Search Results - "Teranishi, N."
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Special Issue on Solid-State Image Sensors
Published in IEEE transactions on electron devices (01-11-2009)“…This editorial summarizes the contents of this special issue of the IEEE Transactions on Electron Devices on solid state image sensors. Several researches on…”
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Required Conditions for Photon-Counting Image Sensors
Published in IEEE transactions on electron devices (01-08-2012)“…The required conditions of photon counting and single-photon detection are theoretically derived for four different approaches: 1) photon counting and…”
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Infrared focal plane array incorporating silicon IC process compatible bolometer
Published in IEEE transactions on electron devices (01-11-1996)“…A 128/spl times/128 element bolometer infrared image sensor using thin film titanium is proposed. The device is a monolithically integrated structure with a…”
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Foreword special issue on solid-state image sensors
Published in IEEE transactions on electron devices (01-01-2003)Get full text
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Thermionic-emission-based barrier height analysis for precise estimation of charge handling capacity in CCD registers
Published in IEEE transactions on electron devices (01-10-1997)“…In designing charge-coupled device (CCD) image sensors, it is essential to be able to estimate charge handling capacity. Because electrons have thermal energy,…”
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Technologies to improve photo-sensitivity and reduce VOD shutter voltage for CCD image sensors
Published in IEEE transactions on electron devices (01-08-2000)“…New technologies to increase the photo-sensitivity and reduce the shutter voltage of the vertical over-flow-drain (VOD) have been developed for CCD image…”
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A 1/2-in 1.3 M-pixel progressive-scan IT-CCD for digital still camera applications
Published in IEEE transactions on electron devices (01-02-2001)“…A 1/2-in 1.3 M-pixel progressive-scan interline-transfer charge-coupled-device (IT-CCD) image sensor has been developed for small, low-power mega-pixel digital…”
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Stacked image sensor using chlorine-doped crystalline selenium photoconversion layer composed of size-controlled polycrystalline particles
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01-12-2015)“…We demonstrate a stacked complementary metal-oxide semiconductor (CMOS) image sensor overlaid with a chlorine (Cl)-doped crystalline selenium (c-Se)…”
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Conference Proceeding Journal Article -
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Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors
Published in IEEE transactions on electron devices (01-09-2000)“…Technologies for narrow-channel effect suppression in photodiodes (PDs) and vertical CCDs (V-CCDs) and for smear reduction in PDs have been developed in order…”
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A 30 frames/s 2/3-in 1.3 M-pixel progressive scan IT-CCD image sensor
Published in IEEE transactions on electron devices (01-09-2001)“…A 30 frames/s 2/3-in 1.3 M-pixel progressive scan interline-transfer charge-coupled device (IT-CCD) image sensor has been developed for video and digital…”
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Smear reduction in the interline CCD image sensor
Published in IEEE transactions on electron devices (01-05-1987)“…An undesirable smear in a vertical-overflow-drain interline CCD image sensor (VOD IL-CCD) has been analyzed. This smear has been reduced by using a new…”
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Driving voltage reduction in a two-phase CCD by suppression of potential pockets in inter-electrode gaps
Published in IEEE transactions on electron devices (01-10-1997)“…This study reports an optimum design for a two-phase charge-coupled device (CCD) and limitations on its driving voltage reduction. The two-phase CCD to be used…”
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Photo response analysis in CCD image sensors with a VOD structure
Published in IEEE transactions on electron devices (01-04-1995)“…Photo response in CCD image sensors with Vertical-Overflow-Drain (VOD) was analyzed in an attempt to discover a way to lessen the photo response rise that…”
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14
Optical limitations to cell size reduction in IT-CCD image sensors
Published in IEEE transactions on electron devices (01-10-1997)“…We have determined the practical limits of cell size reduction in interline-transfer charge-coupled device (IT-CCD) image sensors, which result from…”
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Studies on estimation of the age by human epidermis
Published in Nihon hoigaku zasshi = The Japanese journal of legal medicine (01-06-1988)Get more information
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An infrared-bi-color Schottky-barrier CCD image sensor for precise thermal images
Published in IEEE transactions on electron devices (01-02-1996)“…An infrared-bi-color image sensor was developed with a barrier height controlled Schottky-barrier photo diode array for precise temperature images. Low and…”
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17
Partition noise in CCD signal detection
Published in IEEE transactions on electron devices (01-11-1986)“…Reset noise in CCD signal charge detection is analyzed experimentally and theoretically. From a reset noise measurement experiment, it has been inferred that…”
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A 1/4-inch 380 k pixel IT-CCD image sensor employing gate-assisted punchthrough read-out mode
Published in IEEE transactions on electron devices (01-10-1995)“…A newly developed 1/4-inch 380 k pixel IT-CCD image sensor features a novel cell structure in which signal charges are read out from a photodiode (PD) to a…”
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A new concept silicon homojunction infrared sensor
Published in IEEE transactions on electron devices (01-05-1991)“…A new silicon photovoltaic infrared sensor is proposed. Its basic operational principle is demonstrated. The sensor consists of three regions with a…”
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New low-noise output amplifier for high-definition CCD image sensor
Published in IEEE transactions on electron devices (01-05-1991)“…A new low-noise charge-coupled-device (CCD) output amplifier, the RJG detector, has been developed. The RJG detector incorporates a JFET which has an…”
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