Measuring the frequency response of gigabit chip photodiodes

Measuring the frequency response of gigabit chip photodiodes

We describe a calibration and measurement procedure for determining the intrinsic frequency response of gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time domain using a calibrated oscilloscope, and we then apply frequency-...

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Bibliographic Details
Published in:Journal of lightwave technology Vol. 19; no. 9; pp. 1333 - 1339
Main Authors: Hale, P.D., Clement, T.S., Williams, D.F., Balta, E., Taneja, N.D.
Format: Journal Article
Language:English
Published: New York, NY IEEE 01-09-2001
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
Applied sciences
Calibration
Chips
Electronics
Exact sciences and technology
Fixtures
Frequency measurement
Frequency response
Optical pulses
Optoelectronic devices
Oscilloscopes
Photodiodes
Semiconductor device measurement
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing
Time measurement
Wavelength measurement
Wavelengths
Performance evaluation
Time domain method
Frequency domain method
Frequency response
Calibration
Measurement method
Photodiode
Optical pulse
Oscilloscope
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Description
Summary:We describe a calibration and measurement procedure for determining the intrinsic frequency response of gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time domain using a calibrated oscilloscope, and we then apply frequency-domain mismatch corrections to remove the effects of the fixture, bias T, and cables from the measurements. We demonstrate the procedure on photodiodes with an active region of approximately 150-/spl mu/m diameter excited by short 800-nm wavelength optical pulses.
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ISSN:0733-8724
1558-2213
DOI:10.1109/50.948281