Search Results - "Thery, Thomas"

Description of Derolathrus subtilis n. sp. from New Caledonia, and first mention of Derolathrus troglophilus for this territory (Coleoptera: Jacobsoniidae) by Théry, Thomas

“…Derolathrus subtilis n. sp. (Coleoptera: Jacobsoniidae) is described from New Caledonia. Derolathrus troglophilus (Sen Gupta, 1979) is also recorded for the…”
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Molecular data and species diagnosis in Essigella Del Guercio, 1909 (Sternorrhyncha, Aphididae, Lachninae) by Théry, Thomas, Kanturski, Mariusz, Favret, Colin

“…Morphological and molecular data are used to describe three new species of (Sternorrhyncha: Aphididae: Lachninae): , , and ; and to re-establish as valid…”
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A revision of the genus Paronthobium from New Caledonia (Coleoptera: Scarabaeidae: Scarabaeinae: Epilissini) by Montreuil, Olivier, Théry, Thomas

“…A revision of the New Caledonian genus Paronthobium Paulian 1984 is presented. Anonthobium Paulian 1984 is synonymized with Paronthobium Paulian 1984 after…”
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Molecular Phylogenetic Analysis and Species Delimitation in the Pine Needle-feeding Aphid Genus Essigella (Hemiptera, Sternorrhyncha, Aphididae) by Théry, Thomas, Kanturski, Mariusz, Favret, Colin

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Voegtlin‐style suction traps measure insect diversity and community heterogeneity by Favret, Colin, Lessard, Vincent, Trépanier, Alexis, Eon‐Le Guern, Titouan, Théry, Thomas

“…Comparing ecologically relevant communities of insects in heterogeneous environments requires methods capable of sampling a sufficient number of individuals…”
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EF-1α DNA Sequences Indicate Multiple Origins of Introduced Populations of Essigella californica (Hemiptera: Aphididae) by Théry, Thomas, Brockerhoff, Eckehard G, Carnegie, Angus J, Chen, Rui, Elms, Stephen R, Hullé, Maurice, Glatz, Richard, Ortego, Jaime, Qiao, Ge-Xia, Turpeau, Évelyne, Favret, Colin

“…Aphids in the pine-feeding Nearctic genus Essigella (Sternorrhyncha, Aphididae, Lachninae) have been introduced in Europe, North Africa, Oceania, and South…”
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TIARA: Industrial Platform for Monte Carlo Single-Event Simulations in Planar Bulk, FD-SOI, and FinFET by Thery, Thomas, Gasiot, Gilles, Malherbe, Victor, Autran, Jean-Luc, Roche, Philippe

“…In this article, we present Tool suIte for rAdiation Reliability Assessment (TIARA), an industrial version of a Monte Carlo single-event simulation platform,…”
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Effect of Proton Energy and Bias Conditions during Irradiation on CMOS Single-Photon Avalanche Diodes by Jouni, Ali, Malherbe, Victor, Mamdy, Bastien, Thery, Thomas, Correas, Vincent, De Paoli, Serge, Lalucaa, Valerian, Virmontois, Cedric, Gasiot, Gilles, Goiffon, Vincent

“…Different proton energies were used to irradiate 2D- and 3D-CMOS Single-Photon Avalanche Diodes (SPAD) under different biasing conditions. Discrepancies are…”
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Outstanding Conference Paper Award: 2023 IEEE Nuclear and Space Radiation Effects Conference by Fleetwood, Dan

“…The recipients of the 2023 NSREC Outstanding Conference Paper Award are Ali Jouni, Victor Malherbe, Bastien Mamdy, Thomas Thery, Vincent Correas, Serge De…”
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Proton-Induced Displacement Damages in 2-D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation by Jouni, Ali, Sicre, Mathieu, Malherbe, Victor, Mamdy, Bastien, Thery, Thomas, Belloir, Jean-Marc, Soussan, Dimitri, De Paoli, Serge, Lorquet, Vincent, Lalucaa, Valerian, Virmontois, Cedric, Gasiot, Gilles, Goiffon, Vincent

