Search Results - "Taniguchi, Kazutaka"

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  1. 1

    A detection method of mura on a coated layer using interference light by Taniguchi, K., Ueta, K., Tatsumi, S.

    “…Here, we describe a method to detect mura during the display devices manufacturing process on a uniformly coated thin photoresist layer. A mura is an irregular…”
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    Conference Proceeding
  2. 2

    A New Polymorph of 1-Acetyl-2-thiohydantoin by TANIGUCHI, Kazutaka, OKUMURA, Hisako, HONDA, Mitsunori, SUDA, Mitsuhiro, FUJINAMI, Shuhei, KUWAE, Akio, HANAI, Kazuhiko, MAEDA, Shiro, KUNIMOTO, Ko-Ki

    Published in X-ray Structure Analysis Online (2009)
    “…The crystal structure of a new polymorph of 1-acetyl-2-thiohydantoin has been determined by X-ray diffraction. The crystal, C5H6N2O2S, belongs to space group…”
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    Journal Article
  3. 3
  4. 4

    A mura detection method by Taniguchi, Kazutaka, Ueta, Kunio, Tatsumi, Shoji

    Published in Pattern recognition (01-06-2006)
    “…A method to detect mura, which is defined as an irregular lightness variation on a uniformly manufactured surface, is necessary to maintain the quality of the…”
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    Journal Article
  5. 5

    59.1: Mura Inspection for Coated Resist Layer by Ueta, Kunio, Taniguchi, Kazutaka, Azai, Kichiji, Sanda, Akio, Kinose, Kazuo

    “…A method to detect mura on a coated photoresist layer in the manufacturing line of display devices is reported. The mura is irregular nonuniformity of…”
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    Journal Article
  6. 6

    A detection method for irregular lightness variation of low contrast by Taniguchi, K., Ueta, K., Tatsumi, S.

    “…A method to detect mura, which is defined as irregular lightness variation on uniformly manufactured surface, is necessary to keep quality of the display…”
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    Conference Proceeding
  7. 7

    Reinforcement Learning of Optimal Supervisor Based on Language Measure by Yamasaki, T., Taniguchi, K., Ushio, T.

    “…Recently, Wang and Ray introduced a signed real measure for formal languages, called a language measure, to evaluate performance of strings generated by…”
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    Conference Proceeding
  8. 8

    Bi-CMOS current mode multiple valued logic circuits with 1.5 V supply voltage by Taniguchi, K., Sasaki, M., Ogata, Y., Ueno, F., Inoue, T.

    “…A BiCMOS current-mode multivalued logic circuit with 1.5-V supply voltage is presented. The circuit is composed of a current mirror, threshold detector, and…”
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    Conference Proceeding Journal Article
  9. 9

    Current-mode multiple valued logic circuit by merged Bi-CMOS transistors by Ueno, F., Inoue, T., Taniguchi, K., Yamashita, T.

    “…The authors present a current-mode multiple-valued logic circuit by merged Bi-CMOS transistors. This circuit is composed of a current mirror, threshold…”
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    Conference Proceeding