Search Results - "Tanbakuchi, H"

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  1. 1
    Calibrated nanoscale capacitance measurements using a scanning microwave microscope

    Calibrated nanoscale capacitance measurements using a scanning microwave microscope by Huber, H P, Moertelmaier, M, Wallis, T M, Chiang, C J, Hochleitner, M, Imtiaz, A, Oh, Y J, Schilcher, K, Dieudonne, M, Smoliner, J, Hinterdorfer, P, Rosner, S J, Tanbakuchi, H, Kabos, P, Kienberger, F

    Published in Review of scientific instruments (01-11-2010)
    “…A scanning microwave microscope (SMM) for spatially resolved capacitance measurements in the attofarad-to-femtofarad regime is presented. The system is based…”
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  2. 2
    Detecting response of microelectromechanical resonators by microwave reflectometry

    Detecting response of microelectromechanical resonators by microwave reflectometry by Legrand, B., Ducatteau, D., Théron, D., Walter, B., Tanbakuchi, H.

    Published in Applied physics letters (29-07-2013)
    “…Microwave reflectometry is proposed as an effective technique to detect the vibration of capacitively transduced microelectromechanical resonators. The…”
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  3. 3
    Magnetically tunable oscillators and filters

    Magnetically tunable oscillators and filters by Tanbakuchi, H., Nicholson, D., Kunz, B., Ishak, W.

    Published in IEEE transactions on magnetics (01-09-1989)
    “…Magnetically tunable filters and oscillators can be built throughout the 500-MHz-110-GHz range using a number of ferrite materials and varied geometries. The…”
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  4. 4
    Microwave reflectometry: A high-resolution technique for measuring vibration of capacitive microresonators

    Microwave reflectometry: A high-resolution technique for measuring vibration of capacitive microresonators by Legrand, B., Ducatteau, D., Theron, D., Walter, B., Tanbakuchi, H.

    “…The paper proposes a novel technique for measuring the vibration of capacitive microelectromechanical resonators. Based on microwave reflectometry in the…”
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  5. 5
    Scanning Impedance Probe Microscope

    Scanning Impedance Probe Microscope by Tanbakuchi, H., Wenhai Han, Richter, M.

    Published in 2008 8th IEEE Conference on Nanotechnology (01-08-2008)
    “…A new sensitive scanning impedance probe microscope (SIPM) that uses have a wavelength resonator with conjunction with a diplexer connected to a vector network…”
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  6. 6
    Sub-femtoFarad MOS varactor characterization tools

    Sub-femtoFarad MOS varactor characterization tools by Debroucke, R, Larchanche, Jean-François, Theron, D, Ducatteau, D, Tanbakuchi, H, Gaquiere, C

    Published in The 40th European Microwave Conference (01-09-2010)
    “…Nowadays with capabilities offered by advanced silicon technologies both for design above 60GHz and for high performance Digitally Controlled Oscillator, the…”
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  7. 7
    Quantitative measurement of electric properties on the nanometer scale using atomic force microscopy

    Quantitative measurement of electric properties on the nanometer scale using atomic force microscopy by Fenner, M. A., Kienberger, F., Tanbakuchi, H., Huber, H.-P, Hinterdorfer, P.

    Published in 2011 Semiconductor Conference Dresden (01-09-2011)
    “…We describe a method to measure capacitances and dopant densities with a nanometer scale spatial resolution. It is implemented using an atomic force microscope…”
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  8. 8
    attoF MOS varactor RF measurement VNA coupled with interferometer

    attoF MOS varactor RF measurement VNA coupled with interferometer by Debroucke, R., Gloria, D., Ducatteau, D., Theron, D., Tanbakuchi, H., Gaquiere, C.

    “…Nowadays with capabilities offered by advanced silicon technologies both for design above 60GHz and for high performance Digitally Controlled Oscillator, the…”
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  9. 9
    Nanoscale materials and device characterization via a scanning microwave microscope

    Nanoscale materials and device characterization via a scanning microwave microscope by Tanbakuchi, H., Richter, M., Kienberger, F., Huber, H.-P.

    “…The vector network analyzer (VNA) architecture as it exists today has the ability to measure impedances close to the analyzer's own characteristic impedance…”
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  10. 10
    Magnetically tunable oscillators and filters

    Magnetically tunable oscillators and filters by Tanbakuchi, H., Nicholson, D., Kunz, B., Ishak, W.

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