Search Results - "Thévenot, V."

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  1. 1

    The new very-small-angle neutron scattering spectrometer at Laboratoire Léon Brillouin by Désert, S., Thévenot, V., Oberdisse, J., Brûlet, A.

    Published in Journal of applied crystallography (01-04-2007)
    “…The design and characteristics of the new very‐small‐angle neutron scattering spectrometer under construction at the Laboratoire Léon Brillouin are described…”
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    Journal Article
  2. 2

    A double-supermirror monochromator for neutron instrumentation at Laboratoire Léon Brillouin by Désert, S., Thévenot, V., Gabriel, A., Permingeat, P., Oberdisse, J., Brûlet, A.

    Published in Journal of applied crystallography (01-10-2007)
    “…The design and characteristics of a double‐supermirror monochromator for neutron instrumentation at the Laboratoire Léon Brillouin are described. The aim of…”
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    Journal Article
  3. 3

    INFLUENCE OF MATERIAL REMOVAL ON THE DYNAMIC BEHAVIOR OF THIN-WALLED STRUCTURES IN PERIPHERAL MILLING by Thevenot, V., Arnaud, L., Dessein, G., Cazenave-Larroche, G.

    Published in Machining science and technology (01-09-2006)
    “…Machining is a material removal process that alters the dynamic properties during machining operations. The peripheral milling of a thin-walled structure…”
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    Journal Article
  4. 4

    Behaviour of vicinal InP surfaces grown by MOVPE: exploitation of AFM images by Thévenot, V., Souliere, V., Dumont, H., Monteil, Y., Bouix, J., Regreny, P., Duc, Tran-Minh

    Published in Journal of crystal growth (01-01-1997)
    “…InP substrates and epilayers grown by MOVPE have been studied by AFM. For different misorientation angles, we observed the surface of the substrate after…”
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    Journal Article Conference Proceeding
  5. 5

    AFM study of surface topography of InP epilayers: effect of miscut angle and growth temperature during MOVPE by Souliere, V., Thevenot, V., Dumont, H., Monteil, Y., Bouix, J., Regreny, P., Tran Minh Duc

    “…Our objective is the investigation of MOVPE growth mechanisms for InP. We focused on the surface topography observed by Atomic Force Microscopy (AFM). It is…”
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    Conference Proceeding