…This article focuses on the effect of the operating temperature of a CMOS image sensor (CIS) on the pixel performance, especially the linearity behavior. As…”
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    Journal Article
  19. 19

    Analyzing the Radiation Degradation of 4-Transistor Deep Submicron Technology CMOS Image Sensors by Jiaming Tan, Buttgen, B., Theuwissen, A. J. P.

    Published in IEEE sensors journal (01-06-2012)
    “…This paper presents a radiation degradation study on 4-Transistor (4T) complementary metal-oxide-semiconductor (CMOS) image sensors designed in standard…”
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    Journal Article
  20. 20

    Feedforward Effect in Standard CMOS Pinned Photodiodes by Sarkar, M., Buttgen, B., Theuwissen, A. J. P.

    Published in IEEE transactions on electron devices (01-03-2013)
    “…The charge handling capacity or the full well of the photodiodes used in CMOS image sensors is a very important characteristic because it affects the…”
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    Journal Article