Search Results - "Terada, Koshiro"
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Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy
Published in Japanese Journal of Applied Physics (01-10-2017)“…A quantitative measurement method for a polarity-inverted layer in ferroelectric or piezoelectric thin film is proposed. It is performed nondestructively by…”
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Journal Article -
2
Method for measuring polarity-inverted layered structure in dielectric thin films using scanning nonlinear dielectric microscopy
Published in Ferroelectrics (31-08-2016)“…A method for obtaining a depth profile of polarity inverted structure in a layered ferroelectric and/or piezoelectric thin film is proposed. It is performed by…”
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Journal Article