“…Dark count rate (DCR) degradation is measured on 40-nm 2-D and stacked CMOS single-photon avalanche diodes (SPADs) after proton irradiations. Mean DCR increase…”
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Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices by Malherbe, Victor, Gasiot, Gilles, Thery, Thomas, Autran, Jean-Luc, Roche, Philippe

“…We present a new model for simulation of single-event effects in fully depleted silicon on insulator (FD-SOI) technology. The model is based on direct…”
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Study of Proton-Induced Defects in 40-nm CMOS SPADs by Jouni, Ali, Malherbe, Victor, Mamdy, Bastien, Thery, Thomas, Sicre, Mathieu, Soussan, Dimitri, Lorquet, Vincent, Paoli, Serge De, Belloir, Jean-Marc, Lalucaa, Valerian, Virmontois, Cedric, Gasiot, Gilles, Goiffon, Vincent

“…Defects induced by 62 MeV protons in single-photon avalanche diodes (SPADs) are studied. A study of the dark count rate (DCR) variation after irradiations for…”
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Single-Event Transient Space Characterizations in 28-nm UTBB SOI Technologies and Below by de Boissac, Capucine Lecat-Mathieu, Abouzeid, Fady, Malherbe, Victor, Thery, Thomas, Gasiot, Gilles, Daveau, Jean-Marc, Roche, Philippe, Autran, Jean-Luc

“…In this article, we present a study of single-event transients (SETs) through an integrated test vehicle. This block was designed and manufactured within two…”
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Real-Time Characterization of Neutron-Induced SEUs in Fusion Experiments at WEST Tokamak During D-D Plasma Operation by Autran, J. L., Moindjie, S., Munteanu, D., Dentan, M., Moreau, P., Pellissier, F. P., Bucalossi, J., Borgese, G., Malherbe, V., Thery, T., Gasiot, G., Roche, P.

“…We conducted a real-time soft-error rate characterization of CMOS bulk 65-nm static random access memories (SRAMs) subjected to fusion neutrons during…”
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Fusion Neutron-Induced Soft Errors During Long Pulse D-D Plasma Discharges in the WEST Tokamak by Moindjie, S., Munteanu, D., Autran, J. L., Dentan, M., Moreau, P., Pellissier, F. P., Santraine, B., Bucalossi, J., Malherbe, V., Thery, T., Gasiot, G., Roche, P., Cecchetto, M., Alia, R. Garcia

“…We have performed real-time soft error rate (RT-SER) measurements on bulk 65-nm static random access memories (SRAMs) during deuterium-deuterium (D-D) plasma…”
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Designing tightly-coupled extension units for the STxP70 processor by Janin, Yves, Bertin, Valerie, Chauvet, Herve, Deruyter, Thomas, Eichwald, Christophe, Giraud, Olivier-Andre, Lorquet, Vincent, Thery, Thomas

“…Designed by STMicroelectronics for the embedded market, the STxP70 processor is a small but extensible processor: designers have the possibility to define…”
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New Single Event Transient phenomenon in 28FDSOI and its impact on hardening by Gasiot, Gilles, Abouzeid, Fady, Malherbe, Victor, Damiens, Joel, Monsieur, Frederic, De Boissac, Capucine Lecat Mathieu, Soussan, Dimitri, Lorquet, Vincent, Thery, Thomas, Roche, Philippe

“…This paper shows measurement of new Single Event Transient in FDSOI28 technology. These SETs come from layers beneath the Buried Oxide connected to active…”
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Designing tightly-coupled extension units for the STxP70 processor by Janin, Yves, Bertin, Valérie, Chauvet, Hervé, Deruyter, Thomas, Eichwald, Christophe, Giraud, Olivier-André, Lorquet, Vincent, Thery, Thomas

“…Designed by STMicroelectronics for the embedded market, the STxP70 processor is a small but extensible processor: designers have the possibility to define…”
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