Search Results - "Teranishi, N."

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  1. 1

    Special Issue on Solid-State Image Sensors by Fossum, E.R., Hynecek, J., Tower, J., Teranishi, N., Nakamura, J., Magnan, P., Theuwissen, A.

    Published in IEEE transactions on electron devices (01-11-2009)
    “…This editorial summarizes the contents of this special issue of the IEEE Transactions on Electron Devices on solid state image sensors. Several researches on…”
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    Journal Article
  2. 2

    Required Conditions for Photon-Counting Image Sensors by Teranishi, N.

    Published in IEEE transactions on electron devices (01-08-2012)
    “…The required conditions of photon counting and single-photon detection are theoretically derived for four different approaches: 1) photon counting and…”
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    Journal Article
  3. 3

    Infrared focal plane array incorporating silicon IC process compatible bolometer by Tanaka, A., Matsumoto, S., Tsukamoto, N., Itoh, S., Chiba, K., Endoh, T., Nakazato, A., Okuyama, K., Kumazawa, Y., Hijikawa, M., Gotoh, H., Tanaka, T., Teranishi, N.

    Published in IEEE transactions on electron devices (01-11-1996)
    “…A 128/spl times/128 element bolometer infrared image sensor using thin film titanium is proposed. The device is a monolithically integrated structure with a…”
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    Journal Article
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    Thermionic-emission-based barrier height analysis for precise estimation of charge handling capacity in CCD registers by Kawai, S., Mutoh, N., Teranishi, N.

    Published in IEEE transactions on electron devices (01-10-1997)
    “…In designing charge-coupled device (CCD) image sensors, it is essential to be able to estimate charge handling capacity. Because electrons have thermal energy,…”
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    Journal Article
  6. 6

    Technologies to improve photo-sensitivity and reduce VOD shutter voltage for CCD image sensors by Murakami, I., Nakano, T., Hatano, K., Nakashiba, Y., Furumiya, M., Nagata, T., Kawasaki, T., Utsumi, H., Uchiya, S., Arai, K., Mutoh, N., Kohno, A., Teranishi, N., Hokari, Y.

    Published in IEEE transactions on electron devices (01-08-2000)
    “…New technologies to increase the photo-sensitivity and reduce the shutter voltage of the vertical over-flow-drain (VOD) have been developed for CCD image…”
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    Journal Article
  7. 7

    A 1/2-in 1.3 M-pixel progressive-scan IT-CCD for digital still camera applications by Yamada, T., Hatano, K., Morimoto, M., Furumiya, M., Nakashiba, Y., Uchiya, S., Tanabe, A., Kawakami, Y., Nakano, T., Kawai, S., Suwazono, S., Utsumi, H., Katoh, S., Syohji, D., Taniji, Y., Mutoh, N., Orihara, K., Teranishi, N., Hokari, Y.

    Published in IEEE transactions on electron devices (01-02-2001)
    “…A 1/2-in 1.3 M-pixel progressive-scan interline-transfer charge-coupled-device (IT-CCD) image sensor has been developed for small, low-power mega-pixel digital…”
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    Journal Article
  8. 8

    Stacked image sensor using chlorine-doped crystalline selenium photoconversion layer composed of size-controlled polycrystalline particles by Imura, S., Kikuchi, K., Miyakawa, K., Ohtake, H., Kubota, M., Okino, T., Hirose, Y., Kato, Y., Teranishi, N.

    “…We demonstrate a stacked complementary metal-oxide semiconductor (CMOS) image sensor overlaid with a chlorine (Cl)-doped crystalline selenium (c-Se)…”
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    Conference Proceeding Journal Article
  9. 9

    Dynamic range improvement by narrow-channel effect suppression and smear reduction technologies in small pixel IT-CCD image sensors by Tanabe, A., Kudoh, Y., Kawakami, Y., Masubuchi, I., Kawai, S., Yamada, T., Morimoto, M., Arai, K., Hatano, K., Furumiya, M., Naliashiba, Y., Mutoh, N., Orihara, K., Teranishi, N.

    Published in IEEE transactions on electron devices (01-09-2000)
    “…Technologies for narrow-channel effect suppression in photodiodes (PDs) and vertical CCDs (V-CCDs) and for smear reduction in PDs have been developed in order…”
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    Journal Article
  10. 10

    A 30 frames/s 2/3-in 1.3 M-pixel progressive scan IT-CCD image sensor by Furumiya, M., Suwazono, S., Morimoto, M., Nakashiba, Y., kawakami, Y., Nakano, T., Satoh, T., Katoh, S., Syohji, D., Utsumi, H., Taniji, Y., Mutoh, N., Orihara, K., Teranishi, N., Hokari, Y.

    Published in IEEE transactions on electron devices (01-09-2001)
    “…A 30 frames/s 2/3-in 1.3 M-pixel progressive scan interline-transfer charge-coupled device (IT-CCD) image sensor has been developed for video and digital…”
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    Journal Article
  11. 11

    Smear reduction in the interline CCD image sensor by Teranishi, N., Ishihara, Y.

    Published in IEEE transactions on electron devices (01-05-1987)
    “…An undesirable smear in a vertical-overflow-drain interline CCD image sensor (VOD IL-CCD) has been analyzed. This smear has been reduced by using a new…”
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    Journal Article
  12. 12

    Driving voltage reduction in a two-phase CCD by suppression of potential pockets in inter-electrode gaps by Yamada, T., Kawakami, Y., Nakano, T., Mutoh, N., Orihara, K., Teranishi, N.

    Published in IEEE transactions on electron devices (01-10-1997)
    “…This study reports an optimum design for a two-phase charge-coupled device (CCD) and limitations on its driving voltage reduction. The two-phase CCD to be used…”
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    Journal Article
  13. 13

    Photo response analysis in CCD image sensors with a VOD structure by Kawai, S., Morimoto, M., Mutoh, N., Teranishi, N.

    Published in IEEE transactions on electron devices (01-04-1995)
    “…Photo response in CCD image sensors with Vertical-Overflow-Drain (VOD) was analyzed in an attempt to discover a way to lessen the photo response rise that…”
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    Journal Article
  14. 14

    Optical limitations to cell size reduction in IT-CCD image sensors by Satoh, T., Mutoh, N., Furumiya, M., Murakami, I., Suwazono, S., Ogawa, C., Hatano, K., Utsumi, H., Kawai, S., Arai, K., Morimoto, M., Orihara, K., Tamura, T., Teranishi, N., Hokari, Y.

    Published in IEEE transactions on electron devices (01-10-1997)
    “…We have determined the practical limits of cell size reduction in interline-transfer charge-coupled device (IT-CCD) image sensors, which result from…”
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    Journal Article
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    An infrared-bi-color Schottky-barrier CCD image sensor for precise thermal images by Konuma, K., Asano, Y., Masubuchi, K., Utsumi, H., Tohyama, S., Endo, T., Azuma, H., Teranishi, N.

    Published in IEEE transactions on electron devices (01-02-1996)
    “…An infrared-bi-color image sensor was developed with a barrier height controlled Schottky-barrier photo diode array for precise temperature images. Low and…”
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    Journal Article
  17. 17

    Partition noise in CCD signal detection by Teranishi, N., Mutoh, N.

    Published in IEEE transactions on electron devices (01-11-1986)
    “…Reset noise in CCD signal charge detection is analyzed experimentally and theoretically. From a reset noise measurement experiment, it has been inferred that…”
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    Journal Article
  18. 18

    A 1/4-inch 380 k pixel IT-CCD image sensor employing gate-assisted punchthrough read-out mode by Mutoh, N., Orihara, K., Kawakami, Y., Nakano, T., Kawai, S., Murakami, I., Tanabe, A., Suwazono, S., Arai, K., Teranishi, N., Furumiya, M., Morimoto, M., Hatano, K., Minami, K., Hokari, Y.

    Published in IEEE transactions on electron devices (01-10-1995)
    “…A newly developed 1/4-inch 380 k pixel IT-CCD image sensor features a novel cell structure in which signal charges are read out from a photodiode (PD) to a…”
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    Journal Article
  19. 19

    A new concept silicon homojunction infrared sensor by Tohyama, S., Teranishi, N., Konuma, K., Nishimura, M., Arai, K., Oda, E.

    Published in IEEE transactions on electron devices (01-05-1991)
    “…A new silicon photovoltaic infrared sensor is proposed. Its basic operational principle is demonstrated. The sensor consists of three regions with a…”
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    Journal Article
  20. 20

    New low-noise output amplifier for high-definition CCD image sensor by Mutoh, N., Morimoto, M., Nishimura, M., Teranishi, N., Oda, E.

    Published in IEEE transactions on electron devices (01-05-1991)
    “…A new low-noise charge-coupled-device (CCD) output amplifier, the RJG detector, has been developed. The RJG detector incorporates a JFET which has an…”
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    Journal Article